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1مؤتمر
المؤلفون: Baba, Sebastian, Palesa, Grzegorz, Wisniewski, Jaroslaw, Manka, Filip, Gieraltowski, Andrzej
المصدر: 2024 IEEE 18th International Conference on Compatibility, Power Electronics and Power Engineering (CPE-POWERENG) Compatibility, Power Electronics and Power Engineering (CPE-POWERENG), 2024 IEEE 18th International Conference on. :1-5 Jun, 2024
Relation: 2024 IEEE 18th International Conference on Compatibility, Power Electronics and Power Engineering (CPE-POWERENG)
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2مؤتمر
المصدر: 2022 24th International Microwave and Radar Conference (MIKON) Microwave and Radar Conference (MIKON), 2022 24th International. :1-5 Sep, 2022
Relation: 2022 24th International Microwave and Radar Conference (MIKON)
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3دورية أكاديمية
Alternate Title: Praktyczne wykorzystanie metod pomiaru temperatury złącza tranzystora SiC MOSFET w oparciu o parametry elektryczne. (Polish)
المؤلفون: Bąba, Sebastian, Palesa, Grzegorz, Wiśniewski, Jarosław, Mańka, Filip
المصدر: Przeglad Elektrotechniczny; 2024, Vol. 2024 Issue 5, p31-37, 7p
مصطلحات موضوعية: TEMPERATURE measurements, METAL oxide semiconductor field-effect transistors, STATISTICAL reliability