المؤلفون: Cheng, C.C., Lin, J.F., Wang, T., Hsieh, T.H., Tzeng, J.T., Jong, Y.C., Liou, R.S., Pan, S.C., Hsu, S.L.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 6(3):358-363 Sep, 2006

المؤلفون: Hsien-Ming Lee, Lin, J.C., Peng, C.H., Pan, S.C., Huang, C.L., Su, L.L., Hsieh, C.H., Shue, W.S., LIang, M.S.

المصدر: Proceedings of the IEEE 2004 International Interconnect Technology Conference (IEEE Cat. No.04TH8729) Interconnect technology Interconnect Technology Conference, 2004. Proceedings of the IEEE 2004 International. :72-74 2004

Relation: Proceedings of the IEEE 2004 International Interconnect Technology Conference

المؤلفون: Zous, N.K., Chen, Y.J., Chin, C.Y., Tsai, W.J., Lu, T.C., Chen, M.S., Lu, W.P., Tahui Wang, Pan, S.C., Ku, J., Chih-Yuan Lu

المصدر: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2004. IPFA 2004. Proceedings of the 11th International Symposium on the. :119-121 2004

Relation: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004

المؤلفون: Zous, N.-K., Yin-Jen Chen, Chi-Yuan Chin, Tsai, W.-J., Tao-Cheng Lu, Ming-Shiang Chen, Wen-Pin Lu, Tahui Wang, Pan, S.C., Chih-Yuan Lu

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 51(5):720-725 May, 2004

المؤلفون: Wen-Jer Tsai, Chih-Chieh Yeh, Nian-Kai Zous, Chen-Chin Liu, Shih-Keng Cho, Tahui Wang, Pan, S.C., Chih-Yuan Lu

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 51(3):434-439 Mar, 2004

المؤلفون: Cheng, C.C., Tu, K.C., Wang, T., Hsieh, T.H., Tzeng, J.T., Jong, Y.C., Liou, R.S., Pan, S.C., Hsu, S.L.

المصدر: 2006 IEEE International Reliability Physics Symposium Proceedings Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International. :334-337 Mar, 2006

Relation: 2006 IEEE International Reliability Physics Symposium Proceedings

المؤلفون: Tseng, P., Tian, W., Pan, S.C., Hwu, J.

المصدر: IEEE Transactions on Nanotechnology IEEE Trans. Nanotechnology Nanotechnology, IEEE Transactions on. 13(6):1084-1087 Nov, 2014

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المؤلفون: Leou, K.C., Lin, T.L., Tsai, C.H., Li, J.H., Pan, S.C., Wu, S.L., Tsai, J.L.

المصدر: IEEE Conference Record - Abstracts. 1997 IEEE International Conference on Plasma Science Plasma science Plasma Science, 1997. IEEE Conference Record - Abstracts., 1997 IEEE International Conference on. :141 1997

Relation: IEEE Conference Record - Abstracts. 1997 IEEE International Conference on Plasma Science

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