المؤلفون: Joshi, K., Nminibapiel, D., Ghoneim, M., Ali, D., Ramamurthy, R., Pantisano, L., Meric, I., Ramey, S.

المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-6 Mar, 2023

Relation: 2023 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Nminibapiel, D., Joshi, K., Ramamurthy, R., Pantisano, L., Meric, I., Ramey, S.

المصدر: 2022 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2022 IEEE International. :1-6 Mar, 2022

Relation: 2022 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Hafez, W., Agnihotri, P., Asoro, M., Aykol, M., Bains, B., Bambery, R., Bapna, M., Barik, A., Chatterjee, A., Chiu, P.C., Chu, T., Firby, C., Fischer, K., Fradkin, M., Greve, H., Gupta, A., Haralson, E., Haran, M., Hicks, J., Illa, A., Jang, M., Klopcic, S., Kobrinsky, M., Kuns, B., Lai, H.-h., Lanni, G., Lee, S.-H., Lindert, N., Lo, C.-l., Luo, Y., Malyavanatham, G., Marinkovic, B., Maymon, Y., Nabors, M., Neirynck, J., Packan, P., Paliwal, A., Pantisano, L., Paulson, L., Penmatsa, P., Prasad, C., Puls, C., Rahman, T., Ramaswamy, R., Samant, S., Sell, B., Sethi, K., Shah, F., Shamanna, M., Shang, K., Li, Q., Sibakoti, M., Stoeger, J., Strutt, N., Thirugnanasambandam, R., Tsai, C., Wang, X., Wang, A., Wu, S.-j., Xu, Q., Zhong, X.-h., Natarajan, S.

المصدر: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023

Relation: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)

المؤلفون: Paliwoda, P., Toledano-Luque, M., Nigam, T., Guarin, F., Nour, M., Cimino, S., Pantisano, L., Gupta, A., Gonzalez, O. H., Hauser, M., Liu, W., Vayshenker, A., Ioannou, D., Lee, D., Jiang, L., Yee, P., Rauch, S., Min, B.

المصدر: 2020 IEEE 29th North Atlantic Test Workshop (NATW) North Atlantic Test Workshop (NATW), 2020 IEEE 29th. :1-7 Jun, 2020

Relation: 2020 IEEE 29th North Atlantic Test Workshop (NATW)

المؤلفون: Paliwoda, P., Chbili, Z., Kerber, A., Nigam, T., Nagahiro, K., Cimino, S., Toledano-Luque, M., Pantisano, L., Min, B.W., Misra, D.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 19(2):249-254 Jun, 2019

المؤلفون: Razavieh, A., Mahajan, V., Oo, W. L., Cimino, S., Khokale, S. V., Nagahiro, K., Pantisano, L., Ethirajan, T., Lemon, J., Gu, M., Chen, Y., Wang, H. T., Lee, T. H.

المصدر: 2020 IEEE Symposium on VLSI Technology VLSI Technology, 2020 IEEE Symposium on. :1-2 Jun, 2020

Relation: 2020 IEEE Symposium on VLSI Technology

المؤلفون: Rana, U., Brunco, D. P., Raman, S., Triyoso, D.H., Stoker, M.W., Johnson, J. B., Pantisano, L., Seo, K. D., Zhao, M., Reznicek, A., Krishnan, R., Moser, B., Freeman, J., Jang, L., Kaganer, E.

المصدر: 2019 Device Research Conference (DRC) Device Research Conference (DRC), 2019. :251-252 Jun, 2019

Relation: 2019 Device Research Conference (DRC)

المؤلفون: Togo, M., Asra, R., Balasubramaniam, P., Zhang, X., Yu, H., Yamaguchi, S., Geiss, E., Yang, H. S., Cohen, B., Lo, H-C., Hu, O., Lazar, H., Kwon, O., Burnett, D., Versaggi, J., Banghart, E., Hassan, M. K., Bazizi, E., Pantisano, L., Lee, J. G., Samavedam, S. B., Sohn, D. K.

المصدر: 2018 IEEE Symposium on VLSI Technology VLSI Technology, 2018 IEEE Symposium on. :81-82 Jun, 2018

Relation: 2018 IEEE Symposium on VLSI Technology

المؤلفون: Romeo, T., Pantisano, L., Simoen, E., Krom, R., Togo, M., Horiguchi, N., Mitard, J., Thean, A., Groeseneken, G., Claeys, C., Crupi, F.

المصدر: 2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2012 Proceedings of the European. :330-333 Sep, 2012

Relation: ESSDERC 2012 - 42nd European Solid State Device Research Conference

المؤلفون: Fantini, A., Wouters, D. J., Degraeve, R., Goux, L., Pantisano, L., Kar, G., Chen, Y.-Y., Govoreanu, B., Kittl, J. A., Altimime, L., Jurczak, M.

المصدر: 2012 4th IEEE International Memory Workshop Memory Workshop (IMW), 2012 4th IEEE International. :1-4 May, 2012

Relation: 2012 4th IEEE International Memory Workshop (IMW)