المؤلفون: Mikhtonyuk, Sergey, Davydov, Maksim, Kuznetsov, Eugene, Parfentiy, Alexander

المصدر: 2008 International Conference on "Modern Problems of Radio Engineering, Telecommunications and Computer Science" (TCSET) Modern Problems of Radio Engineering, Telecommunications and Computer Science, 2008 Proceedings of International Conference on. :626-629 Feb, 2008

Relation: 2008 International Conference on "Modern Problems of Radio Engineering, Telecommunications and Computer Science" (TCSET)

المؤلفون: Kaminska, Maryna, Hahanov, Vladimir, Hahanova, Anna, Parfentiy, Alexander

المصدر: 2007 9th International Conference - The Experience of Designing and Applications of CAD Systems in Microelectronics CAD Systems in Microelectronics, 2007. CADSM '07. 9th International Conference - The Experience of Designing and Applications of. :354-356 Feb, 2007

Relation: 2007 9th International Conference - The Experience of Designing and Applications of CAD Systems in Microelectronics

المؤلفون: Kaminska Maryna, Parfentiy Alexander, Guz Olesia, Kulak Elvira

المصدر: 2006 International Conference - Modern Problems of Radio Engineering, Telecommunications, and Computer Science.

مصطلحات موضوعية: Controllability, Digital device, Computer engineering, Computer science, Test quality, Fault coverage, System on a chip, Observability, Automatic test pattern generation, Testability

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4d89922fe0cc9572c6855f79f41ae943
https://doi.org/10.1109/tcset.2006.4404553