يعرض 1 - 10 نتائج من 34 نتيجة بحث عن '"Park, Donghyuk"', وقت الاستعلام: 1.04s تنقيح النتائج
  1. 1
    مؤتمر
    7.9 1/2.74-inch 32Mpixel-Prototype CMOS Image Sensor with 0.64μ m Unit Pixels Separated by Full-Depth Deep-Trench Isolation

    المؤلفون: Park, JongEun, Park, Sungbong, Cho, Kwansik, Lee, Taehun, Lee, Changkyu, Kim, DongHyun, Lee, Beomsuk, Kim, SungIn, Ji, Ho-Chul, Im, DongMo, Park, Haeyong, Kim, Jinyoung, Cha, JungHo, Kim, Taehoon, Joe, In-Sung, Hong, Soojin, Chang, Chongkwang, Kim, Jingyun, Shim, WooGwan, Kim, Taehee, Lee, Jamie, Park, Donghyuk, Kim, EuiYeol, Park, Howoo, Lee, Jaekyu, Kim, Yitae, Ahn, JungChak, Hong, YoungKi, Jun, ChungSam, Kim, HyunChul, Moon, Chang-Rok, Kang, Ho-Kyu

    المصدر: 2021 IEEE International Solid-State Circuits Conference (ISSCC) Solid-State Circuits Conference (ISSCC), 2021 IEEE International. 64:122-124 Feb, 2021

    Relation: 2021 IEEE International Solid-State Circuits Conference (ISSCC)

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  2. 2
    مؤتمر
    A 1/2.8-inch 24Mpixel CMOS image sensor with 0.9μm unit pixels separated by full-depth deep-trench isolation

    المؤلفون: Kim, Yitae, Choi, Wonchul, Park, Donghyuk, Jeoung, Heegeun, Kim, Bumsuk, Oh, Youngsun, Oh, Sunghoon, Park, Byungjun, Kim, Euiyeol, Lee, YunKi, Jung, Taesub, Kim, Yongwoon, Yoon, Sukki, Hong, Seokyong, Lee, Jesuk, Jung, Sangil, Moon, Chang-Rok, Park, Yongin, Lee, Duckhyung, Chang, Duckhyun

    المصدر: 2018 IEEE International Solid-State Circuits Conference - (ISSCC) Solid-State Circuits Conference - (ISSCC), 2018 IEEE International. :84-86 Feb, 2018

    Relation: 2018 IEEE International Solid-State Circuits Conference - (ISSCC)

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  3. 3
    مؤتمر
    A 0.8 μm Nonacell for 108 Megapixels CMOS Image Sensor with FD-Shared Dual Conversion Gain and 18,000e- Full-Well Capacitance

    المؤلفون: Oh, Youngsun, Kim, Munhwan, Choi, Wonchul, Choi, Hana, Jeon, Honghyun, Seok, Junho, Choi, Yujung, Jung, Jaejin, Yoo, Kwisung, Park, Donghyuk, Kim, Yitae, Koh, Kyung-min, Lee, Jesuk, Moon, Chang-Rok, Ahn, JungChak

    المصدر: 2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :16.2.1-16.2.4 Dec, 2020

    Relation: 2020 IEEE International Electron Devices Meeting (IEDM)

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  4. 4
    مؤتمر
    A 0.8 µm Smart Dual Conversion Gain Pixel for 64 Megapixels CMOS Image Sensor with 12k e- Full-Well Capacitance and Low Dark Noise

    المؤلفون: Park, Donghyuk, Lee, Seung-Wook, Han, Jinhwa, Jang, Dongyoung, Kwon, Heesang, Cha, Seungwon, Kim, Mihye, Lee, Haewon, Suh, Sungho, Joo, Woong, Lee, Yunki, Nah, Seungjoo, Jeong, Heegeun, Kim, Bumsuk, Jung, Sangil, Lee, Jesuk, Kim, Yitae, Moon, Chang-Rok, Park, Yongin

    المصدر: 2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :16.2.1-16.2.4 Dec, 2019

    Relation: 2019 IEEE International Electron Devices Meeting (IEDM)

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  5. 5
    مؤتمر
    7.1 A 1/4-inch 8Mpixel CMOS image sensor with 3D backside-illuminated 1.12μm pixel with front-side deep-trench isolation and vertical transfer gate

    المؤلفون: Ahn, JungChak, Lee, Kyungho, Kim, Yitae, Jeong, Heegeun, Kim, Bumsuk, Kim, Hongki, Park, Jongeun, Jung, Taesub, Park, Wonje, Lee, Taeheon, Park, Eunkyung, Choi, Sangjun, Choi, Gyehun, Park, Haeyong, Choi, Yujung, Lee, Seungwook, Kim, Yunkyung, Jung, Y. Jay, Park, Donghyuk, Nah, Seungjoo, Oh, Youngsun, Kim, Mihye, Lee, Yooseung, Chung, Youngwoo, Hisanori, Ihara, Im, Joonhyuk, Lee, Daniel-K J, Yim, Byunghyun, Lee, GiDoo, Kown, Heesang, Choi, Sungho, Lee, Jeonsook, Jang, Dongyoung, Kim, Youngchan, Kim, Tae Chan, Hiroshige, Goto, Choi, Chi-Young, Lee, Duckhyung, Han, GabSoo

    المصدر: 2014 IEEE International Solid-State Circuits Conference Digest of Technical Papers (ISSCC) Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2014 IEEE International. :124-125 Feb, 2014

    Relation: 2014 IEEE International Solid- State Circuits Conference (ISSCC)

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  6. 6
    مؤتمر
    Coupling canceller maximum-likelihood (CCML) detection for multi-level cell NAND flash memory

    المؤلفون: Park, Donghyuk, Kim, Jinyoung, Lee, Jaejin

    المصدر: 2011 IEEE International Conference on Consumer Electronics (ICCE) Consumer Electronics (ICCE), 2011 IEEE International Conference on. :35-36 Jan, 2011

    Relation: 2011 IEEE International Conference on Consumer Electronics (ICCE)

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  7. 7
    كتاب إلكتروني
    Bangladeshi Fruit Vendors in the Streets of Paris: Vulnerable Asylum Seekers or Self-Imposed Victims of Exploitation?

    المؤلفون: Park, Donghyuk

    المساهمون: Waite, Louise, editorAff1, Craig, Gary, editorAff2, Lewis, Hannah, editorAff3, Skrivankova, Klara, editorAff4

    المصدر: Vulnerability, Exploitation and Migrants : Insecure Work in a Globalised Economy. :129-142

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  8. 8
    Une Etude sur la Décentralisation du Théâtre français et La Pratique théâtrale(Ⅰ)

    المؤلفون: Park DongHyuk

    المصدر: Etudes de la Culture Francaise et de Arts en France. 27:149-181

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5633b5a5e30f7f867c33ace9689c41a8
    https://doi.org/10.21651/cfaf.2009.27..149

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  9. 9
    دورية أكاديمية

    لا يتم عرض هذه النتيجة على الضيوف.

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  10. 10
    دورية أكاديمية

    لا يتم عرض هذه النتيجة على الضيوف.

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