المؤلفون: Park, Jaehyun, Kim, Wukang, Park, Sungil, Yun, Jinchan, Hwang, Kyuman, Yang, Jinwook, Kim, Dahye, Jeong, Jae Won, Yun, Chuljin, Bae, Jinho, Park, Jejune, Park, Sam, Huh, Woong, Huh, Daihong, Yang, Suk, Lee, Junghan, Seo, Jaehoon, Kim, Ajeong, Oh, Kyungseok, Yoo, Donggon, Kuh, Bong Jin, Ha, Daewon, Shin, Yu Gyun, Song, Jaihyuk

المصدر: 2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023

Relation: 2023 International Electron Devices Meeting (IEDM)

المؤلفون: Kim, Mingyu, Park, Jaehyun, Park, Sungil, Park, Jejune, Kim, Juhyun, Ha, Daewon, Shin, Hyungcheol

المصدر: 2024 IEEE Silicon Nanoelectronics Workshop (SNW) Silicon Nanoelectronics Workshop (SNW), 2024 IEEE. :53-54 Jun, 2024

Relation: 2024 IEEE Silicon Nanoelectronics Workshop (SNW)

المؤلفون: Kim, Ye Won, Park, Jejune, Park, Jeong Hyeon, Han, Eul, Jung, Younjae, Jang, Yong Woon, Lee, Min Yung, Jeon, Woojin

المصدر: In Applied Materials Today April 2024 37

المؤلفون: Kang, Seoung-Hun, Park, Jejune, Woo, Sungjong, Kwon, Young-Kyun

المصدر: Phys. Chem. Chem. Phys. 21(43), 24206-24211 (2019)

مصطلحات موضوعية: Condensed Matter - Materials Science, Condensed Matter - Mesoscale and Nanoscale Physics

URL الوصول: http://arxiv.org/abs/1907.04550

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المؤلفون: Park, Jejune, Mouis, Mireille, Triozon, François, Cresti, Alessandro

المصدر: Journal of Applied Physics; 2018, Vol. 124 Issue 22, pN.PAG-N.PAG, 7p, 1 Diagram, 8 Graphs

مصطلحات موضوعية: SURFACE roughness, ELECTRON transport, SEMICONDUCTORS, NANOELECTRONICS, NANOSTRUCTURED materials

المؤلفون: Park, Jejune

المساهمون: Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA), Université Grenoble Alpes [2020-....], Mireille Mouis

المصدر: Micro and nanotechnologies/Microelectronics. Université Grenoble Alpes [2020-..], 2020. English. ⟨NNT : 2020GRALT008⟩

مصطلحات موضوعية: Rugosité de bord, Matériaux bidimensionnels, Two-Dimensional materials, Grain boundaries, Charge scattering, Edge roughness, Joints de grains, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Diffusion des porteurs de charges

URL الوصول: https://explore.openaire.eu/search/publication?articleId=od______2592::1d87f62df7c7d23ba121efc73a56c5cb
https://tel.archives-ouvertes.fr/tel-02976072

المؤلفون: Park, Jejune

المساهمون: STAR, ABES, Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA), Université Grenoble Alpes [2020-....], Mireille Mouis

المصدر: Micro and nanotechnologies/Microelectronics. Université Grenoble Alpes [2020-..], 2020. English. ⟨NNT : 2020GRALT008⟩

مصطلحات موضوعية: Rugosité de bord, Matériaux bidimensionnels, Two-Dimensional materials, Grain boundaries, Charge scattering, [SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Edge roughness, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Joints de grains, Diffusion des porteurs de charges

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::1d87f62df7c7d23ba121efc73a56c5cb
https://theses.hal.science/tel-02976072

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