يعرض 1 - 10 نتائج من 3,730 نتيجة بحث عن '"Pasetti"', وقت الاستعلام: 0.85s تنقيح النتائج
  1. 1
    مؤتمر

    المصدر: 2024 IEEE Sensors Applications Symposium (SAS) Sensors Applications Symposium (SAS), 2024 IEEE. :1-6 Jul, 2024

    Relation: 2024 IEEE Sensors Applications Symposium (SAS)

  2. 2
    دورية أكاديمية

    المصدر: IEEE Transactions on Industry Applications IEEE Trans. on Ind. Applicat. Industry Applications, IEEE Transactions on. 60(4):6559-6568 Aug, 2024

  3. 3
    مؤتمر

    المصدر: 2024 IEEE International Workshop on Metrology for Automotive (MetroAutomotive) Metrology for Automotive (MetroAutomotive), 2024 IEEE International Workshop on. :171-176 Jun, 2024

    Relation: 2024 IEEE International Workshop on Metrology for Automotive (MetroAutomotive)

  4. 4
    مؤتمر

    المصدر: 2024 IEEE International Workshop on Metrology for Automotive (MetroAutomotive) Metrology for Automotive (MetroAutomotive), 2024 IEEE International Workshop on. :141-146 Jun, 2024

    Relation: 2024 IEEE International Workshop on Metrology for Automotive (MetroAutomotive)

  5. 5
    مؤتمر

    المصدر: 2024 IEEE 22nd Mediterranean Electrotechnical Conference (MELECON) Electrotechnical Conference (MELECON), 2024 IEEE 22nd Mediterranean. :1368-1373 Jun, 2024

    Relation: 2024 IEEE 22nd Mediterranean Electrotechnical Conference (MELECON)

  6. 6
    مؤتمر

    المصدر: 2024 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0 & IoT) Metrology for Industry 4.0 & IoT (MetroInd4.0 & IoT), 2024 IEEE International Workshop on. :210-215 May, 2024

    Relation: 2024 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0 & IoT)

  7. 7
    مؤتمر

    المصدر: 2024 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0 & IoT) Metrology for Industry 4.0 & IoT (MetroInd4.0 & IoT), 2024 IEEE International Workshop on. :452-457 May, 2024

    Relation: 2024 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0 & IoT)

  8. 8
    مؤتمر

    المصدر: 2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Instrumentation and Measurement Technology Conference (I2MTC), 2024 IEEE International. :1-6 May, 2024

    Relation: 2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

  9. 9
  10. 10
    تقرير

    المؤلفون: Fortier, A., Simon, A. E., Broeg, C., Olofsson, G., Deline, A., Wilson, T. G., Maxted, P. F. L., Brandeker, A., Cameron, A. Collier, Beck, M., Bekkelien, A., Billot, N., Bonfanti, A., Bruno, G., Cabrera, J., Delrez, L., Demory, B. -O., Futyan, D., Florén, H. -G., Günther, M. N., Heitzmann, A., Hoyer, S., Isaak, K. G., Sousa, S. G., Stalport, M., Turin, A., Verhoeve, P., Akinsanmi, B., Alibert, Y., Alonso, R., Bánhidi, D., Bárczy, T., Barrado, D., Barros, S. C., Baumjohann, W., Baycroft, T., Beck, T., Benz, W., Bíró, B. I., Bódi, A., Bonfils, X., Borsato, L., Charnoz, S., Cseh, B., Csizmadia, Sz., Csányi, I., Cubillos, P. E., Davies, M. B., Davis, Y. T., Deleuil, M., Demangeon, O. D. S., Derekas, A., Dransfield, G., Ducrot, E., Ehrenreich, D., Erikson, A., Fariña, C., Fossati, L., Fridlund, M., Gandolfi, D., Garai, Z., Garcia, L., Gillon, M., Chew, Y. Gómez Maqueo, Gómez-Muñoz, M. A., Granata, V., Güdel, M., Guterman, P., Hegedüs, T., Helling, Ch., Jehin, E., Kalup, Cs., Kilkenny, D., Kiss, L., Kriskovics, L., Lam, K. W. F., Laskar, J., Etangs, A. Lecavelier des, Lendl, M., Pina, A. Lopez, Luntzer, A., Magrin, D., Miller, N. J., Contreras, D. Modrego, Mordasini, C., Munari, M., Murray, C. A., Nascimbeni, V., Ottacher, H., Ottensamer, R., Pagano, I., Pál, A., Pallé, E., Pasetti, A., Pedersen, P., Peter, G., Petrucci, R., Piotto, G., Pizarro-Rubio, A., Pollacco, D., Pribulla, T., Queloz, D., Ragazzoni, R., Rando, N., Rauer, H., Ribas, I., Sabin, L., Santos, N. C., Scandariato, G., Schanche, N., Schroffenegger, U., Scutt, O. J., Sebastian, D., Ségransan, D., Seli, B., Smith, A. M. S., Southworth, R., Standing, M. R., Szabó, M. Gy., Szakáts, R., Thomas, N., Timmermans, M., Triaud, A. H. M. J., Udry, S., Van Grootel, V., Venturini, J., Villaver, E., Vinkó, J., Walton, N. A., Wells, R., Wolter, D.