يعرض 1 - 10 نتائج من 217 نتيجة بحث عن '"Path deviation"', وقت الاستعلام: 0.92s تنقيح النتائج
  1. 1
    مؤتمر

    المؤلفون: Chen, Jiayuan, Gu, Liyuan, Tian, Ye

    المصدر: 2023 9th International Conference on Computer and Communications (ICCC) Computer and Communications (ICCC), 2023 9th International Conference on. :12-16 Dec, 2023

    Relation: 2023 9th International Conference on Computer and Communications (ICCC)

  2. 2
    دورية أكاديمية
  3. 3
    مؤتمر

    المصدر: 2020 7th International Conference on Dependable Systems and Their Applications (DSA) DSA Dependable Systems and Their Applications (DSA), 2020 7th International Conference on. :182-187 Nov, 2020

    Relation: 2020 7th International Conference on Dependable Systems and Their Applications (DSA)

  4. 4
    كتاب إلكتروني

    المؤلفون: Sahu, BanditaAff12, Kumar Das, PradiptaAff13, Ranjan Kabat, ManasAff14

    المساهمون: Kacprzyk, Janusz, Series EditorAff1, Gomide, Fernando, Advisory EditorAff2, Kaynak, Okyay, Advisory EditorAff3, Liu, Derong, Advisory EditorAff4, Pedrycz, Witold, Advisory EditorAff5, Polycarpou, Marios M., Advisory EditorAff6, Rudas, Imre J., Advisory EditorAff7, Wang, Jun, Advisory EditorAff8, Kumar, Raghvendra, editorAff9, Pattnaik, Prasant Kumar, editorAff10, R. S. Tavares, João Manuel, editorAff11

    المصدر: Next Generation of Internet of Things : Proceedings of ICNGIoT 2022. 445:369-382

  5. 5
    مؤتمر

    المؤلفون: Yiqun, Yang, Hongjie, Jiang

    المصدر: 2017 29th Chinese Control And Decision Conference (CCDC) Control And Decision Conference (CCDC), 2017 29th Chinese. :6607-6613 May, 2017

    Relation: 2017 29th Chinese Control And Decision Conference (CCDC)

  6. 6
  7. 7
    كتاب إلكتروني

    المؤلفون: Paikray, H. K.Aff40, Das, P. K.Aff41, Panda, S.Aff40

    المساهمون: Angrisani, Leopoldo, Series EditorAff1, Arteaga, Marco, Series EditorAff2, Panigrahi, Bijaya Ketan, Series EditorAff3, Chakraborty, Samarjit, Series EditorAff4, Chen, Jiming, Series EditorAff5, Chen, Shanben, Series EditorAff6, Chen, Tan Kay, Series EditorAff7, Dillmann, Rüdiger, Series EditorAff8, Duan, Haibin, Series EditorAff9, Ferrari, Gianluigi, Series EditorAff10, Ferre, Manuel, Series EditorAff11, Hirche, Sandra, Series EditorAff12, Jabbari, Faryar, Series EditorAff13, Jia, Limin, Series EditorAff14, Kacprzyk, Janusz, Series EditorAff15, Khamis, Alaa, Series EditorAff16, Kroeger, Torsten, Series EditorAff17, Li, Yong, Series EditorAff18, Liang, Qilian, Series EditorAff19, Martín, Ferran, Series EditorAff20, Ming, Tan Cher, Series EditorAff21, Minker, Wolfgang, Series EditorAff22, Misra, Pradeep, Series EditorAff23, Möller, Sebastian, Series EditorAff24, Mukhopadhyay, Subhas, Series EditorAff25, Ning, Cun-Zheng, Series EditorAff26, Nishida, Toyoaki, Series EditorAff27, Oneto, Luca, Series EditorAff28, Pascucci, Federica, Series EditorAff29, Qin, Yong, Series EditorAff30, Seng, Gan Woon, Series EditorAff31, Speidel, Joachim, Series EditorAff32, Veiga, Germano, Series EditorAff33, Wu, Haitao, Series EditorAff34, Zamboni, Walter, Series EditorAff35, Zhang, Junjie James, Series EditorAff36, Unhelker, Bhuvan, editorAff37, Pandey, Hari Mohan, editorAff38, Raj, Gaurav, editorAff39

    المصدر: Applications of Artificial Intelligence and Machine Learning : Select Proceedings of ICAAAIML 2021. 925:151-165

  8. 8
    مؤتمر

    المصدر: 2016 International Conference on Innovation and Challenges in Cyber Security (ICICCS-INBUSH) Innovation and Challenges in Cyber Security (ICICCS-INBUSH), 2016 International Conference on. :97-106 Feb, 2016

    Relation: 2016 International Conference on Innovation and Challenges in Cyber Security (ICICCS-INBUSH)

  9. 9
    مؤتمر

    المصدر: 2015 International Conference on Man and Machine Interfacing (MAMI) Man and Machine Interfacing (MAMI), 2015 International Conference on. :1-8 Dec, 2015

    Relation: 2015 International Conference on Man and Machine Interfacing (MAMI)

  10. 10
    دورية أكاديمية

    المؤلفون: Ming, J., Zhang, F., Wu, D., Liu, P., Zhu, S.

    المصدر: IEEE Transactions on Reliability IEEE Trans. Rel. Reliability, IEEE Transactions on. 65(4):1647-1664 Dec, 2016