المؤلفون: Gaul, Nishtha S., Jaiswal, Akhilesh, Yoon, Hongsik, Lee, Taeyoung, Yamane, Kazutaka, Versaggi, Joe, Carter, Rick, Paul, Bipul C.

المصدر: 2022 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2022 IEEE International. :1-4 May, 2022

Relation: 2022 IEEE International Memory Workshop (IMW)

المؤلفون: Liu, Zihong, Kobayashi, Masaharu, Paul, Bipul C., Bao, Zhenan, Nishi, Yoshio

المصدر: 2009 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2009 IEEE International. :1-4 Dec, 2009

Relation: 2009 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Paul, Bipul C., Fujita, Shinobu, Okajima, Masaki

المصدر: 2008 IEEE Asian Solid-State Circuits Conference Solid-State Circuits Conference, 2008. A-SSCC '08. IEEE Asian. :69-72 Nov, 2008

Relation: 2008 IEEE Asian Solid-State Circuits Conference (A-SSCC)

المؤلفون: Agarwal, Mridul, Balakrishnan, Varsha, Bhuyan, Anshuman, Kim, Kyunglok, Paul, Bipul C., Wang, Wenping, Yang, Bo, Cao, Yu, Mitra, Subhasish

المصدر: 2008 IEEE International Test Conference Test Conference, 2008. ITC 2008. IEEE International. :1-10 Oct, 2008

Relation: 2008 IEEE International Test Conference (ITC)

المؤلفون: Yasuda, Shinichi, Akinwande, Deji, Close, Gael F., Wong, H.-S. Philip, Paul, Bipul C., Fujita, Shinobu

المصدر: 2008 8th IEEE Conference on Nanotechnology Nanotechnology, 2008. NANO '08. 8th IEEE Conference on. :684-687 Aug, 2008

Relation: 2008 8th IEEE Conference on Nanotechnology (NANO)

المؤلفون: Paul, Bipul C., Shinobu Fujita, Masaki Okajima

المصدر: 2008 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 2008 IEEE International Symposium on. :796-799 May, 2008

Relation: 2008 IEEE International Symposium on Circuits and Systems (ISCAS)

المؤلفون: Agarwal, Mridul, Paul, Bipul C., Zhang, Ming, Mitra, Subhasish

المصدر: 25th IEEE VLSI Test Symposium (VTS'07) VLSI Test Symposium, 2007. 25th IEEE. :277-286 May, 2007

Relation: 25th IEEE VLSI Test Symposium

المؤلفون: Paul, Bipul C.^Aff1, Raychowdhury, Arijit^Aff2

المساهمون: Bhunia, Swarup, editor^AffID1, Mukhopadhyay, Saibal, editor^AffID2

المصدر: Low-Power Variation-Tolerant Design in Nanometer Silicon. :185-207

المؤلفون: Paul, Bipul C.^{Aff1_6, Aff2_6}, Fujita, Shinobu^Aff2_6, Okajima, Masaki^Aff2_6, Lee, Thomas^Aff1_6

المساهمون: Huang, Chao, editor^AffID1

المصدر: Robust Computing with Nano-scale Devices : Progresses and Challenges. 58:99-123

المؤلفون: Paul, Bipul C., Roy, Kaushik

المصدر: Journal of Electronic Testing: Theory and Applications. April 2006 22(2):115-124