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المؤلفون: Steven Consiglio, Qingyun Yang, K. Tapily, Saraf Iqbal Rashid, Muthumanickam Sankarapandian, Paul C. Jamison, Tsunomura Takaaki, C. Catano, Robert D. Clark, T. Ando, R. Pujari, Vijay Narayanan, Hisashi Higuchi, Gerrit J. Leusink, Malte J. Rasch, R. Soave, Hongwen Yan, Ernest Y. Wu, Dexin Kong, Aelan Mosden, Peter Biolsi, Youngseok Kim, Robert R. Robison, O. van der Straten, D. Koty, S. McDermott, Soon-Cheon Seo, Hiroyuki Miyazoe, Son Nguyen, A. Gasasira, Nicole Saulnier, Wilfried Haensch, Sebastian Engelmann, C. S. Wajda, Ramachandran Muralidhar, S. DeVries
المصدر: IEEE Electron Device Letters. 42:759-762
مصطلحات موضوعية: 010302 applied physics, Physics, business.industry, Deep learning, Process (computing), Topology, 01 natural sciences, Omega, Electronic, Optical and Magnetic Materials, Resistive random-access memory, Stack (abstract data type), 0103 physical sciences, Scalability, Process optimization, Artificial intelligence, Electrical and Electronic Engineering, business, Voltage
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المؤلفون: Martin M. Frank, Eduard A. Cartier, Christian Lavoie, Adra Carr, Jean L. Jordan-Sweet, Paul C. Jamison, Oleg Gluschenkov, John Rozen, Vijay Narayanan
المصدر: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f493294c89379274d559b547495748b5
https://doi.org/10.1109/edtm53872.2022.9798111 -
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المؤلفون: Phillip J. Restle, John G. Massey, Paul C. Jamison, Sebastian Naczas, Eric Liu, Alex Romero, Vijay Narayanan, Shanti Pancharatnam, Hemanth Jagannathan, Kisik Choi, Joshua M. Rubin, Nicolas Loubet, P.J. Chen, Eduard A. Cartier, Takashi Ando
المصدر: ECS Transactions. 97:81-92
مصطلحات موضوعية: Materials science, business.industry, High capacitance, Structure (category theory), Optoelectronics, business, High-κ dielectric
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المؤلفون: Jing Guo, Balasubramanian S. Pranatharthi Haran, Miaomiao Wang, Paul C. Jamison, V. Basker, James Chingwei Li, Richard G. Southwick, Vijay Narayanan, Shanti Pancharatnam, Dechao Guo, Muthumanickam Sankarapandian, Nicolas Loubet, Ruqiang Bao, Huimei Zhou, Huiming Bu, Koji Watanabe, Mukesh Khare, Jingyun Zhang, James J. Demarest
المصدر: 2020 IEEE Symposium on VLSI Technology.
مصطلحات موضوعية: Materials science, Silicon, business.industry, Transistor, chemistry.chemical_element, Compensation (engineering), Threshold voltage, law.invention, Reduction (complexity), Dipole, chemistry, law, Logic gate, Optoelectronics, business, Nanosheet
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0325658de271cb045bd8e65882c029ed
https://doi.org/10.1109/vlsitechnology18217.2020.9265010 -
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المؤلفون: Miaomiao Wang, Huimei Zhou, Alex Hubbard, Paul C. Jamison, Balasubramanian S. Pranatharthi Haran, Huiming Bu, Ruqiang Bao, Jing Guo, V. Basker, A. Gaul, Mukesh Khare, Nicolas Loubet, Koji Watanabe, James Chingwei Li, Daniel J. Dechene, Dechao Guo, Reinaldo A. Vega, Muthumanickam Sankarapandian, Shanti Pancharatnam, Jingyun Zhang
المصدر: 2019 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: 010302 applied physics, Computer science, 02 engineering and technology, 021001 nanoscience & nanotechnology, Supercomputer, 01 natural sciences, Threshold voltage, Reduction (complexity), 0103 physical sciences, Electronic engineering, Wafer, 0210 nano-technology, Metal gate, Critical dimension, Scaling, Nanosheet
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f8d974e0e003d1ca6587c290e85e6a2f
https://doi.org/10.1109/iedm19573.2019.8993480 -
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المؤلفون: Paul C. Jamison, Vijay Narayanan, Youngseok Kim, Eduard A. Cartier, Takashi Ando, Ernest Y. Wu, Miaomiao Wang, Ramachandran Muralidhar
المصدر: 2019 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: 010302 applied physics, Materials science, Poisson distribution, 01 natural sciences, Resistive random-access memory, Binomial distribution, symbols.namesake, Gumbel distribution, 0103 physical sciences, Nano, Path (graph theory), symbols, Statistical physics, Scaling, Weibull distribution
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::72ab9049740a6e883c08922daa9a21fc
https://doi.org/10.1109/iedm19573.2019.8993494 -
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المؤلفون: Hisashi Higuchi, Soon-Cheon Seo, Eduard A. Cartier, Kandabara Tapily, Takashi Ando, Dexin Kong, Robert D. Clark, Robert Soave, Steven Consiglio, Gert J. Leusink, Youngseok Kim, Cory Wajda, Tsunomura Takaaki, Paul C. Jamison, Vijay Narayanan, Marinus Hopstaken
المصدر: ECS Meeting Abstracts. :994-994
مصطلحات موضوعية: Atomic layer deposition, Materials science, business.industry, Deposition (phase transition), Optoelectronics, Wafer, Plasma, Performance improvement, business, Layer (electronics), Voltage, Resistive random-access memory
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المؤلفون: Alex Romero, John G. Massey, Joshua M. Rubin, Vijay Narayanan, Phillip J. Restle, Paul C. Jamison, Nicolas Loubet, Sebastian Naczas, Eric Liu, Kisik Choi, P.J. Chen, Shanti Pancharatnam, Eduard A. Cartier, Takashi Ando, Hemanth Jagannathan
المصدر: ECS Meeting Abstracts. :1656-1656
مصطلحات موضوعية: Materials science, business.industry, High capacitance, Structure (category theory), Optoelectronics, Dielectric, business
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المؤلفون: Sanjay Shinde, Tuan Anh Vo, Daniel Gall, Vamsi Paruchuri, Takaaki Tsunoda, Paul C. Jamison, Juntao Li, Hemanth Jagannathan
المصدر: IEEE Transactions on Electron Devices. 62:2878-2882
مصطلحات موضوعية: Materials science, Annealing (metallurgy), Analytical chemistry, chemistry.chemical_element, Equivalent oxide thickness, Sputter deposition, Electronic, Optical and Magnetic Materials, Threshold voltage, Tetragonal crystal system, chemistry, Physical vapor deposition, Electronic engineering, Electrical and Electronic Engineering, Tin, Leakage (electronics)
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المؤلفون: Ernest Y. Wu, Paul C. Jamison, Miaomiao Wang, Youngseok Kim, Ramachandran Muralidhar, Eduard A. Cartier, Takashi Ando, Vijay Narayanan
المصدر: Applied Physics Letters. 116:082901
مصطلحات موضوعية: 010302 applied physics, Physics, Physics and Astronomy (miscellaneous), Conductance, 02 engineering and technology, 021001 nanoscience & nanotechnology, Poisson distribution, 01 natural sciences, Resistive random-access memory, symbols.namesake, Gumbel distribution, Percolation, 0103 physical sciences, symbols, Generalized extreme value distribution, Statistical physics, 0210 nano-technology, Scaling, Weibull distribution