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المؤلفون: Paul Lupa, Ruoping Wang, Jason Sweis, Ya-Chieh Lai, Philippe Hurat
المصدر: Design-Process-Technology Co-optimization for Manufacturability XII.
مصطلحات موضوعية: Matching (statistics), Computer science, Hardware_INTEGRATEDCIRCUITS, Pattern analysis, Mask inspection, Data mining, Pattern matching, Cadence, computer.software_genre, Fuzzy logic, computer
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3b1692b8ad84fed72dc06c5c0dd2c57e
https://doi.org/10.1117/12.2297097