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المؤلفون: Paul Werten, P. L. T. M. Frederix, Dalia Yablon, Christian A. Bippes
المصدر: Microscopy Today. 25:20-25
مصطلحات موضوعية: Modularity (networks), Materials science, General Computer Science, Computer architecture, Atomic force microscopy, 02 engineering and technology, 010402 general chemistry, 021001 nanoscience & nanotechnology, 0210 nano-technology, 01 natural sciences, 0104 chemical sciences