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المؤلفون: Jerome Mitard, Liesbeth Witters, Jacopo Franco, B. Kaczer, Guido Groeseneken, Geert Eneman, T. Y. Hoffmann, Ph. Hehenberger, Ph. J. Roussel, Tibor Grasser, Maria Toledano-Luque
المصدر: Microelectronic Engineering. 88:1388-1391
مصطلحات موضوعية: Materials science, Negative-bias temperature instability, Condensed matter physics, Passivation, Relaxation (NMR), Step height, Dielectric, Condensed Matter Physics, Layer thickness, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Threshold voltage, Electrical and Electronic Engineering, Layer (electronics)
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2
المؤلفون: Ph. Hehenberger, Tibor Grasser, Hans Reisinger, P.-J. Wagner
المصدر: Microelectronics Reliability. 49:1013-1017
مصطلحات موضوعية: Condensed matter physics, Chemistry, business.industry, Oxide, Electrical engineering, Trapping, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Term (time), Stress (mechanics), chemistry.chemical_compound, Voltage dependence, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business, Quantum tunnelling, Degradation (telecommunications), Voltage
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3
المؤلفون: Ph. Hehenberger, Michael Nelhiebel, Tibor Grasser, Wolfgang Goes, B. Kaczer, Th. Aichinger
المصدر: Microelectronic Engineering. 86:1876-1882
مصطلحات موضوعية: Negative-bias temperature instability, Condensed matter physics, Silicon, Chemistry, Dangling bond, chemistry.chemical_element, Trapping, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Amorphous solid, Tunnel effect, Vacancy defect, Forensic engineering, Electrical and Electronic Engineering, Quantum tunnelling
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المؤلفون: Tibor Grasser, Jacopo Franco, Wolfgang Goes, B. Kaczer, Oskar Baumgartner, Ph. Hehenberger
المصدر: 2011 International Conference on Simulation of Semiconductor Processes and Devices.
مصطلحات موضوعية: Stress (mechanics), chemistry.chemical_compound, Negative-bias temperature instability, Materials science, chemistry, Condensed matter physics, MOSFET, Substrate (electronics), Condensed Matter::Mesoscopic Systems and Quantum Hall Effect, Temperature measurement, Quantum, High-κ dielectric, Silicon-germanium
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::82b90bf1c45bc9f34528d30d58ee1d8d
https://doi.org/10.1109/sispad.2011.6035036 -
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المؤلفون: Tibor Grasser, Ph. Hehenberger, Hans Reisinger
مصطلحات موضوعية: 010302 applied physics, Negative-bias temperature instability, Materials science, Condensed matter physics, Relaxation (NMR), Oxide, Time constant, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Threshold voltage, Stress (mechanics), chemistry.chemical_compound, chemistry, 13. Climate action, Electric field, 0103 physical sciences, MOSFET, Electronic engineering, 0210 nano-technology
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::93014f02686bab4ca7f35169c1cc977e
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المؤلفون: Franz Schanovsky, P.-J. Wagner, Ph. Hehenberger, Ph. J. Roussel, Tibor Grasser, Ben Kaczer, Michael Nelhiebel, Hans Reisinger, Wolfgang Goes, Jacopo Franco, Th. Aichinger
مصطلحات موضوعية: 010302 applied physics, Risk analysis (engineering), Temperature instability, Computer science, 0103 physical sciences, Measure (physics), Electronic engineering, 010306 general physics, 01 natural sciences, Degradation (telecommunications), Charge exchange
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::46bfca3b23c0e59f9dde4dc3e07e03e8
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المؤلفون: Ben Kaczer, Ph. Hehenberger, Hans Reisinger, Wolfgang Goes, Tibor Grasser, Th. Aichinger, Jacopo Franco, P.-J. Wagner, Michael Nelhiebel
المصدر: 2009 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: Physics, chemistry.chemical_compound, Negative-bias temperature instability, Condensed matter physics, chemistry, Stochastic process, MOSFET, Electronic engineering, Oxide, Bias temperature stress, Uncorrelated
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ed8dbb2a6119fb72636b6dca9540c144
https://doi.org/10.1109/iedm.2009.5424235 -
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المؤلفون: Hans Reisinger, Ph. Hehenberger, P.-J. Wagner, Tibor Grasser
المصدر: 2009 Proceedings of the European Solid State Device Research Conference.
مصطلحات موضوعية: Stress (mechanics), Materials science, Logarithm, Condensed matter physics, International Electron Devices Meeting, Exponent, Electronic engineering, Relaxation (physics), Trapping, Temperature measurement, Degradation (telecommunications)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::081413cbcd68c8bd7fc8a045f53a0d75
https://doi.org/10.1109/essderc.2009.5331353 -
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المؤلفون: Tibor Grasser, Michael Nelhiebel, Th. Aichinger, Wolfgang Goes, Ben Kaczer, Ph. Hehenberger
المصدر: 2009 IEEE International Reliability Physics Symposium.
مصطلحات موضوعية: Negative-bias temperature instability, Materials science, Silicon, chemistry, Passivation, Annealing (metallurgy), MOSFET, Dangling bond, chemistry.chemical_element, Molecular physics, Quantum tunnelling, Amorphous solid
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المؤلفون: Oliver Triebl, Ph. Hehenberger, Michael Nelhiebel, Th. Aichinger, W. Gos, Tibor Grasser, Ben Kaczer
المصدر: 2009 IEEE International Reliability Physics Symposium.
مصطلحات موضوعية: Stress (mechanics), Hysteresis, chemistry.chemical_compound, Materials science, chemistry, Relaxation (NMR), Phase (waves), Electronic engineering, Oxide, Mechanics, Signal, Degradation (telecommunications), Voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::88e871f823cfc3c150130a838e4bef08
https://doi.org/10.1109/irps.2009.5173406