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المؤلفون: E. Vecchio, Roger Loo, Geert Eneman, W. Li, Nadine Collaert, C. Lorant, Geert Hellings, Davit Melkonyan, Trong Huynh-Bao, Philippe Matagne, Erik Rosseel, Arturo Sibaja-Hernandez, Farid Sebaai, Anabela Veloso, Claudia Fleischmann, Dennis H. van Dorp, Niamh Waldron, Katia Devriendt, Zheng Tao, Dan Mocuta, Bernardette Kunert, Efrain Altamirano-Sanchez, Lieve Teugels, Stephan Brus, Philippe Marien, Alexey Milenin, Vasile Paraschiv, Eddy Simoen, Boon Teik Chan
المصدر: ECS Transactions. 80:3-20
مصطلحات موضوعية: Engineering, Fabrication, business.industry, Nanowire, Electrical engineering, Hardware_PERFORMANCEANDRELIABILITY, Scaling limit, CMOS, Hardware_INTEGRATEDCIRCUITS, Process control, Optoelectronics, Parasitic extraction, Static random-access memory, business, AND gate, Hardware_LOGICDESIGN