المؤلفون: Banerjee, K., Breuil, L., Milenin, A.P., Pak, M., Stiers, J., McMitchell, S. R. C., Di Piazza, L., van den bosch, G., van Houdt, J.

المصدر: 2021 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2021 IEEE International. :1-4 May, 2021

Relation: 2021 IEEE International Memory Workshop (IMW)

المؤلفون: Vinciguerra, F.^{Aff1, IDs40618023020342_cor1}, Longhitano, S., Carrubba, N., Piazza, L., Di Stefano, C., Arpi, M. L., Baratta, R., Hagnäs, M.^{Aff4, Aff5}, Frittitta, L.^{Aff1, Aff3, Aff6}

المصدر: Journal of Endocrinological Investigation: Official Journal of Italian Society of Endocrinology (SIE). 46(9):1807-1814

المؤلفون: Higashi, Y., Florent, K., Subirats, A., Kaczer, B., Di Piazza, L., Clima, S., Ronchi, N., McMitchell, S. R. C., Banerjee, K., Celano, U., Suzuki, M., Linten, D., Van Houdt, J.

المصدر: 2019 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2019 IEEE International. :1-7 Mar, 2019

Relation: 2019 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Pretea G., Andrighetto A., Manzolaro M., Corradetti S., Scarpa D., Rossignoli M., Monetti A., Lollo M., Calderolla M., Vasquez J., Zafiropoulos D., Sarchiapone L., Benini D., Favaron P., Rigato M., Pegoraro R., Maniero D., Calabretta L., Comunian M., Maggiore M., Lombardi A., Piazza L., Porcellato A.M., Roncolato C., Bisoffi G., Pisent A., Galatà A., Giacchini M., Bassato G., Canella S., Gramegna F., Valiente J., Bermudez J., Mastinu P.F., Esposito J., Wyss J., Zanella S.

المصدر: EPJ Web of Conferences, Vol 66, p 11030 (2014)

مصطلحات موضوعية: Physics, QC1-999

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2100-014X

URL الوصول: https://doaj.org/article/facc46d1adc04f08b0815b341ba33b77

المؤلفون: Saito, D., Kobayashi, T., Koga, H., Ronchi, N., Banerjee, K., Shuto, Y., Okuno, J., Konishi, K., Di Piazza, L., Mallik, A., Van Houdt, J., Tsukamoto, M., Ohkuri, K., Umebayashi, T., Ezaki, T.

المصدر: 2021 Symposium on VLSI Circuits VLSI Circuits, 2021 Symposium on. :1-2 Jun, 2021

Relation: 2021 Symposium on VLSI Circuits

المؤلفون: Degraeve, R., Mallik, A., Garbin, D., Doevenspeck, J., Fantini, A., Rodopoulos, D., Roussel, Ph., Govoreanu, B., Hendrickx, P., Di Piazza, L., Stuijt, J., Schaafsma, S., Debacker, P., Donadio, G., Hody, H., Goux, L., Kar, G. S., Furnemont, A., Mocut, A., Verkest, D.

المصدر: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2018 IEEE International Symposium on the. :1-5 Jul, 2018

Relation: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Florent, K., Lavizzari, S., Di Piazza, L., Popovici, M., Duan, J., Groeseneken, G., Van Houdt, J.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 64(10):4091-4098 Oct, 2017

المؤلفون: Candeloro, D., Di Piazza, L., Musial, K., Sambucini, A. R.

المصدر: International Journal of Approximate Reasoning vol 112, pp 140-148, (2019)

مصطلحات موضوعية: Mathematics - Functional Analysis, 28B20, 26E25, 26A39, 28B05, 46G10, 54C60, 54C65

URL الوصول: http://arxiv.org/abs/1906.07019

المؤلفون: Zambon, P., Bottinelli, S., Schnyder, R., Musarra, D., Boye, D., Dudina, A., Lehmann, N., De Carlo, S., Rissi, M., Schulze-Briese, C., Meffert, M., Campanini, M., Erni, R., Piazza, L.

المصدر: In Nuclear Inst. and Methods in Physics Research, A March 2023 1048

المؤلفون: Higashi, Y., Ronchi, N., Kaczer, B., Banerjee, K., McMitchell, S. R. C., O'Sullivan, B. J., Clima, S., Minj, A., Celano, U., Di Piazza, L., Suzuki, M., Linten, D., Van Houdt, J.

المصدر: 2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :15.6.1-15.6.4 Dec, 2019

Relation: 2019 IEEE International Electron Devices Meeting (IEDM)