يعرض 1 - 10 نتائج من 30 نتيجة بحث عن '"Pilz, Jurgen"', وقت الاستعلام: 0.90s تنقيح النتائج
  1. 1
    مؤتمر
    Point Based Deep Learning to Automate Automotive Assembly Simulation Model Generation with Respect to the Digital Factory

    المؤلفون: Petschnigg, Christina, Bartscher, Stefan, Pilz, Jurgen

    المصدر: 2020 9th International Conference on Industrial Technology and Management (ICITM) Industrial Technology and Management (ICITM), 2020 9th International Conference on. :96-101 Feb, 2020

    Relation: 2020 9th International Conference on Industrial Technology and Management (ICITM)

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  2. 2
    مؤتمر
    Exact Confidence Intervals for the Hazard Rate of a Series Reliability System

    المؤلفون: Plum, Patrick, Lewitschnig, Horst, Pilz, Jurgen

    المصدر: 2020 Annual Reliability and Maintainability Symposium (RAMS) Reliability and Maintainability Symposium (RAMS), 2020 Annual. :1-6 Jan, 2020

    Relation: 2020 Annual Reliability and Maintainability Symposium (RAMS)

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  3. 3
    مؤتمر
    Unsupervised Algorithm to Detect Damage Patterns in Microstructure Images of Metal Films

    المؤلفون: Alagic, Dzenana, Pilz, Jurgen

    المصدر: 2018 IEEE International Conference on Image Processing, Applications and Systems (IPAS) Image Processing, Applications and Systems (IPAS), 2018 IEEE International Conference on. :67-72 Dec, 2018

    Relation: 2018 IEEE International Conference on Image Processing, Applications and Systems (IPAS)

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  4. 4
    مؤتمر
    Survey of recent advanced statistical models for early life failure probability assessment in semiconductor manufacturing

    المؤلفون: Kurz, Daniel, Lewitschnig, Horst, Pilz, Jurgen

    المصدر: Proceedings of the Winter Simulation Conference 2014 Simulation Conference (WSC), 2014 Winter. :2600-2608 Dec, 2014

    Relation: 2014 Winter Simulation Conference - (WSC 2014)

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  5. 5
    مؤتمر
    A sampling decision system for semiconductor manufacturing - relying on virtual metrology and actual measurements

    المؤلفون: Kurz, Daniel, Pilz, Jurgen, Schirru, Andrea, Pampuri, Simone, De Luca, Cristina

    المصدر: Proceedings of the Winter Simulation Conference 2014 Simulation Conference (WSC), 2014 Winter. :2649-2660 Dec, 2014

    Relation: 2014 Winter Simulation Conference - (WSC 2014)

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  6. 6
    مؤتمر
    Device level Maverick screening - detection of risk devices through Independent Component Analysis

    المؤلفون: Zernig, Anja, Bluder, Olivia, Pilz, Jurgen, Kastner, Andre

    المصدر: Proceedings of the Winter Simulation Conference 2014 Simulation Conference (WSC), 2014 Winter. :2661-2670 Dec, 2014

    Relation: 2014 Winter Simulation Conference - (WSC 2014)

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  7. 7
    مؤتمر
    Modeling and prediction of smart power semiconductor lifetime data using a Gaussian process prior

    المؤلفون: Plankensteiner, Kathrin, Bluder, Olivia, Pilz, Jurgen

    المصدر: Proceedings of the Winter Simulation Conference 2014 Simulation Conference (WSC), 2014 Winter. :2671-2681 Dec, 2014

    Relation: 2014 Winter Simulation Conference - (WSC 2014)

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  8. 8
    مؤتمر
    Monitoring virtual metrology reliability in a sampling decision system

    المؤلفون: Kurz, Daniel, De Luca, Cristina, Pilz, Jurgen

    المصدر: 2013 IEEE International Conference on Automation Science and Engineering (CASE) Automation Science and Engineering (CASE), 2013 IEEE International Conference on. :20-25 Aug, 2013

    Relation: 2013 IEEE International Conference on Automation Science and Engineering (CASE 2013)

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  9. 9
    مؤتمر
    Application of Bayesian networks to predict SMART power semiconductor lifetime

    المؤلفون: Plankensteiner, Kathrin, Bluder, Olivia, Pilz, Jurgen

    المصدر: Proceedings of the 2013 9th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME) Ph.D. Research in Microelectronics and Electronics (PRIME), 2013 9th Conference on. :281-284 Jun, 2013

    Relation: 2013 9th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME)

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  10. 10
    مؤتمر
    Sampling Decision System in semiconductor manufacturing using Virtual Metrology

    المؤلفون: Kurz, Daniel, DeLuca, Cristina, Pilz, Jurgen

    المصدر: 2012 IEEE International Conference on Automation Science and Engineering (CASE) Automation Science and Engineering (CASE), 2012 IEEE International Conference on. :74-79 Aug, 2012

    Relation: 2012 IEEE International Conference on Automation Science and Engineering (CASE 2012)

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