المؤلفون: Ho, C. Y., Lien, C., Sakamoto, Y., Yang, R. J., Fijita, H., Liu, C. H., Lin, Y. M., Pittikoun, S., Aritome, S.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 29(11):1199-1202 Nov, 2008

المؤلفون: Victor Chao-Wei Kuo, Chih-Ming Chao, Chih-Kai Kang, Li-Wei Liu, Tzung-Bin Huang, Liang-Tai Kuo, Shi-Hsien Chen, Houng-Chi Wei, Hann-Ping Hwang, Pittikoun, S.

المصدر: 2006 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'06) Memory Technology, Design and Testing Memory Technology, Design, and Testing, 2006. MTDT '06. 2006 IEEE International Workshop on. :77-79 2006

Relation: 2006 EEE International Workshop on Memory Technology, Design and Testing

المؤلفون: Liu, C. H., Lin, Y. M., Yin, D. Y., Tseng, G. H., Liaw, H. W., Wei, H. C., Chen, S. H., Chao, C. M., Hwang, H. P., Pittikoun, S., Aritome, S.

المصدر: 2009 IEEE International Memory Workshop Memory Workshop, 2009. IMW '09. IEEE International. :1-2 May, 2009

Relation: 2009 IEEE International Memory Workshop (IMW)

المؤلفون: Liu, C. H., Lin, Y. M., Sakamoto, Y., Yang, R. J., Yin, D. Y., Chiang, P. J., Wei, H. C., Ho, C. Y., Chen, S. H., Hwang, H. P., Hung, C. H., Pittikoun, S., Aritome, S.

المصدر: 2009 International Symposium on VLSI Technology, Systems, and Applications VLSI Technology, Systems, and Applications, 2009. VLSI-TSA '09. International Symposium on. :35-36 Apr, 2009

Relation: 2009 International Symposium on VLSI Technology, Systems, and Applications (VLSI-TSA)

المؤلفون: Liu, C. H., Lin, Y. M., Shirota, R., Wei, H. C., Kuo, L. T., Liu, C. Han., Chen, S. H., Hwang, H. P., Sakamoto, Y., Pittikoun, S.

المصدر: Proceedings of 2010 International Symposium on VLSI Technology, System and Application VLSI Technology Systems and Applications (VLSI-TSA), 2010 International Symposium on. :46-47 Apr, 2010

Relation: 2010 International Symposium on VLSI Technology, Systems, and Applications (VLSI-TSA)

المؤلفون: Lin, Y.C., Lai, C.S., Chung, S.S., Yang, E., Pittikoun, S., Tzeng, S.-M., Hsu, C.C.-H.

المصدر: 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. Reliability physics Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. 2005 IEEE International. :666-667 2005

Relation: 2005 IEEE International Reliability Physics Symposium. Proceedings 43rd Annual

المؤلفون: Kuo, C.-W., Yang, E.C.-S., Wei-Zhe Wong, Chin-Ming Chao, Chih-Kai Kang, Li-Wei Liu, Tzung-Bin Huang, Liang-Tai Kuo, Shi-Hsien Chen, Houng-Chi Wei, Hann-Ping Hwang, Pittikoun, S.

المصدر: 2006 7th Annual Non-Volatile Memory Technology Symposium; 2006, p16-20, 5p

لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.

المؤلفون: Hsin-Heng Wang, Pei-Shan Shieh, Chiu-Tsung Huang, Tokami, K., Kuo, R., Shin-Hsien Chen, Houng-Chi Wei, Pittikoun, S., Aritome, S.

المصدر: 2009 IEEE International Memory Workshop; 2009, p1-2, 2p

المؤلفون: Hsin-Heng Wang, Chiu-Tsung Huang, Shin-Hsien Chen, Kuo, R., Sophia Liu, Ling-Kuey Yang, Houng-Chi Wei, Pittikoun, S., Shirota, R., Chin-chen Cho

المصدر: 2008 International Symposium on VLSI Technology, Systems & Applications (VLSI-TSA); 2008, p87-88, 2p