يعرض 1 - 10 نتائج من 19 نتيجة بحث عن '"Polic, Michal"', وقت الاستعلام: 0.88s تنقيح النتائج
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    مؤتمر

    المصدر: 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) CVPR Computer Vision and Pattern Recognition (CVPR), 2023 IEEE/CVF Conference on. :21360-21370 Jun, 2023

    Relation: 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)

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    مؤتمر

    المصدر: 2020 IEEE-RAS 20th International Conference on Humanoid Robots (Humanoids) Humanoid Robots (Humanoids), 2020 IEEE-RAS 20th International Conference on. :445-452 Jul, 2021

    Relation: 2020 IEEE-RAS 20th International Conference on Humanoid Robots (Humanoids)

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    مؤتمر

    المصدر: 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) CVPR Computer Vision and Pattern Recognition (CVPR), 2020 IEEE/CVF Conference on. :5990-5999 Jun, 2020

    Relation: 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)

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    مؤتمر

    المصدر: 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) CVPR Computer Vision and Pattern Recognition (CVPR), 2020 IEEE/CVF Conference on. :2502-2510 Jun, 2020

    Relation: 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)

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    مؤتمر

    المؤلفون: Polic, Michal, Pajdla, Tomas

    المصدر: 2017 International Conference on 3D Vision (3DV) 3DV 3D Vision (3DV), 2017 International Conference on. :282-290 Oct, 2017

    Relation: 2017 International Conference on 3D Vision (3DV)

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    كتاب إلكتروني

    المؤلفون: Polic, MichalAff15, Pajdla, TomasAff15

    المساهمون: Hutchison, David, Series editorAff1, Kanade, Takeo, Series editorAff2, Kittler, Josef, Series editorAff3, Kleinberg, Jon M., Series editorAff4, Mattern, Friedemann, Series editorAff5, Mitchell, John C., Series editorAff6, Naor, Moni, Series editorAff7, Pandu Rangan, C., Series editorAff8, Steffen, Bernhard, Series editorAff9, Terzopoulos, Demetri, Series editorAff10, Tygar, Doug, Series editorAff11, Weikum, Gerhard, Series editorAff12, Sharma, Puneet, editorAff13, Bianchi, Filippo Maria, editorAff14

    المصدر: Image Analysis : 20th Scandinavian Conference, SCIA 2017, Tromsø, Norway, June 12–14, 2017, Proceedings, Part I. 10269:110-121