المؤلفون: Pompl, T., Bashir, T.K., Voelker, M., Last, F., Ostermayr, M.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 23(3):363-369 Sep, 2023

المؤلفون: Pompl, T., Henkel, S., Stahl, J., Ostermayr, M.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 19(3):520-528 Sep, 2019

المؤلفون: Pompl, T., Schlunder, C., Hommel, M., Nielen, H., Schneider, J.

المصدر: 2006 43rd ACM/IEEE Design Automation Conference Design Automation Conference Design Automation Conference, 2006 43rd ACM/IEEE. :193-198 2006

Relation: 2006 Design Automation Conference

المؤلفون: Pompl, T., Allers, K.-H., Schwab, R., Hofmann, K., Roehner, M.

المصدر: 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. Reliability physics Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. 2005 IEEE International. :388-397 2005

Relation: 2005 IEEE International Reliability Physics Symposium. Proceedings 43rd Annual

المؤلفون: Steegen, A., Mo, R., Mann, R., Sun, M.-C., Eller, M., Leake, G., Vietzke, D., Tilke, A., Guarin, F., Fischer, A., Pompl, T., Massey, G., Vayshenker, A., Tan, W.L., Ebert, A., Lin, W., Gao, W., Lian, J., Kim, J.-P., Wrschka, P., Yang, J.-H., Ajmera, A., Knoefler, R., Teh, Y.-W., Jamin, F., Park, J.E., Hooper, K., Griffin, C., Nguyen, P., Klee, V., Ku, V., Baiocco, C., Johnson, G., Tai, L., Benedict, J., Scheer, S., Zhuang, H., Ramanchandran, V., Matusiewicz, G., Lin, Y.-H., Siew, Y.K., Zhang, F., Leong, L.S., Liew, S.L., park, K.C, Lee, K.-W., Hong, D.H., Choi, S.-M., Kaltalioglu, E., Kim, S.O., Naujok, M., Sherony, M., Cowley, A., Thomas, A., Sudijohno, J., Schiml, T., Ku, J.-H., Yang, I.

المصدر: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :64-67 2005

Relation: International Electron Devices Meeting 2005

المؤلفون: Pompl, T., Kerber, M., Innertsberger, G., Allers, K.-H., Obry, M., Krasemann, A., Temmler, D.

المصدر: 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) Reliability physics symposium Reliability Physics Symposium Proceedings, 2002. 40th Annual. :393-403 2002

Relation: 2002 IEEE International Reliability Physics Symposium Proceedings. 40th Annual

المؤلفون: Pompl, T., Strasser, R., Drexl, S., Ostermayr, M.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 15(4):638-638 Dec, 2015

المؤلفون: Anil, K.G., Pompl, T., Eisele, I.

المصدر: 30th European Solid-State Device Research Conference Solid-State Device Research Conference, 2000. Proceeding of the 30th European. :132-135 2000

Relation: 30th European Solid-State Device Research Conference

المؤلفون: Pompl, T., Kerber, M., Wurzer, H., Eisele, I.

المصدر: 30th European Solid-State Device Research Conference Solid-State Device Research Conference, 2000. Proceeding of the 30th European. :292-295 2000

Relation: 30th European Solid-State Device Research Conference

المؤلفون: Pompl, T., Wurzer, H., Kerber, M., Eisele, I.

المصدر: 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059) Reliability physics Reliability Physics Symposium, 2000. Proceedings. 38th Annual 2000 IEEE International. :40-47 2000

Relation: 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual