يعرض 1 - 10 نتائج من 182 نتيجة بحث عن '"Puglisi, Francesco Maria"', وقت الاستعلام: 1.07s تنقيح النتائج
  1. 1
    مؤتمر
    The Major Effect of Trapped Charge on Dielectric Breakdown Dynamics and Lifetime Estimation

    المؤلفون: Vecchi, Sara, Padovani, Andrea, Pavan, Paolo, Puglisi, Francesco Maria

    المصدر: 2023 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2023 IEEE International. :1-7 Oct, 2023

    Relation: 2023 IEEE International Integrated Reliability Workshop (IIRW)

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  2. 2
    مؤتمر
    A Unified Framework to Explain Random Telegraph Noise Complexity in MOSFETs and RRAMs

    المؤلفون: Vecchi, Sara, Pavan, Paolo, Puglisi, Francesco Maria

    المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-6 Mar, 2023

    Relation: 2023 IEEE International Reliability Physics Symposium (IRPS)

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  3. 3
    مؤتمر
    The Role of Defects and Interface Degradation on Ferroelectric HZO Capacitors Aging

    المؤلفون: Benatti, Lorenzo, Vecchi, Sara, Pesic, Milan, Puglisi, Francesco Maria

    المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-6 Mar, 2023

    Relation: 2023 IEEE International Reliability Physics Symposium (IRPS)

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  4. 4
    مؤتمر
    In-Memory Computing Discussion Group

    المؤلفون: Puglisi, Francesco Maria

    المصدر: 2022 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2022 IEEE International. :1-14 Oct, 2022

    Relation: 2022 IEEE International Integrated Reliability Workshop (IIRW)

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  5. 5
    مؤتمر
    Impedance Spectroscopy of Ferroelectric Capacitors and Ferroelectric Tunnel Junctions

    المؤلفون: Benatti, Lorenzo, Vecchi, Sara, Puglisi, Francesco Maria

    المصدر: 2022 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2022 IEEE International. :1-6 Oct, 2022

    Relation: 2022 IEEE International Integrated Reliability Workshop (IIRW)

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  6. 6
    مؤتمر
    Defects Motion as the Key Source of Random Telegraph Noise Instability in Hafnium Oxide

    المؤلفون: Vecchi, Sara, Pavan, Paolo, Puglisi, Francesco Maria

    المصدر: ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), ESSDERC 2022 - IEEE 52nd European. :368-371 Sep, 2022

    Relation: ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC)

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  7. 7
    مؤتمر
    Self-consistent Automated Parameter Extraction of RRAM Physics-Based Compact Model

    المؤلفون: Zanotti, Tommaso, Pavan, Paolo, Puglisi, Francesco Maria

    المصدر: ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), ESSDERC 2022 - IEEE 52nd European. :316-319 Sep, 2022

    Relation: ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC)

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  8. 8
    مؤتمر
    The Relevance of Trapped Charge for Leakage and Random Telegraph Noise Phenomena

    المؤلفون: Vecchi, Sara, Pavan, Paolo, Puglisi, Francesco Maria

    المصدر: 2022 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2022 IEEE International. :1-6 Mar, 2022

    Relation: 2022 IEEE International Reliability Physics Symposium (IRPS)

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  9. 9
    مؤتمر
    Understanding the Reliability of Ferroelectric Tunnel Junction Operations using an Advanced Small-Signal Model

    المؤلفون: Benatti, Lorenzo, Puglisi, Francesco Maria

    المصدر: 2021 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2021 IEEE International. :1-6 Oct, 2021

    Relation: 2021 IEEE International Integrated Reliability Workshop (IIRW)

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  10. 10
    مؤتمر
    Performances and Trade-offs of Low-Bit Precision Neural Networks based on Resistive Memories

    المؤلفون: Zanotti, Tommaso, Pavan, Paolo, Puglisi, Francesco Maria

    المصدر: 2021 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2021 IEEE International. :1-5 Oct, 2021

    Relation: 2021 IEEE International Integrated Reliability Workshop (IIRW)

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