المؤلفون: Parent, D.W., Hossain, T., King, D., Lagua, P., Gorman, S.

المصدر: 2021 IEEE Frontiers in Education Conference (FIE) Frontiers in Education Conference (FIE), 2021 IEEE. :1-5 Oct, 2021

Relation: 2021 IEEE Frontiers in Education Conference (FIE)

المؤلفون: Yeh, Zuo-Wei, Hsu, Chia-Hua, Yeh, Chen-Fu, Wu, Wen-Chieh, Wang, Cheng-Te, Lo, Chung-Chuan, Tang, Kea-Tiong

المصدر: 2021 IEEE International Symposium on Circuits and Systems (ISCAS). :1-5 May, 2021

Relation: 2021 IEEE International Symposium on Circuits and Systems (ISCAS)

المؤلفون: Rezaei Aderiani, Abolfazl, 1986, Wärmefjord, Kristina, 1976, Söderberg, Rikard, 1963

المصدر: Digital kvalitetssäkring för hållbar produktion 17th CIRP Conference on Computer Aided Tolerancing, Metz, France Procedia CIRP. 114:112-116

مصطلحات موضوعية: QIF standard, Computer aided tolerancing, STEP 242 standard, Model-based definition

وصف الملف: electronic

URL الوصول: https://research.chalmers.se/publication/534029
https://research.chalmers.se/publication/532966
https://research.chalmers.se/publication/534029/file/534029_Fulltext.pdf

المؤلفون: Mertens, Christoph^Aff4, Alonso, Jesús^Aff5, Lázaro, Oscar^Aff5, Palansuriya, Charaka^Aff6, Böge, Gernot^Aff7, Nizamis, Alexandros^Aff8, Rousopoulou, Vaia^Aff8, Ioannidis, Dimosthenis^Aff8, Tzovaras, Dimitrios^Aff8, Touma, Rizkallah^Aff9, Tarzán, Miquel^Aff9, Mallada, Diego^Aff10, Figueiras, Paulo^Aff11, Costa, Ruben^Aff11, Graça, Diogo^Aff12, Garcia, Gisela^Aff12, Laibarra, Begoña^Aff13, Celaya, Aitor^Aff13, Sobonski, Piotr^Aff14, Naeem, Azzam^Aff14, Mozo, Alberto^Aff15, Vakaruk, Stanislav^Aff15, Sierra-García, J. Enrique^Aff16, Pastor, Antonio^Aff17, Rodriguez, Juan^Aff17, Hildebrand, Marlène^Aff18, Luniewski, Tomasz^Aff19, Zietak, Wojciech^Aff19, Lange, Christoph^Aff20, Sipsas, Konstantinos^Aff21, Poulakidas, Athanasios^Aff21

المساهمون: Curry, Edward, editor^Aff1, Scerri, Simon, editor^Aff2, Tuikka, Tuomo, editor^Aff3

المصدر: Data Spaces : Design, Deployment and Future Directions. :201-226

المؤلفون: Lázaro, Oscar^Aff7, Alonso, Jesús^Aff7, Holom, Roxana-Maria^Aff8, Rafetseder, Katharina^Aff8, Kritzinger, Stefanie, Ubis, Fernando^Aff9, Fritz, Gerald^Aff10, Wiesinger, Alois^Aff11, Sehrschön, Harald^Aff11, Nguyen, Jimmy^Aff12, Luniewski, Tomasz^Aff12, Zietak, Wojciech^Aff12, Clavel, Jerome^Aff13, Perez, Roberto^Aff13, Hildebrand, Marlene^Aff14, Kiritsis, Dimitris^Aff14, Garious, Hugues-Arthur^Aff15, de la Maza, Silvia^Aff16, Ventura-Traveset, Antonio^Aff17, Hierro, Juanjo^Aff18, Boege, Gernot^Aff18, Ahle, Ulrich^Aff18

المساهمون: Curry, Edward, editor^Aff1, Auer, Sören, editor^Aff2, Berre, Arne J., editor^Aff3, Metzger, Andreas, editor^Aff4, Perez, Maria S., editor^Aff5, Zillner, Sonja, editor^Aff6

المصدر: Technologies and Applications for Big Data Value. :399-429

المؤلفون: Ram, Peethani Sai^Aff10, Deepak Lawrence, K.^Aff10

المساهمون: Cavas-Martínez, Francisco, Series Editor^Aff1, Chaari, Fakher, Series Editor^Aff2, Gherardini, Francesco, Series Editor^Aff3, Haddar, Mohamed, Series Editor^Aff4, Ivanov, Vitalii, Series Editor^Aff5, Kwon, Young W., Series Editor^Aff6, Trojanowska, Justyna, Series Editor^Aff7, Chakrabarti, Amaresh, editor^Aff8, Arora, Manish, editor^Aff9

المصدر: Industry 4.0 and Advanced Manufacturing : Proceedings of I-4AM 2019. :127-138

المؤلفون: Strickland, Justin C.^Aff1, Chen, I-Chen^Aff2, Wang, Chanung^Aff3, Fardo, David W.^Aff2

المصدر: BMC Genetics. 19(Suppl 1)

المؤلفون: Mertens, Christoph, Alonso, Jesús, Lázaro, Oscar, Palansuriya, Charaka, Böge, Gernot, Nizamis, Alexandros, Rousopoulou, Vaia, Ioannidis, Dimosthenis, Tzovaras, Dimitrios, Touma, Rizkallah, Tarzán, Miquel, Mallada, Diego, Figueiras, Paulo, Costa, Ruben, Graça, Diogo, Garcia, Gisela, Laibarra, Begoña, Celaya, Aitor, Sobonski, Piotr, Naeem, Azzam, Mozo, Alberto, Vakaruk, Stanislav, Sierra-García, J. Enrique, Pastor, Antonio, Rodríguez, Juan, Hildebrand, Marlène, Luniewski, Tomasz, Zietak, Wojciech, Lange, Christoph, Sipsas, Konstantinos, Poulakidas, Athanasios

المساهمون: UNINOVA-Instituto de Desenvolvimento de Novas Tecnologias

مصطلحات موضوعية: QIF, Data treasures, Certification, Semantic model, Digital sovereignty, IDSA, Data Space, Data sharing, Open source, Trust, Interoperability, EIDS, FIWARE

URL الوصول: https://explore.openaire.eu/search/publication?articleId=od______1437::c08359f34a148e8b60f1d81180fa8b4f
https://hdl.handle.net/10362/150246

المؤلفون: Teodor Vernica, Robert Lipman, Thomas Kramer, Soonjo Kwon, William Z. Bernstein

المصدر: Vernica, T, Lipman, R, Kramer, T, Kwon, S & Bernstein, W Z 2022, ' Visualizing Standardized Model-Based Design and Inspection Data in Augmented Reality ', Journal of Computing and Information Science in Engineering, vol. 22, no. 4, 041001 . https://doi.org/10.1115/1.4053154

مصطلحات موضوعية: Product manufacturing information, QIF, Standards, MBD, Industrial augmented reality, Inspection, Digital thread, Model-based definition, PMI, Interoperability, Computer Graphics and Computer-Aided Design, Industrial and Manufacturing Engineering, Computer Science Applications, Quality information framework, Software

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::523cd82437476cba58f9ba2162597127
https://pure.au.dk/portal/da/publications/visualizing-standardized-modelbased-design-and-inspection-data-in-augmented-reality(239d247f-f791-4135-9b67-a29539e99090).html

المؤلفون: Laiz, Héctor, Hackel, Siegfried, Härtig, Frank, Schrader, Thorsten, Shanna, Shanna, Loewe, Jan, Doering, Lutz, Gloger, Benjamin, Jagieniak, Justin, Hutzschenreuter, Daniel, Söylev-Öktem, Gamze, Phuaknoi, Pawat, Mongkolsuttirat, Kittisun, Chantawong, Narin, Limthunyalak, Wasin, Buajarern, Jariya, Hanisch, Robert, Fedchak, James Antony, Choquette, Steven, Rimmer, Caterine, Long, Benjamin, Plante, Raymond, Lippa, Katrice, Camara, Dinis, Saxholm, Sari, Kärkkäinen, Anu, Hemming, Björn, Sairanen, Hannu, Koskinen, Sami, Nummiluikki, Juho, Riska, Kennet, Järnefelt, Tapio, Mustapää, Tuukka, Viitala, Raine, Ijäs, Miikka, Brandt, Jari, Haapalainen, Mikko, Videnoja, Emmi, Banholzer, Karlheinz, Müller-Schöll, Christian, Haller, Julian, Reitzer, Heiko, Kuenz, Eric, Koch, Hans, Lopez-Celis, Jose Armando, Dominguez-Mendoza, Itzel, Galvan-Hernandez, Carlos, Garcia-Gonzalez, Aldo, Gasca Aragon, Hugo, Ramos-Monsalvo, Oscar, Kuster, Mark, Tobola, Andreas, Bernien, Matthias, Bock, Thomas, Niepraschk, Rolf, Jousten, Karl, Matamala, Antonio, Proskurin, Pavel, Engel, Thomas, Smith, Ian, Stotz, Maik, Stobe, Caroline, Röske, Dirk, Schwartz, Schwartz Michael L., Cenker, Greg, Kuch, Susanne, Kirmes, Raoul, Witt, Florian, Bakri, Saad Ali Haj, Al-Rahali, Talaat, Busser, Lisa, Xiong, Xingchuang, Brown, Robert, Morse, Ed, Krah, Thomas

مصطلحات موضوعية: Digital Test Certificate (DTC), DCC Good Practice, Digital SchemaX (DX), Envelope Digital Certificate (EDC), Digital SI (D-SI), Security in DCC, Quality Information Framework (QIF), Digital Calibration Certificate (DCC), Excel tool for generating DCCs, Digital Reference Materials (DRM)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b7f861f45b95b3569361c833c718f14b