المؤلفون: Mu He, Peng Dong, Yao Ma, Qingkui Yu, Shuang Cao, Wende Huang, Qian Xu, Sijie Zhang, Mingmin Huang, Yun Li, Zhimei Yang, Min Gong

المصدر: Results in Physics, Vol 60, Iss , Pp 107672- (2024)

مصطلحات موضوعية: SiC MOSFET, Electron irradiation, Room-temperature anneal, Oxide trap, Interface trap, Physics, QC1-999

وصف الملف: electronic resource

Relation: http://www.sciencedirect.com/science/article/pii/S2211379724003553; https://doaj.org/toc/2211-3797

URL الوصول: https://doaj.org/article/8b5e8485341344039951d55ffcf5921f

المؤلفون: Lei, Luo, Yinghui, Liu, Hongwei, Zhang, Xuesong, Zheng, Qingkui, Yu, Min, Tang

المصدر: 2019 2nd International Conference on Information Systems and Computer Aided Education (ICISCAE) Information Systems and Computer Aided Education (ICISCAE), 2019 2nd International Conference on. :350-353 Sep, 2019

Relation: 2019 2nd International Conference on Information Systems and Computer Aided Education (ICISCAE)

المؤلفون: Shuang, Cao, Qingkui, Yu, Guanghua, Du, Jinlong, Guo, He, Wang, Hongwei, Zhang, Yi, Sun

المصدر: 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2019 IEEE 26th International Symposium on. :1-4 Jul, 2019

Relation: 2019 IEEE 26th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: He, Wang, Qingkui, Yu, Yi, Sun

المصدر: 2018 IEEE 3rd International Conference on Integrated Circuits and Microsystems (ICICM) Integrated Circuits and Microsystems (ICICM), 2018 IEEE 3rd International Conference on. :366-369 Nov, 2018

Relation: 2018 IEEE 3rd International Conference on Integrated Circuits and Microsystems (ICICM)

المؤلفون: Pengwei, LI, Liang, ZHEN, Xingji, LI, Jianqun, YANG, Bo, MEI, He, LV, Qingkui, YU, Min, TANG, Weixin, XU

المصدر: 2018 International Conference on Radiation Effects of Electronic Devices (ICREED) Radiation Effects of Electronic Devices (ICREED), 2018 International Conference on. :1-4 May, 2018

Relation: 2018 International Conference on Radiation Effects of Electronic Devices (ICREED)

المؤلفون: Lei, Luo, Yinghui, Liu, Yi, Sun, Xiaoliang, Li, Qingkui, Yu

المصدر: 2018 International Conference on Radiation Effects of Electronic Devices (ICREED) Radiation Effects of Electronic Devices (ICREED), 2018 International Conference on. :1-4 May, 2018

Relation: 2018 International Conference on Radiation Effects of Electronic Devices (ICREED)

المؤلفون: Ming, Zhu, HengJing, Zhu, He, Hang, Hantian, Gu, Wei, Zhang, Qingkui, Yu, Yi, Sun, Min, Tang

المصدر: 2017 Prognostics and System Health Management Conference (PHM-Harbin) Prognostics and System Health Management Conference (PHM-Harbin), 2017. :1-4 Jul, 2017

Relation: 2017 Prognostics and System Health Management Conference (PHM-Harbin)

المؤلفون: Ming, Zhu, He, Kang, HengJing, Zhu, QingKui, Yu, Yi, Sun, Min, Tang

المصدر: 2017 International Conference on Circuits, System and Simulation (ICCSS) Circuits, System and Simulation (ICCSS), 2017 International Conference on. :109-112 Jul, 2017

Relation: 2017 International Conference on Circuits, System and Simulation (ICCSS)

المؤلفون: Qingkui, YU, Yi, SUN, Zheli, WANG, Bo, MEI, Xiaoliang, LI, He, LV, Pengwei, LI, Lei, LUO, Min, TANG, Ping, WEN

المصدر: 2018 International Conference on Radiation Effects of Electronic Devices (ICREED) Radiation Effects of Electronic Devices (ICREED), 2018 International Conference on. :1-3 May, 2018

Relation: 2018 International Conference on Radiation Effects of Electronic Devices (ICREED)

المؤلفون: He, Wang, Liang, Zhang, Yue, Wang, Qingkui, Yu

المصدر: 2018 International Conference on Radiation Effects of Electronic Devices (ICREED) Radiation Effects of Electronic Devices (ICREED), 2018 International Conference on. :1-3 May, 2018

Relation: 2018 International Conference on Radiation Effects of Electronic Devices (ICREED)