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1مؤتمر
المؤلفون: Bhavnagarwala, A., Kosonocky, S., Radens, C., Stawiasz, K., Mann, R., Qiuyi Ye, Chin, K.
المصدر: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :659-662 2005
Relation: International Electron Devices Meeting 2005
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2مؤتمر
المؤلفون: Yujun Li, Jai-Hoon Sim, Mandelman, J., McStay, K., Qiuyi Ye, Bronner, G.
المصدر: 2001 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers (Cat. No.01TH8517) VLSI technology, systems, and applications VLSI Technology, Systems, and Applications, 2001. Proceedings of Technical Papers. 2001 International Symposium on. :85-88 2001
Relation: 2001 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers
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3مؤتمرIntegration of high-performance, low-leakage and mixed signal features into a 100 nm CMOS technology
المؤلفون: Schafbauer, T., Brighten, J., Yi-Cheng Chen, Clevenger, L., Commons, M., Cowley, A., Esmark, K., Grassmann, A., Hodel, U., Hsiang-Jen Huang, Shih-Fen Huang, Yimin Huang, Kaltalioglu, E., Knoblinger, G., Ming-Tsan Lee, Leslie, A., Pak Leung, Baozhen Li, Chuan Lin, Yi-Hsiung Lin, Nissl, W., Phung Nguyen, Olbrich, A., Riess, P., Rovedo, N., Sportouch, S., Thomas, A., Vietzke, D., Wendel, M., Robert Wong, Qiuyi Ye, Kun-Chi Lin, Schiml, T., Wann, C.
المصدر: 2002 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.01CH37303) VLSI technology VLSI Technology, 2002. Digest of Technical Papers. 2002 Symposium on. :62-63 2002
Relation: 2002 Symposium on VLSI Technology Digest of Technical Papers
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4
المؤلفون: Ye Jiang, Qiuyi Ye, Lin Ma, Xiaojuan Yang, Jianwen Zhang, Zhaowen Mo
المصدر: Journal of Plant Growth Regulation. 42:2221-2231
مصطلحات موضوعية: Plant Science, Agronomy and Crop Science
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5مؤتمر
المصدر: 2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515) Integrated reliability workshop Integrated Reliability Workshop Final Report, 2000 IEEE International. :102-103 2000
Relation: 2000 IEEE International Integrated Reliability Workshop Final Report
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6مؤتمر
المؤلفون: Qiuyi Ye, Terletzki, H., Tonti, W.
المصدر: 2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515) Integrated reliability workshop Integrated Reliability Workshop Final Report, 2000 IEEE International. :153-154 2000
Relation: 2000 IEEE International Integrated Reliability Workshop Final Report
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7
المؤلفون: Xiaofeng Xie, Chi-Cheng Fu, Lei Lv, Qiuyi Ye, Yue Yu, Qu Fang, Liping Zhang, Likun Hou, Chunyan Wu
المصدر: Modern Pathology. 35:609-614
مصطلحات موضوعية: Pleural Effusion, China, Lung Neoplasms, ROC Curve, Humans, Neural Networks, Computer, Pathology and Forensic Medicine
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8
المؤلفون: Wu Li, Zifeng Gao, Runfei Gui, Xiaomeng Fu, Huijia Xie, Umair Ashraf, Qiuyi Ye, Zhaowen Mo, Jiale Chen, Jiangtao Tan
المصدر: Journal of Plant Growth Regulation. 40:1613-1628
مصطلحات موضوعية: 0106 biological sciences, 0301 basic medicine, biology, food and beverages, Plant physiology, chemistry.chemical_element, Plant Science, biology.organism_classification, 01 natural sciences, Nitrogen, 03 medical and health sciences, Horticulture, 030104 developmental biology, Nutrient, Dry weight, chemistry, Yield (chemistry), Cultivar, Agronomy and Crop Science, Aroma, 010606 plant biology & botany, Panicle
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9
المؤلفون: Jingjing Zhao, Fangfang Liu, Qiuyi Ye, Lei Lv, Chi-Cheng Fu, Qing Zhang, Yue Yu, Jing Yu, Wei Dong, Shuxia Li, Qu Fang, Chuan He, Huiting Zhu
المصدر: SSRN Electronic Journal.
مصطلحات موضوعية: History, Polymers and Plastics, Business and International Management, Industrial and Manufacturing Engineering
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d589f2949d94b3f1eeebadc3c0d74529
https://doi.org/10.2139/ssrn.4003138 -
10
المؤلفون: Chuanhong Zhou, Yang Xu, Qiuyi Ye
المصدر: Lecture Notes in Electrical Engineering ISBN: 9789811905711
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::18c7791b5f3dd31eecaf031f019da852
https://doi.org/10.1007/978-981-19-0572-8_46