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1
المؤلفون: Laiz, Héctor, Hackel, Siegfried, Härtig, Frank, Schrader, Thorsten, Shanna, Shanna, Loewe, Jan, Doering, Lutz, Gloger, Benjamin, Jagieniak, Justin, Hutzschenreuter, Daniel, Söylev-Öktem, Gamze, Phuaknoi, Pawat, Mongkolsuttirat, Kittisun, Chantawong, Narin, Limthunyalak, Wasin, Buajarern, Jariya, Hanisch, Robert, Fedchak, James Antony, Choquette, Steven, Rimmer, Caterine, Long, Benjamin, Plante, Raymond, Lippa, Katrice, Camara, Dinis, Saxholm, Sari, Kärkkäinen, Anu, Hemming, Björn, Sairanen, Hannu, Koskinen, Sami, Nummiluikki, Juho, Riska, Kennet, Järnefelt, Tapio, Mustapää, Tuukka, Viitala, Raine, Ijäs, Miikka, Brandt, Jari, Haapalainen, Mikko, Videnoja, Emmi, Banholzer, Karlheinz, Müller-Schöll, Christian, Haller, Julian, Reitzer, Heiko, Kuenz, Eric, Koch, Hans, Lopez-Celis, Jose Armando, Dominguez-Mendoza, Itzel, Galvan-Hernandez, Carlos, Garcia-Gonzalez, Aldo, Gasca Aragon, Hugo, Ramos-Monsalvo, Oscar, Kuster, Mark, Tobola, Andreas, Bernien, Matthias, Bock, Thomas, Niepraschk, Rolf, Jousten, Karl, Matamala, Antonio, Proskurin, Pavel, Engel, Thomas, Smith, Ian, Stotz, Maik, Stobe, Caroline, Röske, Dirk, Schwartz, Schwartz Michael L., Cenker, Greg, Kuch, Susanne, Kirmes, Raoul, Witt, Florian, Bakri, Saad Ali Haj, Al-Rahali, Talaat, Busser, Lisa, Xiong, Xingchuang, Brown, Robert, Morse, Ed, Krah, Thomas
مصطلحات موضوعية: Digital Test Certificate (DTC), DCC Good Practice, Digital SchemaX (DX), Envelope Digital Certificate (EDC), Digital SI (D-SI), Security in DCC, Quality Information Framework (QIF), Digital Calibration Certificate (DCC), Excel tool for generating DCCs, Digital Reference Materials (DRM)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b7f861f45b95b3569361c833c718f14b
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2
المؤلفون: D. I. Kang, Jorge. A. P. Cruz, Medina, Nieves, PEDRO SILVA GIRAU, PEDRO M. RAMOS, Van Biesen, Leo, Borsic, Mladen, Röske, Dirk, M. Peters, K. Iizuka, Kemény, Tamás, A. Pusa, K.T.V. Grattan, T. Pfeifer, Filipe, Eduarda, De Bièvre, Paul, P. Daponte, C. Ferrero, K. Herrmann, F. Pavese, F. Righini, R. Kaarls (CIPM, Kumme, Rolf, D. M. Stefanescu, S. Tachi, Torres-Guzman, Jorge C., A. J. Wallard
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::90c732a2a6c62e7171e73df6ee867585
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3مؤتمر
المؤلفون: Bruns, Thomas, Nordholz, Jan, Röske, Dirk, Schrader, Thorsten
المصدر: In Measurement: Sensors December 2021 18
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4مؤتمر
المؤلفون: Röske, Dirk
المصدر: In Measurement: Sensors December 2021 18
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5
المؤلفون: Ulbig, Peter, Rott, Christian, Winkler, Paul, Schwind, Daniel, Neukirch, Christian, Kirchner, Herbert, Elbert, Christian, Schnell, Norbert, Schnelle-Werner, Olaf, Gerber, Siegfried, Röske, Dirk, Giesen, Georg, Siekmann, Lothar, Fleischmann, Philip M.
مصطلحات موضوعية: DKD, Deutscher Kalibrierdienst, Fachausschüsse des DKD
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::39dc4cffe7aba4a3fef42ce0073db4c2
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6
المؤلفون: Ulbig, Peter, Rott, Christian, Winkler, Paul, Schwind, Daniel, Neukirch, Christian, Kirchner, Herbert, Elbert, Christian, Schnell, Norbert, Schnelle-Werner, Olaf, Gerber, Siegfried, Röske, Dirk, Giesen, Georg, Siekmann, Lothar, Fleischmann, Philip M.
مصطلحات موضوعية: DKD, Deutscher Kalibrierdienst, Fachausschüsse des DKD
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f2f7fe98ad6a40696c5b5fdb3fd59146
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7دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
8
المؤلفون: Rott, Christian, Winkler, Paul, Schwind, Daniel, Neukirch, Christian, Kirchner, Herbert, Elbert, Christian, Schnell, Norbert, Schnelle-Werner, Olaf, Gerber, Siegfried, Röske, Dirk, Giesen, Georg, Siekmann, Lothar, Fleischmann, Philip M.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3b4b0cb99c87e3df99883911cfc648f7
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9دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
10دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.