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1
المؤلفون: J. Hjelen, R. A. Schwarzer
المصدر: Materials Science and Technology. 26:646-649
مصطلحات موضوعية: Diffraction, Materials science, Backscatter, Orientation (computer vision), business.industry, Mechanical Engineering, Process (computing), Condensed Matter Physics, Quality (physics), Optics, Mechanics of Materials, Microscopy, A priori and a posteriori, General Materials Science, business, Electron backscatter diffraction
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2
المؤلفون: R. A. Schwarzer, I. V. Gervas’eva, Ya. V. Podkin, B. K. Sokolov, D. P. Rodionov
المصدر: The Physics of Metals and Metallography. 102:439-451
مصطلحات موضوعية: Nickel, Materials science, chemistry, Annealing (metallurgy), Metallic materials, Metallurgy, Materials Chemistry, chemistry.chemical_element, Recrystallization (metallurgy), Composite material, Condensed Matter Physics
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3
المؤلفون: R. A. Schwarzer
المصدر: Zeitschrift für Kristallographie Supplements. 2006:163-168
مصطلحات موضوعية: Inorganic Chemistry, Physics, Crystallography, Crystal orientation, General Materials Science, Condensed Matter Physics, Submicron scale
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a6a1ad1ff240708bb539fb8ac9f36c2d
https://doi.org/10.1524/zksu.2006.suppl_23.163 -
4
المؤلفون: A. K. Singh, R. A. Schwarzer
المصدر: Zeitschrift für Metallkunde. 96:345-351
مصطلحات موضوعية: Materials science, Magnesium, Metals and Alloys, Crystal orientation, chemistry.chemical_element, STRIPS, Microstructure, law.invention, Crystallography, Electron diffraction, chemistry, law, Development (differential geometry), Texture (crystalline), Composite material, Electron backscatter diffraction
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e4da84083ba7def406aa2a78557d447b
https://doi.org/10.3139/146.018119 -
5
المؤلفون: R. A. Schwarzer
المصدر: Fresenius' Journal of Analytical Chemistry. 361:522-526
مصطلحات موضوعية: Diffraction, Materials science, Reflection high-energy electron diffraction, business.industry, Mineralogy, Pole figure, Biochemistry, Crystal, Optics, Transmission electron microscopy, Texture (crystalline), business, Kikuchi line, Image resolution
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6
المؤلفون: D. Katzer, D. Gerth, R. A. Schwarzer
المصدر: Physica Status Solidi (a). 146:299-316
مصطلحات موضوعية: Stress (mechanics), Grain growth, Chemistry, Critical resolved shear stress, Metallurgy, Stress relaxation, Biaxial tensile test, Texture (crystalline), Dislocation, Composite material, Condensed Matter Physics, Kikuchi line, Electronic, Optical and Magnetic Materials
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7
المؤلفون: S. Zaefferer, R. A. Schwarzer
المصدر: Advances in X-ray Analysis. 38:377-381
مصطلحات موضوعية: Optics, Materials science, business.industry, Microscopy, Resolution (electron density), Line (geometry), General Medicine, Filter (signal processing), business, Translation (geometry), Sample (graphics), Beam (structure), Camera lens
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::bcacae79058bd303522b039081d7f1fb
https://doi.org/10.1154/s0376030800018012 -
8
المؤلفون: D. Gerth, R. A. Schwarzer
المصدر: Journal of Electronic Materials. 22:607-610
مصطلحات موضوعية: Materials science, Silicon, business.industry, chemistry.chemical_element, Substrate (electronics), Condensed Matter Physics, Thermal expansion, Electronic, Optical and Magnetic Materials, Stress (mechanics), Optics, chemistry, Materials Chemistry, Stress relaxation, Texture (crystalline), Electrical and Electronic Engineering, Composite material, business, Kikuchi line, Hillock
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9
المؤلفون: R. A. Schwarzer
المصدر: Textures and Microstructures. 14:241-244
مصطلحات موضوعية: Optics, Materials science, business.industry, X-ray, business, Texture mapping, Energy (signal processing)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0948f6aea028ad2a2300ed46a859e5c7
https://doi.org/10.1155/tsm.14-18.241 -
10
المؤلفون: R. A. Schwarzer
المصدر: Textures and Microstructures. 14:85-90
مصطلحات موضوعية: Materials science, Optics, Reflection high-energy electron diffraction, Electron diffraction, business.industry, Energy filtered transmission electron microscopy, Diffraction topography, Texture (crystalline), Selected area diffraction, business, Powder diffraction, Electron backscatter diffraction
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::89344ed6339ad9ed6e8f91e37cc99588
https://doi.org/10.1155/tsm.14-18.85