يعرض 1 - 10 نتائج من 311 نتيجة بحث عن '"R. Ananda"', وقت الاستعلام: 3.33s تنقيح النتائج
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    دورية أكاديمية
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    مؤتمر

    المؤلفون: Sathisha, T, Kumari, R Ananda

    المصدر: 2016 IEEE International Conference on Recent Trends in Electronics, Information & Communication Technology (RTEICT) Recent Trends in Electronics, Information & Communication Technology (RTEICT), IEEE International Conference on. :783-788 May, 2016

    Relation: 2016 IEEE International Conference on Recent Trends in Electronics, Information & Communication Technology (RTEICT)

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    مؤتمر

    المصدر: International Conference on Information Communication and Embedded Systems (ICICES2014) Information Communication and Embedded Systems (ICICES), 2014 International Conference on. :1-3 Feb, 2014

    Relation: 2014 International Conference on Information Communication and Embedded Systems (ICICES)

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    كتاب إلكتروني

    المؤلفون: S, AjayAff13, G, Satya Sai Krishna MohanAff13, Rao, Shashank SAff13, Shaunak, Sujay BAff13, H K, KrutthikaAff13, Y R, AnandaAff14, Jose, JohnAff14

    المساهمون: Barbosa, Simone Diniz Junqueira, Series EditorAff1, Filipe, Joaquim, Series EditorAff2, Kotenko, Igor, Series EditorAff3, Sivalingam, Krishna M., Series EditorAff4, Washio, Takashi, Series EditorAff5, Yuan, Junsong, Series EditorAff6, Zhou, Lizhu, Series EditorAff7, Ghosh, Ashish, Series EditorAff8, Rajaram, S., editorAff9, Balamurugan, N.B., editorAff10, Gracia Nirmala Rani, D., editorAff11, Singh, Virendra, editorAff12

    المصدر: VLSI Design and Test : 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers. 892:619-630

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    كتاب إلكتروني

    المساهمون: Barbosa, Simone Diniz Junqueira, Series EditorAff1, Filipe, Joaquim, Series EditorAff2, Kotenko, Igor, Series EditorAff3, Sivalingam, Krishna M., Series EditorAff4, Washio, Takashi, Series EditorAff5, Yuan, Junsong, Series EditorAff6, Zhou, Lizhu, Series EditorAff7, Ghosh, Ashish, Series EditorAff8, Rajaram, S., editorAff9, Balamurugan, N.B., editorAff10, Gracia Nirmala Rani, D., editorAff11, Singh, Virendra, editorAff12

    المصدر: VLSI Design and Test : 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers. 892:495-506

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