-
1
المؤلفون: E.-O. Andersen, K. van der Zanden, Y. Gong, L. Pescini, R. Allinger, R. Kakoschke, J.R. Power
المصدر: Solid-State Electronics. 52:550-556
مصطلحات موضوعية: Engineering, business.industry, Electrical engineering, High voltage, Integrated circuit, Dielectric, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, law.invention, Flash (photography), Reliability (semiconductor), law, Materials Chemistry, Optoelectronics, Erasure, Electrical and Electronic Engineering, business, High-κ dielectric, Voltage
-
2
المؤلفون: M. Bauer, Danny Pak-Chum Shum, Martin Stiftinger, Kyung Joon Han, Armin Tilke, Volker Hecht, N. Chan, L. Pescini, R. Kakoschke, Sung-Rae Kim
المصدر: IEEE Transactions on Electron Devices. 54:1681-1688
مصطلحات موضوعية: Engineering, business.industry, Electrical engineering, High voltage, Integrated circuit, Flash memory, Electronic, Optical and Magnetic Materials, law.invention, CMOS, law, Low-power electronics, Hardware_INTEGRATEDCIRCUITS, Miniaturization, Erasure, Electrical and Electronic Engineering, business, Leakage (electronics)
-
3
المؤلفون: Cory E. Weber, E. Ruderer, Knut Stahrenberg, Doris Schmitt-Landsiedel, Walter Hansch, A. Huber, R. Heinrich, U. Schaper, Georg Georgakos, U. Feldmann, S. Henzler, J. Einfeld, M. Fulde, Th. Nirschl, J. Sedlmeir, A. Bargagli-Stoffi, R. Kakoschke, R. Neubert, M. Sterkel, J. Fischer
المصدر: Solid-State Electronics. 50:44-51
مصطلحات موضوعية: Chemistry, Hardware_PERFORMANCEANDRELIABILITY, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, CMOS, MOSFET, Hardware_INTEGRATEDCIRCUITS, Materials Chemistry, Electronic engineering, Field-effect transistor, Signal integrity, Electrical and Electronic Engineering, Realization (systems), Scaling, Hardware_LOGICDESIGN, Voltage, Electronic circuit
-
4
المؤلفون: Eric-Roger Brücklmeier, R. Kakoschke, Herbert Palm, Andreas Kux
المصدر: Microelectronic Engineering. 48:411-414
مصطلحات موضوعية: Materials science, business.industry, Dielectric, Electron, Integrated circuit, Nitride, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Threshold voltage, law, Optoelectronics, Electrical and Electronic Engineering, business, Layer (electronics), Voltage, EEPROM
-
5
المؤلفون: R. Duschl, R. Allinger, G. Tempel, Robert Strenz, R. Sikorski, F. Erler, G. Jaschke, R. Kakoschke, D. Shum, A. Duch, M. Canning, J.R. Power, M. Stiftinger
المصدر: 2009 IEEE International Memory Workshop.
مصطلحات موضوعية: Atomic layer deposition, Reliability (semiconductor), Materials science, CMOS, business.industry, Electronic engineering, Optoelectronics, Degradation (geology), Dielectric, business, Layer (electronics), Aluminum oxide, Deposition temperature
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a3dce08f52f6e4b37f93f6d773b418a0
https://doi.org/10.1109/imw.2009.5090578 -
6
المؤلفون: Danny Pak-Chum Shum, R. Strenz, R. Kakoschke
المصدر: 2008 9th International Conference on Solid-State and Integrated-Circuit Technology.
مصطلحات موضوعية: Engineering, business.industry, Electrical engineering, Process (computing), Hardware_PERFORMANCEANDRELIABILITY, Integrated circuit design, Cell design, CMOS, Logic gate, Hardware_INTEGRATEDCIRCUITS, Node (circuits), business, Scaling, Quantum tunnelling
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ec8d1123ad5a222375eb073fd9da2a6d
https://doi.org/10.1109/icsict.2008.4734670 -
7
المؤلفون: J. R. Power, D. Shum, Y. Gong, S. Bogacz, J. Haeupel, H. Estel, R. Strenz, R. Kakoschke, K. van der Zanden, R. Allinger, G. Jaschke
المصدر: 2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design.
مصطلحات موضوعية: Flash (photography), chemistry.chemical_compound, Reliability (semiconductor), Materials science, Cellular array, chemistry, Electronic engineering, Oxide, Dielectric, Voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ab5caae74b8b452c6ac50be19954f317
https://doi.org/10.1109/nvsmw.2008.33 -
8
المؤلفون: P.F.H.M. van der Meulen, R. Kakoschke, J.F.M. Westendorp, R.E. Kaim
المصدر: IEEE Transactions on Electron Devices. 37:1052-1056
مصطلحات موضوعية: Materials science, Ion beam, business.industry, Doping, Analytical chemistry, Electronic, Optical and Magnetic Materials, Ion implantation, Transmission electron microscopy, Etching (microfabrication), Trench, Optoelectronics, Wafer, Electrical and Electronic Engineering, business, Beam (structure)
-
9
المؤلفون: R. Kakoschke, Rainer Kassing, S. Saler
المصدر: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 44:453-458
مصطلحات موضوعية: Nuclear and High Energy Physics, Materials science, Ion beam deposition, Reflection (mathematics), Ion implantation, Ion beam, Ion beam mixing, Doping, Atomic physics, Instrumentation, Amorphous solid
-
10
المؤلفون: K. van der Zanden, E.-O. Andersen, D. Shum, G. Tempel, W. Langheinrich, R. Allinger, R. Kakoschke, L. Pescini, Robert Strenz, J.R. Power, Y. Gong
المصدر: 2007 22nd IEEE Non-Volatile Semiconductor Memory Workshop.
مصطلحات موضوعية: chemistry.chemical_compound, Materials science, chemistry, business.industry, Electrical engineering, Oxide, Optoelectronics, Dielectric, bacterial infections and mycoses, business, Aluminum oxide, Voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::55119629c3cfa088996776219afad3cd
https://doi.org/10.1109/nvsmw.2007.4290567