يعرض 1 - 10 نتائج من 34 نتيجة بحث عن '"ROUSSY, Agnes"', وقت الاستعلام: 0.83s تنقيح النتائج
  1. 1
    مؤتمر
    Random Forest Based R2R Control: Application to Chemical Mechanical Planarization Process

    المؤلفون: Terras, Lucile, Alegret, Cyril, Pasqualini, Francois, Roussy, Agnes

    المصدر: 2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2023 34th Annual. :1-6 May, 2023

    Relation: 2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

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  2. 2
    مؤتمر
    On Updating a Virtual Metrology Model in Semiconductor Manufacturing via Transfer Learning

    المؤلفون: Clain, Rebecca, Azzizi, Ikram, Borodin, Valeria, Roussy, Agnes

    المصدر: 2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2022 33rd Annual. :1-6 May, 2022

    Relation: 2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

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  3. 3
    مؤتمر
    Feature Selection for Virtual Metrology Modeling: An application to Chemical Mechanical Polishing

    المؤلفون: Djedidi, Oussama, Clain, Rebecca, Borodin, Valeria, Roussy, Agnes

    المصدر: 2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2022 33rd Annual. :1-6 May, 2022

    Relation: 2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

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  4. 4
    مؤتمر
    Out-Of-Control Detection In Semiconductor Manufacturing using One-Class Support Vector Machines

    المؤلفون: Rabhi, Ilham, Roussy, Agnes, Pasqualini, Francois, Alegret, Cyril

    المصدر: 2021 IEEE 17th International Conference on Automation Science and Engineering (CASE) Automation Science and Engineering (CASE), 2021 IEEE 17th International Conference on. :1628-1633 Aug, 2021

    Relation: 2021 IEEE 17th International Conference on Automation Science and Engineering (CASE)

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  5. 5
    مؤتمر
    Virtual metrology for semiconductor manufacturing: Focus on transfer learning

    المؤلفون: Clain, Rebecca, Borodin, Valeria, Juge, Michel, Roussy, Agnes

    المصدر: 2021 IEEE 17th International Conference on Automation Science and Engineering (CASE) Automation Science and Engineering (CASE), 2021 IEEE 17th International Conference on. :1621-1626 Aug, 2021

    Relation: 2021 IEEE 17th International Conference on Automation Science and Engineering (CASE)

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  6. 6
    مؤتمر
    A hybrid feature selection approach for virtual metrology: Application to CMP process

    المؤلفون: KORABI, Taki Eddine, BORODIN, Valeria, JUGE, Michel, ROUSSY, Agnes

    المصدر: 2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) Advanced Semiconductor Manufacturing Conference (ASMC), 2021 32nd Annual SEMI. :1-5 May, 2021

    Relation: 2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

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  7. 7
    مؤتمر
    VIRTUAL METROLOGY MODELING BASED ON GAUSSIAN BAYESIAN NETWORK

    المؤلفون: Yang, Wei-Ting, Blue, Jakey, Roussy, Agnes, Reis, Marco S., Pinaton, Jacques

    المصدر: 2018 Winter Simulation Conference (WSC) Winter Simulation Conference (WSC), 2018. :3574-3582 Dec, 2018

    Relation: 2018 Winter Simulation Conference (WSC)

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  8. 8
    مؤتمر
    Advanced run-to-run controller in semiconductor manufacturing with real-time equipment condition: APC: Advanced process control; AM: Advanced metrology

    المؤلفون: Yang, Wei-Ting, Blue, Jakey, Roussy, Agnes, Reis, Marco, Pinaton, Jacques

    المصدر: 2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2018 29th Annual. :346-352 Apr, 2018

    Relation: 2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

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  9. 9
    مؤتمر
    Optimizing the Critical Dimension of the STI etch process by integrating inline scatterometry measurements and Feedback R2R control

    المؤلفون: Rizquez, Maria, Roussy, Agnes, Pompier, Dennis, Pinaton, Jacques, Pasquet, Julien

    المصدر: 2016 International Symposium on Semiconductor Manufacturing (ISSM) Semiconductor Manufacturing (ISSM), 2016 International Symposium on. :1-4 Dec, 2016

    Relation: 2016 International Symposium on Semiconductor Manufacturing (ISSM)

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  10. 10
    مؤتمر
    Run-to-Run sensor variation monitoring for process fault diagnosis in semiconductor manufacturing

    المؤلفون: Blue, Jakey, Roussy, Agnes, Pinaton, Jacques

    المصدر: 2016 Winter Simulation Conference (WSC) Winter Simulation Conference (WSC), 2016. :2523-2534 Dec, 2016

    Relation: 2016 Winter Simulation Conference (WSC)

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