يعرض 1 - 10 نتائج من 33 نتيجة بحث عن '"RTD sensor"', وقت الاستعلام: 1.05s تنقيح النتائج
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    مؤتمر

    المؤلفون: K, Elangovan, S., Anoop C.

    المصدر: 2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Instrumentation and Measurement Technology Conference (I2MTC), 2023 IEEE International. :1-5 May, 2023

    Relation: 2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

  2. 2
    مؤتمر

    المصدر: 2021 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT) Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT), 2021 IEEE International Workshop on. :469-472 Jun, 2021

    Relation: 2021 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT)

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    مؤتمر

    المصدر: 2019 1st International Conference on Electrical, Control and Instrumentation Engineering (ICECIE) Electrical, Control and Instrumentation Engineering (ICECIE), 2019 1st International Conference on. :1-7 Nov, 2019

    Relation: 2019 1st International Conference on Electrical, Control and Instrumentation Engineering (ICECIE)

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    كتاب إلكتروني

    المؤلفون: Kumar, AbhishekAff38, Garg, PeeyushAff38, Shankar, AjayAff38, Kar, NamrataAff38

    المساهمون: Angrisani, Leopoldo, Series EditorAff1, Arteaga, Marco, Series EditorAff2, Panigrahi, Bijaya Ketan, Series EditorAff3, Chakraborty, Samarjit, Series EditorAff4, Chen, Jiming, Series EditorAff5, Chen, Shanben, Series EditorAff6, Chen, Tan Kay, Series EditorAff7, Dillmann, Ruediger, Series EditorAff8, Duan, Haibin, Series EditorAff9, Ferrari, Gianluigi, Series EditorAff10, Ferre, Manuel, Series EditorAff11, Hirche, Sandra, Series EditorAff12, Jabbari, Faryar, Series EditorAff13, Jia, Limin, Series EditorAff14, Kacprzyk, Janusz, Series EditorAff15, Khamis, Alaa, Series EditorAff16, Kroeger, Torsten, Series EditorAff17, Liang, Qilian, Series EditorAff18, Ming, Tan Cher, Series EditorAff19, Minker, Wolfgang, Series EditorAff20, Misra, Pradeep, Series EditorAff21, Möller, Sebastian, Series EditorAff22, Mukhopadhyay, Subhas, Series EditorAff23, Ning, Cun-Zheng, Series EditorAff24, Nishida, Toyoaki, Series EditorAff25, Pascucci, Federica, Series EditorAff26, Qin, Yong, Series EditorAff27, Seng, Gan Woon, Series EditorAff28, Veiga, Germano, Series EditorAff29, Wu, Haitao, Series EditorAff30, Zhang, Junjie James, Series EditorAff31, Martin, Ferran, Series EditorAff32, Speidel, Joachim, Series EditorAff33, Bera, Rabindranath, editorAff34, Sarkar, Subir Kumar, editorAff35, Singh, Om Prakash, editorAff36, Saikia, Hemanta, editorAff37

    المصدر: Advances in Communication, Devices and Networking : Proceedings of ICCDN 2018. 537:453-460

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    دورية أكاديمية

    المؤلفون: Kim, Youngmin, Choi, Yong, Kang, Shinill

    المصدر: Microsystem Technologies: MEMS, Systems for Information Processing and Storage. July 2005 11(7):464-469

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    مؤتمر

    لا يتم عرض هذه النتيجة على الضيوف.

  10. 10
    دورية أكاديمية

    لا يتم عرض هذه النتيجة على الضيوف.