المؤلفون: Zanotti, T., Ranjan, A., O'Shea, S.J., Raghavan, N., Thamankar, R., Leong Pey, K., Maria Puglisi, F.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 24(2):184-193 Jun, 2024

المؤلفون: Lin, Xi-Wei, Amoroso, Salvatore Maria, Lee, Ko-Hsin, Ke, Meng Hsuan, Gunst, Tue, Tikhomirov, Pavel, Asenov, Plamen

المصدر: 2024 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2024 IEEE International. :1-4 May, 2024

Relation: 2024 IEEE International Memory Workshop (IMW)

المؤلفون: Xu, Chao, Wang, Jessie Hui, Xie, Shilin, Wang, Jilong

المصدر: 2024 IEEE Wireless Communications and Networking Conference (WCNC) Wireless Communications and Networking Conference (WCNC), 2024 IEEE. :1-6 Apr, 2024

Relation: 2024 IEEE Wireless Communications and Networking Conference (WCNC)

المؤلفون: Mizutani, Tomoko, Takeuchi, Kiyoshi, Saraya, Takuya, Oka, Hiroshi, Mori, Takahiro, Kobayashi, Masaharu, Hiramoro, Toshiro

المصدر: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2024 IEEE 36th International Conference on. :1-5 Apr, 2024

Relation: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS)

المؤلفون: Kim, J., Loveless, T. D., Pew, J., Young, R., Rcising, D., Nour, M., Manos, P., Chambers, M., Barnaby, H. J., Neucndank, J.

المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-6 Apr, 2024

Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Hu, Ruofei, Tang, Jianshi, Xi, Yue, Jiang, Zhixing, Lu, Yuyao, Ma, Chengxiang, Li, Junchen, Gao, Bin, Qian, He, Wu, Huaqiang

المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-6 Apr, 2024

Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Zhang, F., Yang, H., Zhang, Q., Peng, Y., Duan, J., Xu, H., Huo, J., Wang, X., Xu, G., Zhang, Z., Wu, Z., Han, G., Yin, H., Liu, Y.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 45(4):566-569 Apr, 2024

المؤلفون: Zanotti, Tommaso, Ranjan, Alok, O'Shea, Sean J., Raghavan, Nagarajan, Thamankar, Ramesh, Pey, Kin Leong, Maria Puglisi, Francesco

المصدر: 2023 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2023 IEEE International. :1-6 Oct, 2023

Relation: 2023 IEEE International Integrated Reliability Workshop (IIRW)

المؤلفون: Neuendank, Jereme, Al Mamun, Fahad, Barnaby, Hugh, Bonaldo, Stefano, Spear, Matthew, Wallace, Trace, Loveless, Daniel, Pew, Jacob, Nour, Mohamed, Manos, Pete, Giorno, Zach, Suriono, Usman, Chambers, Mike, Kosier, Steve

المصدر: 2023 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2023 IEEE International. :1-5 Oct, 2023

Relation: 2023 IEEE International Integrated Reliability Workshop (IIRW)

المؤلفون: Li, Xinze, Wu, Yuxuan, Teng, Qiao, Sun, Ying, Gong, Xiao, Besnard, Guillaume, Maleville, Christophe, Weber, Olivier, Zhang, Rui, Chen, Bing, Gao, Dawei, Cheng, Ran

المصدر: 2023 International Conference on IC Design and Technology (ICICDT) IC Design and Technology (ICICDT), 2023 International Conference on. :116-119 Sep, 2023

Relation: 2023 International Conference on IC Design and Technology (ICICDT)