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1دورية أكاديمية
المؤلفون: Joao Roberto Raposo De Oliveira Martins, Ali Mostafa, Jerome Juillard, Rachid Hamani, Francisco De Oliveira Alves, Pietro Maris Ferreira
المصدر: IEEE Open Journal of Circuits and Systems, Vol 2, Pp 311-322 (2021)
مصطلحات موضوعية: Temperature-aware, gm/Id, SOI, harsh-evironements, smart-vehicles, Electric apparatus and materials. Electric circuits. Electric networks, TK452-454.4
وصف الملف: electronic resource
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المؤلفون: Rachid Hamani, Joao Roberto Raposo De Oliveira Martins, Pietro Maris Ferreira, Francisco Alves, Ali Mostafa, Jerome Juillard
المصدر: IEEE Open Journal of Circuits and Systems. 2:311-322
مصطلحات موضوعية: Temperature sensitivity, Scattering, Computer science, law, Circuit design, Transistor, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Silicon on insulator, Hardware_PERFORMANCEANDRELIABILITY, Temperature measurement, law.invention, Electronic circuit
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6c24b19066826133c1013622c3bddcf4
https://doi.org/10.1109/ojcas.2021.3067377
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المؤلفون: Joao Roberto Raposo De Oliveira Martins, Ali Mostafa, Jerome Juillard, Rachid Hamani, Francisco De Oliveira Alves, Pietro Maris Ferreira
المصدر: IEEE Open Journal of Circuits and Systems, Vol 2, Pp 311-322 (2021)
مصطلحات موضوعية: gm/Id, SOI, harsh-evironements, smart-vehicles, lcsh:Electric apparatus and materials. Electric circuits. Electric networks, Hardware_INTEGRATEDCIRCUITS, Hardware_PERFORMANCEANDRELIABILITY, lcsh:TK452-454.4, Temperature-aware
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doajarticles::589722ded9acea1532226082311a8b15
https://ieeexplore.ieee.org/document/9382014/
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المؤلفون: Bernard Jarry, Rachid Hamani, Mien Lintignat, Cristian Andrei
المساهمون: Systèmes RF (XLIM-SRF), XLIM (XLIM), Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS), NXP Semiconductors
المصدر: ICECS
Electronics, Circuits and Systems (ICECS), 2014 21st IEEE International Conference on
Electronics, Circuits and Systems (ICECS), 2014 21st IEEE International Conference on, 2014, Unknown, Unknown Region. pp.351-354, ⟨10.1109/ICECS.2014.7049994⟩مصطلحات موضوعية: Integrated circuit interconnections, Engineering, Circuit design, output impedance, Impedance matching, 02 engineering and technology, Integrated circuit design, low noise amplifiers, BiCMOS, Transistors, Noise figure, frequency 24 GHz, Low noise amplifier, integrated circuit design, NXP semiconductors, Microwave band, Frequency measurement, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Inductors, Output impedance, S-parameters, size 0.25 mum, ComputingMilieux_MISCELLANEOUS, amplifier circuit demonstrator, Semiconductor device measurement, business.industry, Amplifier, matching networks, 020208 electrical & electronic engineering, Electrical engineering, BiCMOS analogue integrated circuits, 020206 networking & telecommunications, Low-noise amplifier, performance evaluation, [SPI.TRON]Engineering Sciences [physics]/Electronics, LNA circuit design, interconnect line parasitics, Integrated circuit modeling, bipolar MMIC, circuit simulation, Octagonal inductors, input impedance, BiCMOS mature technology, business, schematic circuit simulations, Interconnect lines
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d4583095bcf9ca657bcbca1bd42590bc
https://doi.org/10.1109/icecs.2014.7049994 -
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المؤلفون: Rachid Hamani, Julien Lintignat, Cristian Andrei, Bernard Jarry
المساهمون: Systèmes RF (XLIM-SRF), XLIM (XLIM), Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS)
المصدر: Microelectronic Test Structures (ICMTS), 2014 International Conference on
Microelectronic Test Structures (ICMTS), 2014 International Conference on, 2014, Unknown, Unknown Region. pp.146--149مصطلحات موضوعية: Engineering, business.industry, 020208 electrical & electronic engineering, Bipolar junction transistor, Transistor, 020206 networking & telecommunications, 02 engineering and technology, BiCMOS, Signal, law.invention, [SPI.TRON]Engineering Sciences [physics]/Electronics, Semiconductor, Transmission (telecommunications), law, Extremely high frequency, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Equivalent circuit, business, ComputingMilieux_MISCELLANEOUS
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3e8e385e3f4dd849404877356c4bf7be
https://hal.archives-ouvertes.fr/hal-01293934 -
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المؤلفون: Romain Gwoziecki, Philippe Pannier, Rachid Hamani, Romain Coppard, Anis Daami, Emmanuel Bergeret, M. Guerin, Stephanie Jacob
المساهمون: Aix Marseille Université (AMU), Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS)-Aix Marseille Université (AMU), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS)
المصدر: SPIE Photonic Devices + Applications
SPIE Photonic Devices + Applications, 2011, San Diego, France. pp.81170Q, ⟨10.1117/12.892709⟩مصطلحات موضوعية: 010302 applied physics, Digital electronics, Engineering, Analogue electronics, business.industry, Electrical engineering, Hardware_PERFORMANCEANDRELIABILITY, 01 natural sciences, Behavioral modeling, [SPI]Engineering Sciences [physics], Current mirror, CMOS, Thin-film transistor, 0103 physical sciences, Electronic engineering, Device simulation, business, ComputingMilieux_MISCELLANEOUS, Electronic circuit
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::51010f1228606b49a498acfcfc7533ac
https://doi.org/10.1117/12.892709
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