المؤلفون: Bao, R., Qin, L., Frougier, J., Suk, S., Rabie, M., Bajpai, U., Chou, A., Nechay, B., Mohamed, M., Pujari, R., Weir, T. J, Harmon, K., Varma, A., Armstrong-Moore, W., Cestero, A., Emans, S., Hundekar, P., Joshi, R., Li, J., Liu, X., Lucarini, S., Radens, C., Siddiqui, S., Trombley, H., Bryant, A., Hasanuzzaman, M., Majumdar, A., Sung, M., Zhang, J., Leobandung, E.

المصدر: 2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023

Relation: 2023 International Electron Devices Meeting (IEDM)

المؤلفون: Mann, R.W., Zhao, M., Parihar, S., Gao, Q., Arya, A., Radens, C., Pandey, S.M., Versaggi, J., Higman, J.M., Carter, R.

المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 27(8):1819-1827 Aug, 2019

المؤلفون: Narasimha, S., Jagannathan, B., Ogino, A., Jaeger, D., Greene, B., Sheraw, C., Zhao, K., Haran, B., Kwon, U., Mahalingam, A. K. M., Kannan, B., Morganfeld, B., Dechene, J., Radens, C., Tessier, A., Hassan, A., Narisetty, H., Ahsan, I., Aminpur, M., An, C., Aquilino, M., Arya, A., Augur, R., Baliga, N., Bhelkar, R., Biery, G., Blauberg, A., Borjemscaia, N., Bryant, A., Cao, L., Chauhan, V., Chen, M., Cheng, L., Choo, J., Christiansen, C., Chu, T., Cohen, B., Coleman, R., Conklin, D., Crown, S., da Silva, A., Dechene, D., Derderian, G., Deshpande, S., Dilliway, G., Donegan, K., Eller, M., Fan, Y., Fang, Q., Gassaria, A., Gauthier, R., Ghosh, S., Gifford, G., Gordon, T., Gribelyuk, M., Han, G., Han, J.H., Han, K., Hasan, M., Higman, J., Holt, J., Hu, L., Huang, L., Huang, C., Hung, T., Jin, Y., Johnson, J., Johnson, S., Joshi, V., Joshi, M., Justison, P., Kalaga, S., Kim, T., Kim, W., Krishnan, R., Krishnan, B., Anil, K., Kumar, M., Lee, J., Lee, R., Lemon, J., Liew, S.L., Lindo, P., Lingalugari, M., Lipinski, M., Liu, P., Liu, J., Lucarini, S., Ma, W., Maciejewski, E., Madisetti, S., Malinowski, A., Mehta, J., Meng, C., Mitra, S., Montgomery, C., Nayfeh, H., Nigam, T., Northrop, G., Onishi, K., Ordonio, C., Ozbek, M., Pal, R., Parihar, S., Patterson, O., Ramanathan, E., Ramirez, I., Ranjan, R., Sarad, J., Sardesai, V., Saudari, S., Schiller, C., Senapati, B., Serrau, C., Shah, N., Shen, T., Sheng, H., Shepard, J., Shi, Y., Silvestre, M.C., Singh, D., Song, Z., Sporre, J., Srinivasan, P., Sun, Z., Sutton, A., Sweeney, R., Tabakman, K., Tan, M., Wang, X., Woodard, E., Xu, G., Xu, D., Xuan, T., Yan, Y., Yang, J., Yeap, K.B., Yu, M., Zainuddin, A., Zeng, J., Zhang, K., Zhao, M., Zhong, Y., Carter, R., Lin, C.-H., Grunow, S., Child, C., Lagus, M., Fox, R., Kaste, E., Gomba, G., Samavedam, S., Agnello, P., Sohn, D. K.

المصدر: 2017 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2017 IEEE International. :29.5.1-29.5.4 Dec, 2017

Relation: 2017 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Bhavnagarwala, A., Kosonocky, S., Radens, C., Stawiasz, K., Mann, R., Qiuyi Ye, Chin, K.

المصدر: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :659-662 2005

Relation: International Electron Devices Meeting 2005

المؤلفون: Wu, E.Y., Vollertsen, R.-P., Jarnmy, R., Strong, A., Radens, C.

المصدر: 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) Reliability physics symposium Reliability Physics Symposium Proceedings, 2002. 40th Annual. :255-267 2002

Relation: 2002 IEEE International Reliability Physics Symposium Proceedings. 40th Annual

المؤلفون: Bukofsky, S., Mandelman, J., Thomas, A., Radens, C., Kunkel, G.

المصدر: 2001 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers (Cat. No.01TH8517) VLSI technology, systems, and applications VLSI Technology, Systems, and Applications, 2001. Proceedings of Technical Papers. 2001 International Symposium on. :97-100 2001

Relation: 2001 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers

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المؤلفون: Lee, K., Lee, B., Hoepner, J., Economikos, L., Parks, C., Radens, C., Bernstein, J., Kellerman, P.

المصدر: 2000 International Conference on Ion Implantation Technology Proceedings. Ion Implantation Technology - 2000 (Cat. No.00EX432) Ion implantation technology Ion Implantation Technology, 2000. Conference on. :460-463 2000

Relation: 2000 International Conference on Ion Implantation Technology Proceedings. Ion Implantation Technology - 2000

المؤلفون: Bhavnagarwala, A. J., Kosonocky, S., Radens, C., Chan, Y., Stawiasz, K., Srinivasan, U., Kowalczyk, S. P., Ziegler, M. M.

المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 43(4):946-955 Apr, 2008

المؤلفون: Wu, E., Hwang, C., Vollertsen, R., Shen, H., Kleinhenz, R., Radens, C., Strong, A.

المصدر: International Electron Devices Meeting. IEDM Technical Digest Electron Devices Electron Devices Meeting, 1997. IEDM '97. Technical Digest., International. :77-80 1997

Relation: International Electron Devices Meeting. IEDM Technical Digest