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المؤلفون: Neal R. Mielke, S. Jacobs, Stefan Stadler, Ramez Nachman, Yung-Huei Lee
المصدر: Microelectronics Reliability. 45:107-114
مصطلحات موضوعية: Production testing, Engineering, business.industry, Hardware_PERFORMANCEANDRELIABILITY, Condensed Matter Physics, Circuit reliability, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Reliability engineering, Reliability (semiconductor), Logic gate, Burn-in, Hardware_INTEGRATEDCIRCUITS, Process optimization, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business, Device degradation, Degradation (telecommunications)
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المؤلفون: Sriram Madhavan, Philippe Hurat, Piyush Pathak, Rasit O. Topaloglu, Jac Condella, Ramez Nachman, Luigi Capodieci
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Standard cell, Stress (mechanics), Computer science, law, Real-time computing, Transistor, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Process (computing), Integrated circuit design, Lithography, law.invention
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0e3e8ae1371faff89cefb630e353d6c5
https://doi.org/10.1117/12.882508 -
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