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المؤلفون: Ray Conley, Juan Zhou, Xiaojing Huang, Nathalie Bouet, Yong S. Chu, Hanfei Yan, Albert T. Macrander, Evgeny Nazaretski, Jörg Maser
المصدر: Journal of Nanoscience and Nanotechnology. 19:575-584
مصطلحات موضوعية: Materials science, Aperture, business.industry, Biomedical Engineering, X-ray, X-ray optics, Synchrotron radiation, Bioengineering, 02 engineering and technology, General Chemistry, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Aspect ratio (image), law.invention, Lens (optics), Optics, law, Deposition (phase transition), General Materials Science, 0210 nano-technology, business, Lithography
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::eea6ae0ae1516abf494374b0a8691790
https://doi.org/10.1166/jnn.2019.16479 -
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المؤلفون: Gerry Lambe, Shamez N Ladhani, Emily Martyn, Ray Conley, Mariyam Mirfenderesky, Patricia Ighomereho, Eliza Gil, Janet Saldiray, Heather Whitaker
المصدر: The Journal of Infection
مصطلحات موضوعية: Microbiology (medical), 2019-20 coronavirus outbreak, Cross-sectional study, Severe acute respiratory syndrome coronavirus 2 (SARS-CoV-2), Health Personnel, General Practice, Ethnic group, serology, Article, Serology, Seroepidemiologic Studies, Environmental health, health services administration, Health care, London, Ethnicity, Medicine, Seroprevalence, Humans, Healthcare workers, Mortality, Letter to the Editor, health care economics and organizations, Minority Groups, business.industry, SARS-CoV-2, Medical record systems, computerized, Hospitals, Infectious Diseases, Cross-Sectional Studies, Ethnic Minorities, business, Covid-19, Sentinel Surveillance
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المؤلفون: Ik-Jae Lee, Nark-Eon Sung, Ray Conley, Keun Hwa Chae
المصدر: Thin Solid Films. 548:385-388
مصطلحات موضوعية: Materials science, Band gap, Metals and Alloys, Analytical chemistry, Surfaces and Interfaces, Substrate (electronics), Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Amorphous solid, Sputtering, Transmission electron microscopy, Electrical resistivity and conductivity, Phase (matter), Materials Chemistry, Thin film
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المؤلفون: Ray Conley, Shinan Qian, Konstantine Kaznatcheev, Mourad Idir
المصدر: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 710:17-23
مصطلحات موضوعية: Physics, Figuring, Nuclear and High Energy Physics, business.industry, Instrumentation, Polishing, Metrology, Image stitching, Interferometry, Optics, Beamline, Radiometry, business
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المؤلفون: Ray Conley, Christoph Rau, Hanfei Yan, Sebastian Kalbfleisch, Xiaojing Huang, Ian K. Robinson, Evgeny Nazaretski, Li Li, Yong S. Chu, Mohammed Yusuf, Nathalie Bouet, Ulrich Wagner, Juan Zhou, Kenneth Lauer
المصدر: Scientific Reports
مصطلحات موضوعية: 0301 basic medicine, Fluorescence-lifetime imaging microscopy, Materials science, Microscope, 02 engineering and technology, Multimodal Imaging, Chromosomes, Article, Cell Line, law.invention, 03 medical and health sciences, Optics, law, Microscopy, Humans, Nanotechnology, Nanoscopic scale, Image resolution, Platinum, Multimodal imaging, Elemental composition, Multidisciplinary, Staining and Labeling, business.industry, X-ray, 021001 nanoscience & nanotechnology, 030104 developmental biology, Microscopy, Electron, Scanning, Biophysics, 0210 nano-technology, business
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المؤلفون: Sanjit Ghose, John Sinsheimer, Eric Dooryhee, Nathalie Bouet, Ray Conley
المصدر: Journal of synchrotron radiation. 23(Pt 6)
مصطلحات موضوعية: Diffraction, Nuclear and High Energy Physics, Radiation, Materials science, business.industry, 02 engineering and technology, Conical surface, 010402 general chemistry, 021001 nanoscience & nanotechnology, 01 natural sciences, 0104 chemical sciences, Ray tracing (physics), National Synchrotron Light Source, Optics, Beamline, X-ray crystallography, National Synchrotron Light Source II, 0210 nano-technology, business, Instrumentation, Powder diffraction
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7669b4f84c00d38ffdf6f8d9afca6bcb
https://pubmed.ncbi.nlm.nih.gov/27787235 -
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المؤلفون: Ken Lauer, Konstantine Kaznatcheev, Nathalie Bouet, Matthew Vescovi, Richard E. Nethery, Lei Huang, Lin Zhou, Kent Rennie, James R. Kahn, Mourad Idir, Ray Conley
المصدر: The Review of scientific instruments. 86(10)
مصطلحات موضوعية: Figuring, Fabrication, Materials science, Ion beam, business.industry, X-ray optics, Polishing, Sputter deposition, Optics, Physics::Plasma Physics, Sputtering, Radio frequency, business, Instrumentation
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المؤلفون: Hanfei Yan, Chian Liu, Hyon Chol Kang, Jörg Maser, Ray Conley, G. Brian Stephenson, Albert T. Macrander
المصدر: X-Ray Optics and Instrumentation. 2010:1-10
مصطلحات موضوعية: Diffraction, Fabrication, Materials science, Microscope, business.industry, Resolution (electron density), Atomic and Molecular Physics, and Optics, Numerical aperture, law.invention, Lens (optics), Optics, law, Thin film, business, Focus (optics), Instrumentation
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المؤلفون: David L. Windt, Ray Conley
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Materials science, Aperture, business.industry, Shell (structure), Linear stage, Substrate (electronics), Cathode, law.invention, Metrology, Optics, law, Surface metrology, Deposition (phase transition), business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::73ffef276c60e716dc8449ba32f6fff1
https://doi.org/10.1117/12.2188135 -
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المؤلفون: SonBinh T. Nguyen, Chian Liu, Ray Conley, Joseph A. Libera, Joseph T. Hupp, Michael J. Bedzyk, Richard W. Gurney
المصدر: Langmuir. 20:8022-8029
مصطلحات موضوعية: Silicon, Materials science, Surface Properties, Analytical chemistry, Sensitivity and Specificity, Organophosphorus Compounds, X-Ray Diffraction, Total external reflection, Monolayer, Organometallic Compounds, Transition Elements, Electrochemistry, Nanotechnology, General Materials Science, Specular reflection, Thin film, Spectroscopy, Molybdenum, Aqueous solution, Molecular Structure, Layer by layer, Spectrometry, X-Ray Emission, Bragg's law, Membranes, Artificial, Surfaces and Interfaces, Condensed Matter Physics, Nanostructures, X-ray reflectivity, Crystallography