المؤلفون: Sree, Talari Navya, Kalyan, Reddy Venkat, Azam Khan, Pathan Faizaan, V, Deepak

المصدر: 2024 2nd International Conference on Intelligent Data Communication Technologies and Internet of Things (IDCIoT) Intelligent Data Communication Technologies and Internet of Things (IDCIoT), 2024 2nd International Conference on. :1023-1032 Jan, 2024

Relation: 2024 2nd International Conference on Intelligent Data Communication Technologies and Internet of Things (IDCIoT)

المؤلفون: Chattopadhyay, Gopinath, Menta Venkata, Hari Krishna, Oseni, Taiwo, Reddy, Venkat, Singh, Amar, Kandra, Harpreet

المصدر: 2022 International Conference on Maintenance and Intelligent Asset Management (ICMIAM) Maintenance and Intelligent Asset Management (ICMIAM), 2022 International Conference on. :1-6 Dec, 2022

Relation: 2022 International Conference on Maintenance and Intelligent Asset Management (ICMIAM)

المؤلفون: Truong-Ba, Huy, Rebello, Sinda, Cholette, Michael E., Reddy, Venkat, Borghesani, Pietro

مصطلحات موضوعية: Statistics - Applications

URL الوصول: http://arxiv.org/abs/2308.14240

المؤلفون: Mohammed, Hani, Reddy, Venkat Himavanth, Kandaswamy, Subu

المصدر: 2020 IEEE 32nd International Conference on Tools with Artificial Intelligence (ICTAI) ICTAI Tools with Artificial Intelligence (ICTAI), 2020 IEEE 32nd International Conference on. :905-910 Nov, 2020

Relation: 2020 IEEE 32nd International Conference on Tools with Artificial Intelligence (ICTAI)

المؤلفون: Zhu, Huan, Jiang, Jiao, Yang, Ming, Zhao, Mingming, He, Zhenghao, Tang, Congli, Song, Cailing, Zhao, Ming, Akbar, Arne N., Reddy, Venkat, Pan, Wenjing, Li, Song, Tan, Yixin, Wu, Haijing, Lu, Qianjin

المصدر: In Journal of Dermatological Science August 2024 115(2):54-63

المؤلفون: Datla Jagannadha, Pavan Kumar, Yilmaz, Mahmut, Sonawane, Milind, Chadalavada, Sailendra, Sarangi, Shantanu, Bhaskaran, Bonita, Bajpai, Shashank, Reddy, Venkat Abilash, Pandey, Jayesh, Jiang, Sam

المصدر: 2019 IEEE 37th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2019 IEEE 37th. :1-8 Apr, 2019

Relation: 2019 IEEE 37th VLSI Test Symposium (VTS)

المؤلفون: Male, Ian, Farr, William, Allard, Amanda, Grahame, Victoria, Maxwell, Jess, Reddy, Venkat, McGrevey, Sophie, Abrahamson, Vanessa, Wigham, Sarah, Parr, Jeremy R.

المصدر: In Paediatrics and Child Health September 2023 33(9):277-284

المؤلفون: Rebello, Sinda^Aff15, Cholette, Michael E.^Aff15, Truong-Ba, Huy^Aff15, Reddy, Venkat^Aff16, Rosser, Alan^Aff16, Watkin, Tina^Aff16

المساهمون: Cavas-Martínez, Francisco, Series Editor^Aff1, Chaari, Fakher, Series Editor^Aff2, di Mare, Francesca, Series Editor^Aff3, Gherardini, Francesco, Series Editor^Aff4, Haddar, Mohamed, Series Editor^Aff5, Ivanov, Vitalii, Series Editor^Aff6, Kwon, Young W., Series Editor^Aff7, Trojanowska, Justyna, Series Editor^Aff8, Pinto, João Onofre Pereira, editor^Aff9, Kimpara, Marcio Luiz Magri, editor^Aff10, Reis, Renata Rezende, editor^Aff11, Seecharan, Turuna, editor^Aff12, Upadhyaya, Belle R., editor^Aff13, Amadi-Echendu, Joe, editor^Aff14

المصدر: 15th WCEAM Proceedings. :422-432

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