المؤلفون: La Grappe, Alexandre, Visker, Evert, Redolfi, Augusto, Peng, Lan, Muga, Karthik, Huls, David, Vanhaelemeersch, Serge, Lauwers, Anne, Ackaert, Jan

المصدر: 2021 IEEE 71st Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2021 IEEE 71st. :793-796 Jun, 2021

Relation: 2021 IEEE 71st Electronic Components and Technology Conference (ECTC)

المؤلفون: Barci, Marinela, Fantini, Andrea, Redolfi, Augusto, Kundu, Shreya, Belmonte, Attilio, Devulder, Wouter, Opsomer, Karl, Delhougne, Romain, Goux, Ludovic, Sankar Kar, Gouri, Witters, Thomas

المصدر: 2018 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2018 IEEE International. :1-4 May, 2018

Relation: 2018 IEEE International Memory Workshop (IMW)

المؤلفون: Radhakrishnan, Janaki, Belmonte, Attilio, Witters, Thomas, Clima, Sergiu, Redolfi, Augusto, Kar, Gouri Sankar, Houssa, Michel, Goux, Ludovic

المصدر: 2018 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2018 IEEE International. :1-4 May, 2018

Relation: 2018 IEEE International Memory Workshop (IMW)

المؤلفون: Belmonte, Attilio, Goux, Ludovic, Woo, Jiyong, Celano, Umberto, Redolfi, Augusto, Clima, Sergiu, Kar, Gouri Sankar

المصدر: 2017 17th Non-Volatile Memory Technology Symposium (NVMTS) Non-Volatile Memory Technology Symposium (NVMTS), 2017 17th. :1-5 Aug, 2017

Relation: 2017 17th Non-Volatile Memory Technology Symposium (NVMTS)

المؤلفون: Belmonte, Attilio, Fantini, Andrea, Degraeve, Robin, Celano, Umberto, Vandervorst, Wilfried, Redolfi, Augusto, Houssa, Michel, Jurczak, Malgorzata, Goux, Ludovic

المصدر: 2015 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2015 IEEE International. :1-4 May, 2015

Relation: 2015 IEEE International Memory Workshop (IMW)

المؤلفون: Civale, Yann, Van Huylenbroeck, Stefaan, Redolfi, Augusto, Guo, Wei, Gavan, Khashayar Babaei, Jaenen, Patrick, Manna, Antonio La, Beyer, Gerald, Swinnen, Bart, Beyne, Eric

المصدر: 2013 IEEE 63rd Electronic Components and Technology Conference Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd. :1420-1424 May, 2013

Relation: 2013 IEEE 63rd Electronic Components and Technology Conference (ECTC)

المؤلفون: Civale, Yann, Redolfi, Augusto, Jaenen, Patrick, Kostermans, Maarten, Van Besien, Els, Mertens, Sofie, Witters, Thomas, Jourdan, Nicolas, Armini, Silvia, El-Mekki, Zaid, Vandersmissen, Kevin, Philipsen, Harold, Verdonck, Patrick, Heylen, Nancy, Nolmans, Philip, Yunlong Li, Croes, Kristof, Beyer, Gerald, Swinnen, Bart, Beyne, Eric

المصدر: 2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT) Electronic Manufacturing Technology Symposium (IEMT), 2012 35th IEEE/CPMT International. :1-5 Nov, 2012

Relation: 2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT)

المؤلفون: Civale, Yann, Redolfi, Augusto, Velenis, Dimitrios, Heylen, Nancy, Beynet, Julien, Jung, InSoo, Woo, Jeong-Jun, Swinnen, Bart, Beyer, Gerald, Beyne, Eric

المصدر: 2012 4th Electronic System-Integration Technology Conference Electronic System-Integration Technology Conference (ESTC), 2012 4th. :1-4 Sep, 2012

Relation: 2012 4th Electronic System-Integration Technology Conference (ESTC)

المؤلفون: Croes, Kristof, Cherman, Vladimir O., Li, Yunlong, Zhao, Larry, Barbarin, Yohan, De Messemaeker, Joke, Civale, Yann, Velenis, Dimitrios, Stucchi, Michele, Kauerauf, Thomas, Redolfi, Augusto, Dimcic, Biljana, Ivankovic, Andrej, Van der Plas, Geert, De Wolf, Ingrid, Beyer, Gerald, Swinnen, Bart, Tokei, Zsolt, Beyne, Eric

المصدر: 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits (IPFA), 2012 19th IEEE International Symposium on the. :1-5 Jul, 2012

Relation: 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012)

المؤلفون: Civale, Yann, Armini, Silvia, Philipsen, Harold, Redolfi, Augusto, Velenis, Dimitrios, Croes, Kristof, Heylen, Nancy, El-Mekki, Zaid, Vandersmissen, Kevin, Beyer, Gerald, Swinnen, Bart, Beyne, Eric

المصدر: 2012 IEEE 62nd Electronic Components and Technology Conference Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd. :822-826 May, 2012

Relation: 2012 IEEE 62nd Electronic Components and Technology Conference (ECTC)