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1
المؤلفون: Nadim F. Haddad, Robert A. Reed, Bin Li, Robert A. Weller, Andrew T. Kelly, Marcus H. Mendenhall, John C. Rodgers, Jason F. Ross, Reed K. Lawrence, Kevin M. Warren
المصدر: IEEE Transactions on Nuclear Science. 58:975-980
مصطلحات موضوعية: Nuclear and High Energy Physics, Hardware_MEMORYSTRUCTURES, Materials science, Sram cell, Hardware_PERFORMANCEANDRELIABILITY, Upset, law.invention, Capacitor, Nuclear Energy and Engineering, CMOS, law, Single event upset, Electronic engineering, Static random-access memory, Electrical and Electronic Engineering, Resistor, Radiation hardening
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2
المؤلفون: Jason F. Ross, Jeffery A. Zimmerman, Reed K. Lawrence
المصدر: IEEE Transactions on Nuclear Science. 57:1849-1855
مصطلحات موضوعية: Nuclear and High Energy Physics, Materials science, Dielectric strength, business.industry, Electrical engineering, Oxide, Focused ion beam, law.invention, chemistry.chemical_compound, Capacitor, Nuclear Energy and Engineering, CMOS, chemistry, Single event upset, law, Trench, Optoelectronics, Electrical and Electronic Engineering, business, Leakage (electronics)
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3
المؤلفون: D. Patel, S. Doyle, Ernesto Chan, Andrew T. Kelly, Nadim F. Haddad, D. Lawson, Reed K. Lawrence, Jason F. Ross
المصدر: IEEE Transactions on Nuclear Science. 56:2077-2082
مصطلحات موضوعية: Nuclear and High Energy Physics, Materials science, business.industry, Transistor, Hardware_PERFORMANCEANDRELIABILITY, Radiation, Engineering physics, law.invention, Nuclear Energy and Engineering, CMOS, Nanoelectronics, law, Single event upset, Absorbed dose, Low-power electronics, Optoelectronics, Electrical and Electronic Engineering, business, Radiation hardening
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4
المؤلفون: Reed K. Lawrence, Andrew T. Kelly
المصدر: IEEE Transactions on Nuclear Science. 55:3367-3374
مصطلحات موضوعية: Nuclear and High Energy Physics, Materials science, Proton, business.industry, Linear energy transfer, Charge sharing, Nuclear Energy and Engineering, CMOS, Single event upset, Electronic engineering, Optoelectronics, Node (circuits), Static random-access memory, Electrical and Electronic Engineering, business, Low voltage
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5
المؤلفون: R. Conde, Robert A. Weller, J.H. Bowman, Brian D. Sierawski, Nadim F. Haddad, Robert A. Reed, Jean-Marie Lauenstein, J.A. Felix, Marcus H. Mendenhall, Reed K. Lawrence, Kevin M. Warren, J.R. Schwank, Lloyd W. Massengill, Paul E. Dodd, Jonathan A. Pellish, Marty R. Shaneyfelt, Ronald D. Schrimpf
المصدر: IEEE Transactions on Nuclear Science. 54:2312-2321
مصطلحات موضوعية: Nuclear reaction, Physics, Nuclear and High Energy Physics, Nuclear Energy and Engineering, Monte Carlo method, Statistical physics, Electrical and Electronic Engineering, Radiation, Ion energy, Event (particle physics)
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6
المؤلفون: Leonard R. Rockett, Monir El-Diwany, Tuyet Bach, Paul W. Marshall, Cheryl J. Marshall, B.M. Haugerud, Reed K. Lawrence, Courtney Mitchell, Akil K. Sutton, John D. Cressler, J.P. Comeau, A. P. Gnana Prakash, Ray Ladbury, Nadim F. Haddad, Mustansir M. Pratapgarhwala
المصدر: Solid-State Electronics. 50:181-190
مصطلحات موضوعية: Materials science, Proton, Analogue electronics, Electronic oscillator, business.industry, Heterojunction bipolar transistor, Transistor, Radiation, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, law.invention, law, Materials Chemistry, Electronic engineering, Optoelectronics, Irradiation, Electrical and Electronic Engineering, business, Common emitter
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7
المؤلفون: W.T. Lotshaw, Lloyd W. Massengill, Joseph S. Melinger, Reed K. Lawrence, Kevin M. Warren, Nadim F. Haddad, J. J. Pena, J.H. Bowman, J.D. Davis, Ronald D. Brown, Dale McMorrow, J. Vasquez, D. Carlton, S. P. Buchner
المصدر: IEEE Transactions on Nuclear Science. 52:2421-2425
مصطلحات موضوعية: Nuclear and High Energy Physics, Materials science, business.industry, Substrate (electronics), Two-photon absorption, Upset, Nuclear Energy and Engineering, Single event upset, Optoelectronics, Wafer, Static random-access memory, Electrical and Electronic Engineering, business, Absorption (electromagnetic radiation), Flip chip
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8
المؤلفون: Reed K. Lawrence
المصدر: 2012 IEEE Radiation Effects Data Workshop.
مصطلحات موضوعية: Post exposure, Materials science, CMOS, Absorbed dose, Electronic engineering, Conditioning, Memory array, Biomedical engineering
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0f971ce28e043cb373a5a8abcaa78e50
https://doi.org/10.1109/redw.2012.6353719 -
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المؤلفون: Daniel Pirkl, Ronald D. Brown, Andrew T. Kelly, Nadim F. Haddad, John C. Rodgers, Richard Ferguson, Reed K. Lawrence
المصدر: 2011 12th European Conference on Radiation and Its Effects on Components and Systems.
مصطلحات موضوعية: Engineering, Space technology, business.industry, Process (computing), Integrated circuit design, Radiation, RAD750, Power (physics), law.invention, Microprocessor, law, Electronic engineering, business, Radiation hardening
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ef43fc7456e4d2e04b27981c8e1a62f9
https://doi.org/10.1109/radecs.2011.6131320 -
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المؤلفون: Christopher L. Ocheltree, Reed K. Lawrence
المصدر: 2011 IEEE Radiation Effects Data Workshop.
مصطلحات موضوعية: Materials science, business.industry, X-ray, Space (mathematics), visual_art, Nondestructive testing, Absorbed dose, Electronic component, visual_art.visual_art_medium, Optoelectronics, Dosimetry, Electronics, Photonics, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1875f1824c0a0b1a985322347cfd3f1e
https://doi.org/10.1109/redw.2010.6062514