المؤلفون: Kosak, O., Reif, W.

المصدر: 2017 IEEE 2nd International Workshops on Foundations and Applications of Self* Systems (FAS*W) FAS-W Foundations and Applications of Self* Systems (FAS*W), 2017 IEEE 2nd International Workshops on. :371-374 Sep, 2017

Relation: 2017 IEEE 2nd International Workshops on Foundations and Applications of Self* Systems (FAS*W)

المؤلفون: Grandy, H., Stenzel, K., Reif, W.

المصدر: Third IEEE International Conference on Software Engineering and Formal Methods (SEFM'05) Software Engineering and Formal Methods Software Engineering and Formal Methods, 2005. SEFM 2005. Third IEEE International Conference on. :170-179 2005

Relation: Third IEEE International Conference on Software Engineering and Formal Methods

المؤلفون: Ortmeier, F., Reif, W.

المصدر: International Conference on Dependable Systems and Networks, 2004 Dependable systems and networks Dependable Systems and Networks, 2004 International Conference on. :651-658 2004

Relation: 2004 International Conference on Dependable Systems and Networks

المؤلفون: Reif, W., Schellhorn, G., Stenzel, K.

المصدر: COMPASS '95 Proceedings of the Tenth Annual Conference on Computer Assurance Systems Integrity, Software Safety and Process Security' Computer assurance Computer Assurance, 1995. COMPASS '95. Systems Integrity, Software Safety and Process Security. Proceedings of the Tenth Annual Conference on. :151-162 1995

Relation: COMPASS '95. Proceedings of the Tenth Annual Conference on Computer Assurance

المؤلفون: Reif, W.

المصدر: Proceedings Fourth International Conference on Software Engineering and Knowledge Engineering Software Engineering and Knowledge Engineering, 1992. Proceedings., Fourth International Conference on. :276-283 1992

Relation: Proceedings Fourth International Conference on Software Engineering and Knowledge Engineering

المؤلفون: Wolf, B., Chwala, C., Fersch, B., Garvelmann, J., Junkermann, W., Zeeman, M. J., Angerer, A., Adler, B., Beck, C., Brosy, C., Brugger, P., Emeis, S., Dannenmann, M., De Roo, F., Diaz-Pines, E., Haas, E., Hagen, M., Hajnsek, I., Jacobeit, J., Jagdhuber, T., Kalthoff, N., Kiese, R., Kunstmann, H., Kosak, O., Krieg, R., Malchow, C., Mauder, M., Merz, R., Notarnicola, C., Philipp, A., Reif, W., Reineke, S., Rödiger, T., Ruehr, N., Schäfer, K., Schrön, M., Senatore, A., Shupe, H., Völksch, I., Wanninger, C., Zacharias, S., Schmid, H. P.

المصدر: Bulletin of the American Meteorological Society, 2017 Jun 01. 98(6), 1217-1234.

URL الوصول: https://www.jstor.org/stable/26243753

المؤلفون: Fathimulla, A., Abrahams, J., Loughran, T., Hier, H., O'Connor, J., Mattingly, M., Aina, O., Hempfling, E., Reif, W.

المصدر: 1987 International Electron Devices Meeting IEDM Tech. Dig. Electron Devices Meeting, 1987 International. :607-610 1987

Relation: International Electron Devices Meeting 1987

المؤلفون: Berghammer, R., Lakhnech, Y., Reif, W.

المساهمون: Berghammer, Rudolf, editor^Aff1, Lakhnech, Yassine, editor^Aff1

المصدر: Tool Support for System Specification, Development and Verification. :1-17

المؤلفون: Sudeikat, J., Steghöfer, J.-P., Seebach, H., Reif, W., Renz, W., Preisler, T., Salchow, P.

المصدر: In Information and Software Technology June 2012 54(6):593-607

المؤلفون: Reif, W.^Aff2, Müller, K.^Aff2

المساهمون: Ciach, R., editor^Aff1

المصدر: Advanced Light Alloys and Composites. 59:263-275