المؤلفون: Rino Choi, Onishi, K., Chang Seok Kang, Gopalan, S., Renee Nieh, Kim, Y.H., Han, J.H., Krishnan, S., Hag-ju Cho, Shahriar, A., Lee, J.C.

المصدر: Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :613-616 2002

Relation: IEEE International Electron Devices Meeting

المؤلفون: Byoung Hun Lee, Laegu Kang, Wen-Jie Qi, Renee Nieh, Yongjoo Jeon, Katsunori Onishi, Lee, J.C.

المصدر: International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) Electron devices Electron Devices Meeting, 1999. IEDM '99. Technical Digest. International. :133-136 1999

Relation: International Electron Devices Meeting 1999. Technical Digest

المؤلفون: Wen-Jie Qi, Renee Nieh, Byoung Hun Lee, Laegu Kang, Yongjoo Jeon, Onishi, K., Ngai, T., Banerjee, S., Lee, J.C.

المصدر: International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) Electron devices Electron Devices Meeting, 1999. IEDM '99. Technical Digest. International. :145-148 1999

Relation: International Electron Devices Meeting 1999. Technical Digest

المؤلفون: Rino Choi, Onishi, K., Chang Scok Kang, Renee Nieh, Gopalan, S., Hag-Ju Cho, Krishnan, S., Lee, J.C.

المصدر: 60th DRC. Conference Digest Device Research Conference Device research Device Research Conference, 2002. 60th DRC. Conference Digest. :193-194 2002

Relation: Device Research Conference

المؤلفون: null Wen-Jie Qi, null Renee Nieh, null Byoung Hun Lee, null Laegu Kang, null Yongjoo Jeon, K. Onishi, T. Ngai, S. Banerjee, J.C. Lee

المصدر: International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318).

مصطلحات موضوعية: Materials science, business.industry, Annealing (metallurgy), Transistor, Gate dielectric, Equivalent oxide thickness, law.invention, Amorphous solid, law, Gate oxide, MOSFET, Electronic engineering, Optoelectronics, business, High-κ dielectric

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::bcebacd2c0dcb71d28e888bccb2e7ea1
https://doi.org/10.1109/iedm.1999.823866

المؤلفون: Rino Choi, Onishi, K., Chang Seok Kang, Gopalan, S., Renee Nieh, Kim, Y.H., Han, J.H., Krishnan, S., Hag-ju Cho, Shahriar, A., Lee, J.C.

المصدر: Digest. International Electron Devices Meeting; 2002, p613-616, 4p

المؤلفون: Rino Choi, Onishi, K., Chang Scok Kang, Renee Nieh, Gopalan, S., Hag-Ju Cho, Krishnan, S., Lee, J.C.

المصدر: 60th DRC. Conference Digest Device Research Conference; 2002, p193-194, 2p

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