المؤلفون: Roed, K., Eriksen, D.O., Ceccaroli, B., Martinella, C., Javanainen, A., Reshanov, S., Massetti, S.

المصدر: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 69(7):1675-1682 Jul, 2022

المؤلفون: Yuan, Zimo, Jacobs, Keijo, Bakowski, M., Ranstad, P., Schöner, A., Reshanov, S., Kaplan, W., Nee, Hans-Peter, 1963, Hallén, Anders

المصدر: Materials Science Forum. :442-446

مصطلحات موضوعية: Proton Implantation, Reverse Recovery, Shockley-Read-Hall (SRH) Lifetime, Switching Losses

وصف الملف: print

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-325703
https://doi.org/10.4028/p-5po40a

المؤلفون: Bartolf, H., Gysin, U., Rossmann, H. R., Bubendorf, A., Glatzel, T., Jung, T. A., Meyer, E., Zimmermann, M., Reshanov, S., Schoner, A.

المصدر: 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD) Power Semiconductor Devices & IC's (ISPSD), 2015 IEEE 27th International Symposium on. :281-284 May, 2015

Relation: 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD)

المؤلفون: Afanasev, A. V., Ilyin, V. A., Luchinin, V. V.^{Aff1, IDS1063782621130029_cor3}, Reshanov, S. A.

المصدر: Semiconductors. 55(13):1055-1062

المؤلفون: Ghandi, R., Buono, B., Domeij, M., Esteve, R., Schoner, A., Han, J., Dimitrijev, S., Reshanov, S. A., Zetterling, C.-M., Ostling, M.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 58(1):259-265 Jan, 2011

المؤلفون: Elahipanah, H., Thierry-Jebali, N., Reshanov, S. A., Kaplan, W., Zhang, A., Lim, J.-K., Bakowski, M., Ostling, M., Schoner, A.

المصدر: 2016 European Conference on Silicon Carbide & Related Materials (ECSCRM) Silicon Carbide & Related Materials (ECSCRM), European Conference on. :1-1 Sep, 2016

Relation: 2016 European Conference on Silicon Carbide & Related Materials (ECSCRM)

المؤلفون: Mikhaylov, A. I.^Aff1, Afanasyev, A. V., Ilyin, V. A., Luchinin, V. V., Reshanov, S. A., Schöner, A.

المصدر: Semiconductors. 54(1):122-126

المؤلفون: Gysin, U., Meyer, E., Glatzel, Th., Günzburger, G., Rossmann, H.R., Jung, T.A., Reshanov, S., Schöner, A., Bartolf, H.

المصدر: In Microelectronic Engineering 1 July 2016 160:18-21

المؤلفون: Mikhaylov, A. I., Afanasyev, A. V., Ilyin, V. A., Luchinin, V. V., Reshanov, S. A., Schöner, A.

المصدر: Semiconductors. June 2016 50(6):824-827

المؤلفون: Mikhaylov, A. I., Afanasiev, A. V., Ilyin, V. A., Luchinin, V. V., Reshanov, S. A., Krieger, M., Schöner, A., Sledziewski, T.

المصدر: Semiconductors. December 2014 48(12):1581-1585