المؤلفون: Fu, Hongying, Chen, Wanru, Jin, Shanyi, Wang, Zhong, Zhao, Wenhui, Jiang, Yumei

المصدر: 2023 International Conference on Computer Science and Automation Technology (CSAT) CSAT Computer Science and Automation Technology (CSAT), 2023 International Conference on. :328-334 Oct, 2023

Relation: 2023 International Conference on Computer Science and Automation Technology (CSAT)

المؤلفون: Liu, Yuanyuan, Sun, Xiangqian, Zhou, Yu

المصدر: 2023 International Conference on Microwave and Millimeter Wave Technology (ICMMT) Microwave and Millimeter Wave Technology (ICMMT), 2023 International Conference on. :1-3 May, 2023

Relation: 2023 International Conference on Microwave and Millimeter Wave Technology (ICMMT)

المؤلفون: Roy, Soham^{Aff1, IDs10836024061177_cor1}, Millican, Spencer K., Agrawal, Vishwani D.

المصدر: Journal of Electronic Testing: Theory and Applications. 40(2):139-158

المؤلفون: Roy, Soham, Millican, Spencer K., Agrawal, Vishwani D.

المصدر: 2021 IEEE 39th VLSI Test Symposium (VTS) Test Symposium (VTS), 2021 IEEE 39th VLSI. :1-14 Apr, 2021

Relation: 2021 IEEE 39th VLSI Test Symposium (VTS)

المؤلفون: Avci, Muslum Emir, Ozev, Sule

المصدر: 2020 IEEE International Test Conference (ITC) Test Conference (ITC), 2020 IEEE International. :1-10 Nov, 2020

Relation: 2020 IEEE International Test Conference (ITC)

المؤلفون: Azais, F., Bernard, S., Comte, M., Deveautour, B., Dupuis, S., Badawi, H. El, Flottes, M.-L., Girard, P., Kerzerho, V., Latorre, L., Lefevre, F., Rouzeyre, B., Valea, E., Vayssadel, T., Virazel, A.

المصدر: 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2020 IEEE 26th International Symposium on. :1-4 Jul, 2020

Relation: 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS)

المؤلفون: Bera, A., Singh, N.K., Kumar, N., Rathi, D., Satynaryana, K., Singh, U., Kulkarni, S.V., Mishra, A.K., Vishant, ., Khatun, H., Alaria, M.K., Varia, A., Parmar, K., Kadia, B., Srinivas, Y.S.S., Kevadia, M., Ranjan, O., Pareek, N., Babu, R., Das, S., Jain, P.K., Sinha, A.K., Kartikeyan, M.V., Joshi, S.

المصدر: IEEE Transactions on Plasma Science IEEE Trans. Plasma Sci. Plasma Science, IEEE Transactions on. 47(10):4658-4663 Oct, 2019

المؤلفون: Thomas, Tinson, Thomas, Anoop, Sreekumar, V M

المصدر: 2017 International Conference on Innovative Mechanisms for Industry Applications (ICIMIA) Innovative Mechanisms for Industry Applications (ICIMIA), 2017 International Conference on. :177-180 Feb, 2017

Relation: 2017 International Conference on Innovative Mechanisms for Industry Applications (ICIMIA)

المؤلفون: Choi, Yongsuk, Chang, Chun-hsiang, Jung, In-Seok, Onabajo, Marvin, Kim, Yong-Bin

المصدر: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2014 IEEE International Symposium on. :222-227 Oct, 2014

Relation: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

المؤلفون: Mittal, Rajesh, Kawoosa, Mudasir, Parekhji, Rubin A.

المصدر: 2014 International Test Conference Test Conference (ITC), 2014 IEEE International. :1-9 Oct, 2014

Relation: 2014 IEEE International Test Conference (ITC)