يعرض 1 - 10 نتائج من 31 نتيجة بحث عن '"Rhee, Hwasung"', وقت الاستعلام: 1.05s تنقيح النتائج
  1. 1
    مؤتمر
    Machine Learning Based V-ramp VBD Predictive Model Using OCD-measured Fab Parameters for Early Detection of MOL Reliability Risk

    المؤلفون: Rhee, Sungman, Kim, Hyunjin, Park, Sangku, Uemura, Taiki, Hwang, Yuchul, Choo, Seungjin, Kim, Jinju, Rhee, Hwasung, Chung, Shinyoung

    المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-4 Mar, 2023

    Relation: 2023 IEEE International Reliability Physics Symposium (IRPS)

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  2. 2
    مؤتمر
    Soft-Error Susceptibility in Flip-Flop in EUV 7 nm Bulk-FinFET Technology

    المؤلفون: Uemura, Taiki, Chung, Byungjin, Jo, Jeongmin, Kim, Mijoung, Lee, Dalhee, Kim, Gunrae, Lee, Seungbae, Song, Taesjoong, Rhee, Hwasung, Lee, Brandon, Choi, Jaehee

    المصدر: 2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-7 Mar, 2021

    Relation: 2021 IEEE International Reliability Physics Symposium (IRPS)

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  3. 3
    مؤتمر
    Time Dependent Variability in Advanced FinFET Technology for End-of-Lifetime Reliability Prediction

    المؤلفون: Jiang, Hai, Kim, Jinju, Choi, Kihyun, Shim, Hyewon, Sagong, Hyunchul, Park, Junekyun, Rhee, Hwasung, Lee, Euncheol

    المصدر: 2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-6 Mar, 2021

    Relation: 2021 IEEE International Reliability Physics Symposium (IRPS)

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  4. 4
    مؤتمر
    Systematic Study of Process Impact on FinFET Reliability

    المؤلفون: Ranjan, Rakesh, Lee, Ki-Don, Mahmud, Md Iqbal, Rahman, Mohammad Shahriar, Perepa, Pavitra Ramadevi, Larow, Charles Briscoe, Kwon, Caleb Dongkyun, Nguyen, Maihan, Kang, Minhyo, Jha, Ashish Kumar, Shariq, Ahmed, Ummer, Shamas Musthafa, Prater, Susannah Laure, Sagong, Hyunchul, Rhee, HwaSung

    المصدر: 2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-5 Mar, 2021

    Relation: 2021 IEEE International Reliability Physics Symposium (IRPS)

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  5. 5
    مؤتمر
    Chip to Package Interaction Risk Assessment of FCBGA Devices using FEA Simulation, Meta-Modeling and Multi-Objective Genetic Algorithm Optimization Technique

    المؤلفون: Lee, Moon Soo, Baick, Inhak, Kim, Min, Kwon, Seo Hyun, Yeo, Myeong Soo, Rhee, Hwasung, Lee, Euncheol

    المصدر: 2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-6 Mar, 2021

    Relation: 2021 IEEE International Reliability Physics Symposium (IRPS)

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  6. 6
    مؤتمر
    FEOL Self-heating and BEOL Joule-heating Effects of FinFET Technology and Its Implications for Reliability Prediction

    المؤلفون: Jiang, Hai, Jeong, Taeyoung, Sagong, Hyunchul, Choi, Kihyun, Jin, Minjung, Yeo, Myungsoo, Rhee, Hwasung, Lee, Euncheol

    المصدر: 2020 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2020 IEEE International. :1-5 Oct, 2020

    Relation: 2020 IEEE International Integrated Reliability Workshop (IIRW)

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  7. 7
    مؤتمر
    Reliability of Advanced FinFET Technology Nodes Beyond Planar: Invited

    المؤلفون: Sagong, Hyun Chul, Choi, Kihyun, Jiang, Hai, Park, Junekyun, Rhee, Hwasung, Pae, Sangwoo

    المصدر: 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2020 4th IEEE. :1-4 Apr, 2020

    Relation: 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

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  8. 8
    مؤتمر
    Advanced Self-heating Model and Methodology for Layout Proximity Effect in FinFET Technology

    المؤلفون: Jiang, Hai, Sagong, Hyunchul, Kim, Jinju, Shim, Hyewon, Kim, Yoohwan, Park, Junekyun, Uemura, Taiki, Ji, Yongsung, Jeong, Taeyoung, Kwon, Dongkyun, Rhee, Hwasung, Pae, Sangwoo, Lee, Brandon

    المصدر: 2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-5 Apr, 2020

    Relation: 2020 IEEE International Reliability Physics Symposium (IRPS)

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  9. 9
    مؤتمر
    Trap Density Modulation for IO FinFET NBTI Improvement

    المؤلفون: Ranjan, Rakesh, LaRow, Charles B., Lee, Ki-Don, Kang, Minhyo, Perepa, Pavitra R., Rahman, M. Shahriar, Lee, Bong Ki, Moreau, David, Cariss-Daniels, Carolyn, Basford, Timothy, Callahan, Colby, Nguyen, Maihan, Choi, Gil Heyun, Sagong, Hyunchul, Rhee, HwaSung

    المصدر: 2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-5 Apr, 2020

    Relation: 2020 IEEE International Reliability Physics Symposium (IRPS)

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  10. 10
    مؤتمر
    Reliability on EUV Interconnect Technology for 7nm and beyond

    المؤلفون: Jeong, Tae-Young, Lee, Miji, Jo, Yunkyung, Kim, Jinwoo, Kim, Min, Yeo, Myungsoo, Kim, Jinseok, Choi, Hyunjun, Kim, Joosung, Jo, Yoojin, Ji, Yongsung, Uemura, Taiki, Jiang, Hai, Kwon, Dongkyun, Rhee, HwaSung, Pae, Sangwoo, Lee, Brandon

    المصدر: 2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-4 Apr, 2020

    Relation: 2020 IEEE International Reliability Physics Symposium (IRPS)

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