المؤلفون: Lukaszek, W., Current, M.I., Daryanani, S., Larson, L., Rhoad, T., Shields, J., Vella, M., Wagner, D.

المصدر: 2003 8th International Symposium Plasma- and Process-Induced Damage. Plasma- and process-induced damage Plasma- and Process-Induced Damage, 2003 8th International Symposium. :182-185 2003

Relation: 2003 8th International Symposium on Plasma- and Process-Induced Damage

المؤلفون: Rhoad, T., Lovelace, B., Suzuki, H., Niikura, K., McLaughlin, T.

المصدر: Ion Implantation Technology. 2002. Proceedings of the 14th International Conference on Ion implantation technology proceedings Ion Implantation Technology. 2002. Proceedings of the 14th International Conference on. :491-494 2002

Relation: Proceedings of the 2002 14th International Conference on Ion Implantation Technology

المؤلفون: Suzuki, H., Niikura, K., McLaughlin, T., Rhoad, T.

المصدر: Ion Implantation Technology. 2002. Proceedings of the 14th International Conference on Ion implantation technology proceedings Ion Implantation Technology. 2002. Proceedings of the 14th International Conference on. :495-497 2002

Relation: Proceedings of the 2002 14th International Conference on Ion Implantation Technology

المؤلفون: Li, H.-J., Pompl, T., Young, C., Rhoad, T., Saulters, J., Peterson, J., Gardner, M., Brown, G.A., Bersuker, G., Zeitzoff, P.M., Price, J., Hung, P.Y., Diebold, A., Huff, H.R.

المصدر: Conference Digest [Includes 'Late News Papers' volume] Device Research Conference, 2004. 62nd DRC. Device research conference Device Research Conference, 2004. 62nd DRC. Conference Digest [Includes 'Late News Papers' volume]. :15-16 vol.1 2004

Relation: Device Research Conference

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تسجيل الدخول للوصول الكامل.

لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.

لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.

المؤلفون: Price, J., Hung, P. Y., Rhoad, T., Foran, B., Diebold, A. C.

المصدر: Applied Physics Letters; 9/6/2004, Vol. 85 Issue 10, p1701-1703, 3p, 1 Diagram, 1 Chart, 2 Graphs

مصطلحات موضوعية: ELLIPSOMETRY, THIN films, SURFACES (Technology), TRANSMISSION electron microscopy, SOLID state electronics, SOLIDS

لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.

المؤلفون: Li, H.-J., Pompl, T., Young, C., Rhoad, T., Saulters, J., Peterson, J., Gardner, M., Brown, G.A., Bersuker, G., Zeitzoff, P.M., Price, J., Hung, P.Y., Diebold, A., Huff, H.R.

المصدر: 62nd DRC Conference Digest Late News Papers Volume Included Device Research Conference, 2004; 2004, p15-15, 1p