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1دورية أكاديمية
المؤلفون: Wai Pou Chan, Rich Wu
المصدر: Urological Science, Vol 26, Iss 2, p S18 (2015)
مصطلحات موضوعية: Diseases of the genitourinary system. Urology, RC870-923
وصف الملف: electronic resource
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2
المؤلفون: Yuping Cui, Jing Xue, Jing Sha, Zheng Guo Chen, Larry Zhuang, Derren Dunn, Jeffrey Shearer, Li-Jin Chen, Rich Wu, Charlie King
المصدر: DTCO and Computational Patterning.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::18de424f96d187437b03a604b749b5b2
https://doi.org/10.1117/12.2614060 -
3
المؤلفون: Moongyu Jeong, Marco Guajardo, Tim Fuehner, Li-Jin Chen, Lena Zavyalova, Cheng-En (Rich) Wu, Song-haeng Lee, Hua Song, Kevin Lucas
المصدر: Design-Process-Technology Co-optimization XV.
مصطلحات موضوعية: business.industry, Computer science, SIGNAL (programming language), Stability (learning theory), Machine learning, computer.software_genre, Validation methods, Modelling methods, Convergence (routing), Hardware_INTEGRATEDCIRCUITS, Advanced manufacturing, Production (economics), Artificial intelligence, business, computer
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::001fdd9e63c1c804ed224086e20d9d3c
https://doi.org/10.1117/12.2584940 -
4
المؤلفون: Kevin Lucas, Cheng-En (Rich) Wu, Delian Yang, Folarin Latinwo, Peter Brooker, Hua Song, Yulu Chen
المصدر: Optical Microlithography XXXII.
مصطلحات موضوعية: Resist, Process (computing), Electronic engineering, Linearity, Wafer, Sensitivity (control systems), Lithography, Critical dimension, Metrology
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7ac89863110e16a9bfdb9910d13add5d
https://doi.org/10.1117/12.2516344 -
5
المؤلفون: Cheng-En (Rich) Wu, Kevin Lucas, Peter Brooker, Kevin Hooker, Yulu Chen, Marco Guajardo, Folarin Latinwo
المصدر: Design-Process-Technology Co-optimization for Manufacturability XIII.
مصطلحات موضوعية: Artificial neural network, Computer science, business.industry, Deep learning, Extreme ultraviolet lithography, Process (computing), Hardware_PERFORMANCEANDRELIABILITY, Machine learning, computer.software_genre, Resist, Feature (computer vision), Hardware_INTEGRATEDCIRCUITS, Wafer, Artificial intelligence, business, Lithography, computer
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ed64714b6d55349d00e44766214ed545
https://doi.org/10.1117/12.2516134 -
6
المؤلفون: Folarin Latinwo, Kevin Lucas, Hua Song, Delian Yang, Rich Wu
المصدر: Photomask Technology 2018.
مصطلحات موضوعية: Resist, Optical proximity correction, Atomic force microscopy, Computer science, Extreme ultraviolet lithography, Electronic engineering, Inverse, Photoresist, Lithography, Shrinkage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d73962765eaf5ec9e442dc1ebd170626
https://doi.org/10.1117/12.2501992 -
7
المؤلفون: Anna Johnson, Karla Witzke, Rich Wu, Colton Walker, Ji Qi, Susan Linsell, Ryan J. Nelson, Adam Cole, David Miller, Arvin K. George, Sabry Mansour
المصدر: The Journal of Urology. 203:e878
مصطلحات موضوعية: medicine.medical_specialty, Prostate biopsy, medicine.diagnostic_test, business.industry, Urology, 030232 urology & nephrology, 3. Good health, 03 medical and health sciences, 0302 clinical medicine, Antibiotic resistance, medicine, Radiology, business, Fusion Biopsy
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8مؤتمر
المؤلفون: Latinwo, Folarin, Yang, Delian, Cheng-En (Rich) Wu, Brooker, Peter, Yulu Chen, Hua Song, Lucas, Kevin
المصدر: Proceedings of SPIE; 1/24/2019, Vol. 10961, p109610G-1-109610G-10, 10p
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9مؤتمر
المؤلفون: Rich Wu, Delian Yang, Latinwo, Folarin, Lucas, Kevin, Hua Song
المصدر: Proceedings of SPIE; 8/26/2018, Vol. 10810, p108101A-1-108101A-10, 10p
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10
المؤلفون: Thomas Schmoeller, Hua Song, Cheng-En Rich Wu, Yongfa Fan, Qian Ren
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Resist, Computer science, Etching, Interface (computing), Calibration, Process (computing), Node (circuits), Wafer, Lithography process, Lithography, Simulation, Image (mathematics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9b747fe4eb9e1d3e3dd817a91d4a7be3
https://doi.org/10.1117/12.2048999