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1
المؤلفون: Norman C. Bartelt, G. L. Kellogg, Richard A. Plass
المصدر: Journal of Physics: Condensed Matter. 14:4227-4240
مصطلحات موضوعية: Surface (mathematics), Nanostructure, Morphology (linguistics), chemistry.chemical_element, Condensed Matter Physics, Copper, Crystallography, Transition metal, chemistry, Chemical physics, Monolayer, General Materials Science, Self-assembly, Nanoscopic scale
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2
المؤلفون: Gary Lee Kellogg, Richard A. Plass
المصدر: Surface Science. 470:106-120
مصطلحات موضوعية: Materials science, chemistry.chemical_element, Surfaces and Interfaces, Substrate (electronics), Condensed Matter Physics, Copper, Surfaces, Coatings and Films, Overlayer, Crystallography, Low-energy electron microscopy, chemistry, Transition metal, Materials Chemistry, Dislocation, Deposition (law), Surface reconstruction
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3
المؤلفون: Richard A. Plass, Gary Lee Kellogg
المصدر: Surface Science. 465:L777-L782
مصطلحات موضوعية: Chemistry, Surfaces and Interfaces, Condensed Matter Physics, Epitaxy, Surfaces, Coatings and Films, Overlayer, law.invention, Orientation (vector space), Grain growth, Crystallography, Low-energy electron microscopy, law, Monolayer, Materials Chemistry, Electron microscope, Deposition (law)
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4
المؤلفون: Richard A. Plass, Gary Lee Kellogg
المصدر: Surface Review and Letters. :649-655
مصطلحات موضوعية: Phase transition, Mesoscopic physics, Materials science, Condensed matter physics, Alloy, Surfaces and Interfaces, engineering.material, Island growth, Condensed Matter Physics, Surfaces, Coatings and Films, Overlayer, Low-energy electron microscopy, Chemical physics, Phase (matter), Materials Chemistry, engineering, Deposition (law)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::56698d4e2bb54e0737251f01aad42e78
https://doi.org/10.1142/s0218625x00000610 -
5
مصطلحات موضوعية: Microelectromechanical systems, Engineering, Electrostatic discharge, Mathematical model, business.industry, Design tool, Mechanical engineering, Computer Science::Other, Computer Science::Robotics, Reliability (semiconductor), Operating temperature, Computer Science::Systems and Control, Actuator, business, Voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ea8888454037719aaff1d090bc66bfe4
https://doi.org/10.2172/920746 -
6
المؤلفون: Jeremy A. Walraven, Richard A. Plass, Michael S. Baker, Michael Shaw
المصدر: International Symposium for Testing and Failure Analysis.
مصطلحات موضوعية: Electrostatic discharge, Materials science, Mechanical engineering, Actuator, Failure modes of electronics
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2a0602c262d68e7a4cf2b36ecce05451
https://doi.org/10.31399/asm.cp.istfa2004p0225 -
7
المؤلفون: Michael S. Baker, Richard A. Plass, Jeremy A. Walraven
المصدر: SPIE Proceedings.
مصطلحات موضوعية: chemistry.chemical_compound, Materials science, Optics, Silicon nitride, chemistry, business.industry, Electrothermal actuator, Sem analysis, Square wave, Composite material, business, Actuator, High stress
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::734f2cb8f411e47eff85257c887903c3
https://doi.org/10.1117/12.530936 -
8
المؤلفون: James Anthony Ohlhausen, Kevin R. Zavadil, Ion Cristian Abraham, Gerald Albert Knorovsky, Danny O'Neill MacCallum, Diane Peebles, Brooke Michelle Nowak-Neely, Richard A. Plass, Steven M. Thornberg, Michael R. Keenan
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Microelectromechanical systems, Reliability (semiconductor), Materials science, Electrical resistance and conductance, Surface metrology, Microsystem, Stiction, Nanotechnology, Fatigue limit, Characterization (materials science)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::59a7bab374a1eec6e5206c7ea3fbda72
https://doi.org/10.1117/12.524777 -
9
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Surface conductivity, chemistry.chemical_compound, Materials science, Silicon, chemistry, Silicon nitride, Electrode, Delamination, chemistry.chemical_element, LOCOS, Nitride, Composite material, Silicon oxide
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::27c3aa1ab3f915e9cf6e3d3e49e872da
https://doi.org/10.1117/12.476366 -
10
المؤلفون: Richard A. Plass, Thomas M. Mayer, Matthew G. Hankins, Paul J. Resnick, Peggy J. Clews, Danelle M. Tanner, David R. Wheeler
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Silanes, Materials science, Nanotechnology, Chemical vapor deposition, engineering.material, Atomic layer deposition, Surface coating, chemistry.chemical_compound, chemistry, Coating, Stiction, engineering, Deposition (phase transition), Wafer
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::da6df29f214f5f1e964bcc035b4358c0
https://doi.org/10.1117/12.478206