المؤلفون: Eckhardt, A., Schneider, B., Blecher, F., Sterzel, J., Seibel, K., Bohm, M., Benthien, S., Keller, H., Lule, T., Rieve, P., Sommer, M.

المصدر: 28th European Solid-State Device Research Conference Solid-State Device Research Conference, 1998. Proceeding of the 28th European. :208-211 1998

Relation: 28th European Solid-State Device Research Conference

المؤلفون: Schneider, B., Fischer, H., Benthien, S., Keller, H., Lule, T., Rieve, P., Sommer, M., Schulte, J., Bohm, M.

المصدر: International Electron Devices Meeting. IEDM Technical Digest Electron Devices Electron Devices Meeting, 1997. IEDM '97. Technical Digest., International. :209-212 1997

Relation: International Electron Devices Meeting. IEDM Technical Digest

المؤلفون: Lule, T., Benthien, S., Keller, H., Mutze, F., Rieve, P., Seibel, K., Sommer, M., Bohm, M.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 47(11):2110-2122 Nov, 2000

المؤلفون: Zhu, Q., Coors, S., Schneider, B., Rieve, P., Bohm, M.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 45(7):1393-1398 Jul, 1998

المؤلفون: Bohm, M., Lule, T., Fischer, H., Schulte, J., Schneider, B., Benthien, S., Blecher, F., Coors, S., Eckhardt, A., Keller, H., Rieve, P., Seibel, K., Sommer, M., Sterzel, J.

المصدر: 1998 Symposium on VLSI Circuits. Digest of Technical Papers (Cat. No.98CH36215) VLSI circuits VLSI Circuits, 1998. Digest of Technical Papers. 1998 Symposium on. :202-203 1998

Relation: 1998 Symposium on VLSI Circuits Digest of Technical Papers

المؤلفون: Rieve, Maike.

المساهمون: Universität zu Köln.

مصطلحات موضوعية: Property insurance -- Law and legislation -- Germany., Business insurance -- Law and legislation -- Germany., Riots -- Germany.

Degree: Thesis (doctoral)--Universität Köln.

المؤلفون: Böhm, M.^Aff2, Blecher, F.^Aff2, Eckhardt, A.^Aff2, Schneider, B.^Aff2, Benthien, S.^Aff3, Keller, H.^Aff3, Lulé, T.^Aff3, Rieve, P.^Aff3, Sommer, M.^Aff3, Lind, R. C.^Aff4, Humm, L.^Aff4, Daniels, M.^Aff4, Wu, N.^Aff4, Yen, H.^Aff4, Efron, U.^Aff5

المساهمون: Ricken, Detlef Egbert, editor^Aff1, Gessner, Wolfgang, editor^Aff1

المصدر: Advanced Microsystems for Automotive Applications 98. :157-172

المؤلفون: Thompson, Thomas S., Dimock, Rick, Bradbury, Robert W., Rieve, Richard, Fehr, Mark

المصدر: Bulletin of Environmental Contamination and Toxicology. November 2011 87(5):580-585

المؤلفون: Motze, F.^Aff1125, Seibel, K., Schneider, B., Hillebrand, M., Blecher, F., Lulé, T., Keller, H., Rieve, P., Wagner, M., Böhm, M.^{Aff1125, Aff2125}

المصدر: MRS Online Proceedings Library. 557(1):815-820

المؤلفون: Böhm, M.^{Aff150, Aff250}, Blecher, F., Eckhardt, A., Seibel, K., Schneider, B., Sterzel, J., Benthien, S., Keller, H., Lulè, T., Rieve, P., Sommer, M., Van Uffel, B., Librecht, F., Lind, R. C., Humm, L., Efron, U., Roth, E.

المصدر: MRS Online Proceedings Library. 507(1):327-338