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1
المؤلفون: Paul van der Heide, Brian P. Geiser, Wilfried Vandervorst, Jeroen E. Scheerder, Claudia Fleischmann, JH Bunton, Robert M. Ulfig, David Larson, Jonathan Op de Beeck
المصدر: Microscopy and Microanalysis. 28:1141-1149
مصطلحات موضوعية: Optics, Materials science, law, business.industry, Atom probe, business, Instrumentation, Common emitter, law.invention
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2
المؤلفون: David A Reinhard, Katherine P Rice, Robert M Ulfig, Isabelle Martin, Brian P Geiser, David J Larson
المصدر: Microscopy and Microanalysis. 28:706-708
مصطلحات موضوعية: Instrumentation
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3
المؤلفون: David J Larson, Ty J Prosa, David Reinhard, Robert M Ulfig, Michael Holman, Dan Lenz
المصدر: Microscopy and Microanalysis. 28:718-720
مصطلحات موضوعية: Instrumentation
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4
المصدر: Microscopy and Microanalysis. 27:2032-2034
مصطلحات موضوعية: Materials science, Milli, Nanotechnology, Instrumentation, Quantitative analysis (chemistry), Nanoscopic scale
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5
المؤلفون: Joe Bunton, Brian P. Geiser, D Lenz, Peter H. Clifton, Ty J. Prosa, David A. Reinhard, David J. Larson, I. Martin, Robert M. Ulfig
المصدر: Microscopy and Microanalysis. 27:2464-2466
مصطلحات موضوعية: Materials science, Nuclear magnetic resonance, law, Atom probe, Instrumentation, law.invention
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6
المؤلفون: I. Martin, D Lenz, Robert M. Ulfig, Brian P. Geiser, David A. Reinhard, Joe Bunton, David J. Larson, Ty J. Prosa, Peter H. Clifton
المصدر: Microscopy and Microanalysis. 27:2038-2040
مصطلحات موضوعية: Materials science, Optics, business.industry, law, Instrumentation (computer programming), Atom probe, business, Instrumentation, law.invention
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7
المؤلفون: David A Reinhard, Daniel Lenz, Isabelle Martin, Ty J Prosa, Robert M Ulfig, Peter H Clifton, Brian P Geiser, Joseph H Bunton, David J Larson
المصدر: Microscopy and Microanalysis. 28:3188-3189
مصطلحات موضوعية: Instrumentation
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8
المؤلفون: Yimeng Chen, Katherine P Rice, Robert M Ulfig
المصدر: Microscopy and Microanalysis. 28:72-73
مصطلحات موضوعية: Instrumentation
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9
المؤلفون: S. Suresh Babu, Niyanth Sridharan, Peeyush Nandwana, Robert M. Ulfig, David J. Larson, Yimeng Chen
المصدر: Journal of Materials Science. 55:1715-1726
مصطلحات موضوعية: Diffraction, Materials science, Mechanical Engineering, Titanium alloy, Vanadium, chemistry.chemical_element, Atom probe, Microstructure, law.invention, chemistry, Mechanics of Materials, law, Martensite, Phase (matter), Physical chemistry, General Materials Science, Chemical decomposition
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10
المؤلفون: David A. Reinhard, David J. Larson, Ty J. Prosa, D Lenz, Robert M. Ulfig, I. Martin, Brian P. Geiser
المصدر: Microscopy and Microanalysis. 27:2482-2483
مصطلحات موضوعية: Materials science, law, Atom probe, Atomic physics, Instrumentation, law.invention