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1دورية أكاديمية
المؤلفون: David L. Miller, Mark W. Keller, Justin M. Shaw, Katherine P. Rice, Robert R. Keller, Kyle M. Diederichsen
المصدر: AIP Advances, Vol 3, Iss 8, Pp 082105-082105 (2013)
وصف الملف: electronic resource
Relation: https://doaj.org/toc/2158-3226
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2
المؤلفون: Benjamin W. Caplins, Jason D. Holm, Robert R. Keller
المصدر: Carbon. 149:400-406
مصطلحات موضوعية: Materials science, business.industry, Graphene, Scanning electron microscope, Field of view, 02 engineering and technology, General Chemistry, Orientation (graph theory), 010402 general chemistry, 021001 nanoscience & nanotechnology, 01 natural sciences, Monolayer graphene, 0104 chemical sciences, law.invention, Characterization (materials science), Electron diffraction, law, Optoelectronics, General Materials Science, 0210 nano-technology, business
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3
المؤلفون: Robert R. Keller, Yimeng Chen, Katherine P. Rice, Mark P. Stoykovich
المصدر: Micron. 95:42-50
مصطلحات موضوعية: 010302 applied physics, Beam diameter, Reflection high-energy electron diffraction, Materials science, business.industry, Resolution (electron density), General Physics and Astronomy, 02 engineering and technology, Cell Biology, 021001 nanoscience & nanotechnology, 01 natural sciences, Optics, Electron tomography, Structural Biology, 0103 physical sciences, Scanning transmission electron microscopy, Energy filtered transmission electron microscopy, General Materials Science, 0210 nano-technology, business, Image resolution, Electron backscatter diffraction
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4
المؤلفون: Robert R. Keller, Jason D. Holm
المصدر: Microscopy Today. 25:12-19
مصطلحات موضوعية: 010302 applied physics, General Computer Science, Aperture, Computer science, business.industry, Detector, ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION, Ranging, 02 engineering and technology, Modular design, 021001 nanoscience & nanotechnology, 01 natural sciences, Article, Optics, Transmission (telecommunications), 0103 physical sciences, Acceptance angle, 0210 nano-technology, business
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5
المؤلفون: Taylor J. Woehl, Robert R. Keller
المصدر: Ultramicroscopy. 171:166-176
مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, Scanning electron microscope, Aperture, Monte Carlo method, Detector, 02 engineering and technology, Substrate (electronics), Electron, 021001 nanoscience & nanotechnology, 01 natural sciences, Dark field microscopy, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Optics, 0103 physical sciences, Scanning transmission electron microscopy, 0210 nano-technology, business, Instrumentation
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6
المؤلفون: Benjamin W. Caplins, Jason D. Holm, Robert R. Keller
المصدر: Emerging Digital Micromirror Device Based Systems and Applications XI.
مصطلحات موضوعية: Diffraction, Materials science, Physics::Instrumentation and Detectors, business.industry, Scanning electron microscope, Orientation (computer vision), Detector, Electron, Dark field microscopy, Optics, Electron diffraction, Transmission (telecommunications), High Energy Physics::Experiment, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4580f9e6ef4af84e56d10816e3a1d261
https://doi.org/10.1117/12.2508694 -
7
المؤلفون: Jason D. Holm, Robert R. Keller
المصدر: Ultramicroscopy. 167:43-56
مصطلحات موضوعية: 010302 applied physics, Conventional transmission electron microscope, Materials science, business.industry, Phase-contrast imaging, Scanning confocal electron microscopy, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Optics, Annular dark-field imaging, Electron tomography, 0103 physical sciences, Scanning transmission electron microscopy, Energy filtered transmission electron microscopy, 0210 nano-technology, High-resolution transmission electron microscopy, business, Instrumentation
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8
المؤلفون: Robert Cook, Robert R. Keller, Lisa A. Keller, Kimberly F. Colvin
المصدر: Applied Measurement in Education. 29:65-82
مصطلحات موضوعية: Multiple forms, 05 social sciences, Risk-based testing, 050401 social sciences methods, 050301 education, Education, Test (assessment), 0504 sociology, Scale (social sciences), Statistics, Item response theory, Equating, Developmental and Educational Psychology, Econometrics, Operational acceptance testing, Psychology, 0503 education, Research evidence
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9
المؤلفون: Jason D. Holm, Benjamin W. Caplins, Robert R. Keller
المصدر: Ultramicroscopy. 196
مصطلحات موضوعية: Diffraction, Materials science, Microscope, Physics::Instrumentation and Detectors, Scanning electron microscope, Aperture, Physics::Optics, 02 engineering and technology, 01 natural sciences, Digital micromirror device, law.invention, Optics, law, 0103 physical sciences, Scanning transmission electron microscopy, Instrumentation, 010302 applied physics, business.industry, Detector, 021001 nanoscience & nanotechnology, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Transmission electron microscopy, High Energy Physics::Experiment, 0210 nano-technology, business
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10
المؤلفون: Benjamin W. Caplins, Ryan M. White, Robert R. Keller, Jason D. Holm
المصدر: Microscopy and Microanalysis. 25:218-219
مصطلحات موضوعية: Materials science, Workflow, business.industry, Software engineering, business, Instrumentation