المؤلفون: Robertazzi, R., Frank, D., Tien, K., Timmerwilke, J., Song, Peilin, Friedman, Daniel

المصدر: 2024 IEEE 42nd VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2024 IEEE 42nd. :1-7 Apr, 2024

Relation: 2024 IEEE 42nd VLSI Test Symposium (VTS)

المؤلفون: Chakraborty, S., Frank, D.J., Tien, K., Rosno, P., Yeck, M., Glick, J.A., Robertazzi, R., Richetta, R., Bulzacchelli, J.F., Underwood, D., Ramirez, D., Yilma, D., Davies, A., Joshi, R.V., Chambers, S.D., Lekuch, S., Inoue, K., Wisnieff, D., Baks, C.W., Bethune, D.S., Timmerwilke, J., Fox, T., Song, P., Johnson, B.R., Gaucher, B.P., Friedman, D.J.

المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 57(11):3258-3273 Nov, 2022

المؤلفون: Scheuermann, M., Tian, S., Robertazzi, R., Wordeman, M., Bergeron, C., Jacobson, H., Restle, P., Silberman, J., Tyberg, C.

المصدر: 2016 IEEE International 3D Systems Integration Conference (3DIC) 3D Systems Integration Conference (3DIC), 2016 IEEE International. :1-4 Nov, 2016

Relation: 2016 IEEE International 3D Systems Integration Conference (3DIC)

المؤلفون: Hu, G., Nowak, J. J., Gottwald, M. G., Brown, S. L., Doris, B., D'Emic, C. P., Hashemi, P., Houssameddine, D., He, Q., Kim, D., Kim, J., Kothandaraman, C., Lauer, G., Lee, H K, Marchack, N., Reuter, M., Robertazzi, R. P., Sun, J. Z., Suwannasiri, T., Trouilloud, P. L., Woo, S., Worledge, D. C.

المصدر: 2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :2.6.1-2.6.4 Dec, 2019

Relation: 2019 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Fluhr, E. J., Baumgartner, S., Boerstler, D., Bulzacchelli, J. F., Diemoz, T., Dreps, D., English, G., Friedrich, J., Gattiker, A., Gloekler, T., Gonzalez, C., Hibbeler, J. D., Jenkins, K. A., Kim, Y., Muench, P., Nett, R., Paredes, J., Pille, J., Plass, D., Restle, P., Robertazzi, R., Shan, D., Siljenberg, D., Sperling, M., Stawiasz, K., Still, G., Toprak-Deniz, Z., Warnock, J., Wiedemeier, G., Zyuban, V.

المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 50(1):10-23 Jan, 2015

المؤلفون: Hu, G., Nowak, J. J., Lauer, G., Lee, J. H., Sun, J. Z., Harms, J., Annunziata, A., Brown, S., Chen, W., Kim, Y. H., Marchack, N., Murthy, S., Kothandaraman, C., O'Sullivan, E. J., Park, J. H., Reuter, M., Robertazzi, R. P., Trouilloud, P. L., Zhu, Y., Worledge, D. C.

المصدر: 2017 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) VLSI Design, Automation and Test (VLSI-DAT), 2017 International Symposium on. :1-2 Apr, 2017

Relation: 2017 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)

المؤلفون: Sun, J. Z., Robertazzi, R. P., Nowak, J. J., Trouilloud, P. L., Hu, G., Gaidis, M. C., Brown, S. L., Abraham, D. W., O'Sullivan, E. J., Gallagher, W. J., Worledge, D. C., Kent, A. D.

المصدر: 69th Device Research Conference Device Research Conference (DRC), 2011 69th Annual. :171-174 Jun, 2011

Relation: 2011 69th Annual Device Research Conference (DRC)

المؤلفون: Hu, G., Gottwald, M. G., He, Q., Park, J. H., Lauer, G., Nowak, J. J., Brown, S. L., Doris, B., Edelstein, D., Evarts, E. R., Hashemi, P., Khan, B., Kim, Y. H., Kothandaraman, C., Marchack, N., O'Sullivan, E. J., Reuter, M., Robertazzi, R. P., Sun, J. Z., Suwannasiri, T., Trouilloud, P. L., Zhu, Y., Worledge, D. C.

المصدر: 2017 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2017 IEEE International. :38.3.1-38.3.4 Dec, 2017

Relation: 2017 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Bette, A., DeBrosse, J., Gogl, D., Hoenigschmid, H., Robertazzi, R., Arndt, C., Braun, D., Casarotto, D., Havreluk, R., Lammers, S., Obermaier, W., Reohr, W., Viehmann, H., Gallagher, W.J., Muller, G.

المصدر: 2003 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.03CH37408) VLSI circuits VLSI Circuits, 2003. Digest of Technical Papers. 2003 Symposium on. :217-220 2003

Relation: 2003 Symposium on VLSI Circuits. Digest of Technical Papers

المؤلفون: Worledge, D. C., Gajek, M., Abraham, D. W., Brown, S., Gaidis, M. C., Hu, G., Nowak, J., O'Sullivan, E. J., Robertazzi, R. P., Sun, J. Z., Trouilloud, P. L., Gallagher, W. J.

المصدر: 2012 4th IEEE International Memory Workshop Memory Workshop (IMW), 2012 4th IEEE International. :1-3 May, 2012

Relation: 2012 4th IEEE International Memory Workshop (IMW)