المؤلفون: Hu, G., Nowak, J. J., Gottwald, M. G., Brown, S. L., Doris, B., D'Emic, C. P., Hashemi, P., Houssameddine, D., He, Q., Kim, D., Kim, J., Kothandaraman, C., Lauer, G., Lee, H K, Marchack, N., Reuter, M., Robertazzi, R. P., Sun, J. Z., Suwannasiri, T., Trouilloud, P. L., Woo, S., Worledge, D. C.

المصدر: 2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :2.6.1-2.6.4 Dec, 2019

Relation: 2019 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Hu, G., Nowak, J. J., Lauer, G., Lee, J. H., Sun, J. Z., Harms, J., Annunziata, A., Brown, S., Chen, W., Kim, Y. H., Marchack, N., Murthy, S., Kothandaraman, C., O'Sullivan, E. J., Park, J. H., Reuter, M., Robertazzi, R. P., Trouilloud, P. L., Zhu, Y., Worledge, D. C.

المصدر: 2017 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) VLSI Design, Automation and Test (VLSI-DAT), 2017 International Symposium on. :1-2 Apr, 2017

Relation: 2017 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)

المؤلفون: Sun, J. Z., Robertazzi, R. P., Nowak, J. J., Trouilloud, P. L., Hu, G., Gaidis, M. C., Brown, S. L., Abraham, D. W., O'Sullivan, E. J., Gallagher, W. J., Worledge, D. C., Kent, A. D.

المصدر: 69th Device Research Conference Device Research Conference (DRC), 2011 69th Annual. :171-174 Jun, 2011

Relation: 2011 69th Annual Device Research Conference (DRC)

المؤلفون: Hu, G., Gottwald, M. G., He, Q., Park, J. H., Lauer, G., Nowak, J. J., Brown, S. L., Doris, B., Edelstein, D., Evarts, E. R., Hashemi, P., Khan, B., Kim, Y. H., Kothandaraman, C., Marchack, N., O'Sullivan, E. J., Reuter, M., Robertazzi, R. P., Sun, J. Z., Suwannasiri, T., Trouilloud, P. L., Zhu, Y., Worledge, D. C.

المصدر: 2017 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2017 IEEE International. :38.3.1-38.3.4 Dec, 2017

Relation: 2017 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Worledge, D. C., Gajek, M., Abraham, D. W., Brown, S., Gaidis, M. C., Hu, G., Nowak, J., O'Sullivan, E. J., Robertazzi, R. P., Sun, J. Z., Trouilloud, P. L., Gallagher, W. J.

المصدر: 2012 4th IEEE International Memory Workshop Memory Workshop (IMW), 2012 4th IEEE International. :1-3 May, 2012

Relation: 2012 4th IEEE International Memory Workshop (IMW)

المؤلفون: Hu, G., Lee, J. H., Nowak, J. J., Sun, J. Z., Harms, J., Annunziata, A., Brown, S., Chen, W., Kim, Y. H., Lauer, G., Liu, L., Marchack, N., Murthy, S., O'Sullivan, E. J., Park, J. H., Reuter, M., Robertazzi, R. P., Trouilloud, P. L., Zhu, Y., Worledge, D. C.

المصدر: 2015 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2015 IEEE International. :26.3.1-26.3.4 Dec, 2015

Relation: 2015 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Worledge, D. C., Hu, G., Trouilloud, P. L., Abraham, D. W., Brown, S., Gaidis, M. C., Nowak, J., O'Sullivan, E. J., Robertazzi, R. P., Sun, J. Z., Gallagher, W. J.

المصدر: 2010 International Electron Devices Meeting Electron Devices Meeting (IEDM), 2010 IEEE International. :12.5.1-12.5.4 Dec, 2010

Relation: 2010 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Eidelloth, W.^Aff2, Oh, B.^Aff2, Koch, R. K.^Aff2, Gallagher, W. J.^Aff2, Robertazzi, R. P.^Aff2

المساهمون: Lotsch, H. K. V., editor, Koch, Hans, editor^Aff1, Lübbig, Heinz, editor^Aff1

المصدر: Superconducting Devices and Their Applications : Proceedings of the 4th International Conference SQUID ’91 (Sessions on Superconducting Devices), Berlin, Fed. Rep. of Germany, June 18–21, 1991. 64:168-171

المؤلفون: Pesenson, L, Robertazzi, R. P, Buhrman, R. A, Cypher, S. R, Hunt, B. D

المصدر: Physical Review Letters. 67

مصطلحات موضوعية: Electronics And Electrical Engineering

URL الوصول: https://ntrs.nasa.gov/citations/19920031061

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